Patent classifications
H01J49/0468
MULTIPLE FLOW PATH GAS INLET WITH INTEGRATED HEATING AND TEMPERATURE CONTROL
A gas inlet includes a gas inlet chassis, an inlet sealingly disposed on an end of a process conduit and an outlet sealingly disposed on an exterior surface of a gas analyzer together with a plurality of gas paths connecting the inlet and the outlet with one or a plurality of heating elements rigidly thermally connected to the gas inlet chassis located such that the thermal distribution across the gas inlet chassis heats the gas flow through one or more gas paths. A method for providing heated gas to a mass spectrometer includes providing a gas inlet chassis that has a heating element and a plurality of gas paths disposed between an inlet and an outlet, directing an electrical current through a conduit into at least one heating element, and directing process gas through the outlet into a mass spectrometer.
HALOGEN ELEMENT DETERMINATION METHOD AND HALOGEN ELEMENT DETERMINATION DEVICE
A halogen element determination method and a halogen element determination device are provided, belonging to the technical field of geological sample detection. The method includes the following steps: converting halogens in a sample into noble gases by irradiation; heating the sample using a laser device to extract target gases; adsorbing active gases in the target gases to purify the target gases; enriching and separating purified noble gases according to different condensation temperatures, and enabling the noble gases after enrichment and separation to enter a noble gas mass spectrometer in turn for testing; and calculating a yield of converting halogens into the noble gases after irradiation through a standard sample, and inferring the content of halogen elements through the volume of noble gases in an unknown sample by calculating the volume of noble gases produced by a standard sample with known content of halogen elements.
Ionizer and mass spectrometer
An ionizer including: an ionization chamber 2; a sample nozzle 60 configured to cause a liquid sample to flow out into the ionization chamber 2; an assist gas passage 61 configured to supply, to the ionization chamber 2, an assist gas that promotes desolvation of the liquid sample; a heater 62 disposed inside the assist gas passage 61; and a heat transfer member 64 disposed in the assist gas passage 61 in contact with the heater 62. The heat transfer member 64 can be disposed, for example, inside the heater 62 including a spirally wound heater wire and between the heater 62 and an inner wall surface of the assist gas passage 61.
Ion analyzer
A mass spectrometer (ion analyzer) includes: an ionization chamber; a sample probe fixed to a wall of the ionization chamber and configured to nebulize a liquid sample into the ionization chamber; a gas heater including a tubular member having both end walls and a peripheral wall, a heater configured to heat the inside of the tubular member, a gas flow inlet and a gas flow outlet provided in the peripheral wall or the end wall of the tubular member, and a gas flow outlet pipe having one end connected to the gas flow outlet and the other end inserted into the ionization chamber; a fixture configured to fix the gas heater to the wall of the ionization chamber; and a cooling unit configured to cool the fixture.
Mass spectrometry device, and mass spectrometry method
Provided is a technique to carry out mass spectrometry of a wide variety of subject compounds to be analyzed, each of which is extracted in a supercritical fluid. A mass spectrometer (1) includes: a supercritical fluid introduction section (3) for introducing and releasing, to vacuum, a supercritical fluid in which a subject compound for mass spectrometry is contained (extracted); an ionization section (4) that ionizes the subject compound which is extracted in the supercritical fluid, the ionization being carried out in the vacuum by a molecular reaction involving proton transfer; and a mass measurement section (5) that measures a mass of the subject compound which has been ionized.
METHOD OF CONTROLLING TEMPERATURE IN AN ENCLOSURE, AND AIR CONDITIONING SYSTEM FOR AN ENCLOSURE
A method of controlling temperature in an enclosure is provided. The method
comprises: passing a refrigerant through a circuit of an air conditioning system, the circuit comprising in order: a condenser; a capillary; an evaporator; and a compressor. The air conditioning system further comprises: an evaporator airflow generator for blowing air over the evaporator; and an enclosure heater for heating the air to be blown over the evaporator by the evaporator airflow generator. The method further comprises: switching on the enclosure heater when ambient temperature outside of the enclosure falls below a threshold temperature.