H01J49/0495

Methods and systems for increasing sensitivity of direct sampling interfaces for mass spectrometric analysis

Methods and systems for delivering a liquid sample to an ion source for the generation of ions and subsequent analysis by mass spectrometry are provided herein. In accordance with various aspects of the present teachings, MS-based systems and methods are provided in which the flow of desorption solvent within a sampling probe fluidly coupled to an ion source can be selectively controlled such that one or more analyte species can be desorbed from a sample substrate inserted within the sampling probe within a decreased volume of desorption solvent for subsequently delivery to the ion source. In various aspects, sensitivity can be increased due to higher desorption efficiency (e.g., due to increased desorption time) and/or decreased dilution of the desorbed analytes. The methods and systems described herein can additionally or alternatively provide for the selective control of the flow rate of the desorption solvent within the sampling interface so as to enable additional processing steps to occur within the sampling probe (e.g., multiple samplings, reactions).

Rapid online analyzer for 14C-AMS

A rapid online analyzer for a .sup.14C-AMS, comprising: a solid sample processing module, an atmospheric sample collection and processing module, a microflow control module, an AMS module and an automatic control module. Sample preparation and AMS measurement are combined, a solid sample is directly converted into CO.sub.2 gas by an element analyzer and then enters an AMS for measurement, and an atmospheric sample is collected in real time for analysis by the AMS, such that quick and efficient analysis of the solid sample and the atmospheric sample is realized.

Element analysis device and element analysis method

An objective of this invention is to conduct an accurate quantitative analysis on the Ar element contained in a sample gas by an element analysis device comprising a heating furnace and a mass spectrometer for conducting a quantitative analysis on an element in a vacuum atmosphere. The element analysis device comprises: a heating furnace that heats a graphite crucible containing a sample while introducing a carrier gas into the heating furnace, thereby vaporizing the sample to generate a sample gas; a quadrupole mass spectrometer that conducts the quantitative analysis on the Ar element contained in the sample gas in a mixed gas comprising the carrier gas and the sample gas discharged from the heating furnace, a first pressure regulator that controls the pressure of the carrier gas to be introduced into the heating furnace, and a second pressure regulator that controls the pressure of the mixed gas discharged from the heating furnace.

Ion analyzer

An ion analyzer that generates product ions from precursor ions derived from a sample component and analyzes the product ions includes a reaction chamber (2) into which the precursor ion is introduced, a radical generation chamber (51), a material gas supply source (52) configured to introduce material gas into the radical generation chamber (51), a vacuum evacuator (57) configured to evacuate the radical generation chamber (51), a vacuum discharge unit (53) configured to generate a vacuum discharge in the radical generation chamber (51), a radical irradiation unit (54) configured to irradiate an inside of the reaction chamber (2) with radicals generated from the material gas in the radical generation chamber (51), and a separation and detection (3) configured to separate and detect product ions generated from the precursor ion by reaction with the radicals according to at least one of a mass-to-charge ratio and ion mobility.

Apparatus for delivering reagent ions to a mass spectrometer
10971348 · 2021-04-06 · ·

Disclosed herein is an apparatus for supplying reagent ions, for example ETD or PTR reagent ions, to a mass spectrometer. The apparatus includes a reagent material reservoir, coupled to a carrier gas supply, which delivers an entrained reagent vapor flow to an inlet of a mixing junction through a first flow restrictor. A control gas flow of carrier gas is delivered to another inlet of the mixing junction via a variable pressure regulator and a second flow restrictor. The outlet of the mixing junction is coupled via a third flow restrictor and a reagent transfer junction to an inlet of an ionizer, such as a glow-discharge ionizer. By dynamic adjustment of the output pressure of the variable pressure regulator, the flow rate of reagent vapor may be controlled over a broad range, even for reagent materials of relatively high volatility.

ATMOSPHERIC PRESSURE ION SOURCE INTERFACE

An interface for receiving ions in a carrier gas from an atmospheric pressure ion source at a spectrometer that is configured to analyse the received ions at a lower pressure includes an interface vacuum chamber having a downstream aperture; a support assembly defining an axial bore arranged to allow a removable capillary tube to extend therethrough; ions being received from the atmospheric pressure ion source through the capillary tube and directed towards the downstream aperture; and a jet disruptor, positioned downstream from the axial bore and configured to disrupt gas flow between the axial bore and the downstream aperture only when the capillary tube is not fully inserted through the axial bore.

Mass spectrometer
10985004 · 2021-04-20 · ·

A mass spectrometer (10) includes a housing (19) that houses a plurality of devices including a mass analyzer (110) including an ionization unit, a mass separation unit, and an ion detection unit, a first heat generation device (11), and a second heat generation device (12) which has an allowable maximum temperature lower than that of the first heat generation device (11) or an allowable temperature variation amount smaller than that of the first heat generation device (11), an intake port (14) of the housing (19) which is provided at a position closer to the second heat generation device (12) with respect to the first heat generation device (11), and an exhaust fan (15) of the housing (19) which is provided at a position farther from the second heat generation device (12) with respect to the first heat generation device (11).

Sample handling systems, mass spectrometers and related methods

Slide analysis a gripper with three sensors for controlling a slide grip sequence and at least one rotatable carousel with a slide receiving channel. The systems also include a robot with a robot arm that holds a slide gripper residing inside the housing in communication with the rotatable carousel. The systems also include a load lock chamber and a door sealably coupled to the second end portion and an acquisition vacuum chamber with an X-Y stage and a slide holder with a vacuum seal.

REAL-TIME CALIBRATION DEVICE, REAL-TIME CALIBRATION METHOD AND DETECTION APPARATUS

Embodiments of the present disclosure provide a real-time calibration device, a real-time calibration method and a detection apparatus. The real-time calibration device is in fluid communication with a sample injection pipeline of the apparatus to be calibrated. The real-time calibration device is configured to release a trace amount of calibration agent molecules during a sample injection of the apparatus to be calibrated, so that the trace amount of calibration agent molecules and a sample entering the apparatus to be calibrated are mixed and together enter the apparatus to be calibrated, and information of the sample and the calibration agent is detected by the apparatus to be calibrated, thereby performing a calibration.

MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
20210050198 · 2021-02-18 · ·

A mass spectrometer 1, which is for generating a product ion from a precursor ion derived from a sample component having a hydrocarbon chain to analyze a mass, includes a reaction chamber 2 into which the precursor ion is introduced, radical generating units 51, 52, and 53 that generate a radical having an oxidizing ability or/and a radical other than a hydrogen radical having a reducing ability, a radical irradiation unit 54 that irradiates the inside of the reaction chamber 2 with the generated radical, a separation detection unit 3 that separates and detects the product ion generated from the precursor ion by a reaction with the radical according to a mass-to-charge ratio, and a structure estimation unit 14 that estimates the structure of the sample component based on the mass-to-charge ratio of the detected product ions and the information on the structure or the structure candidate.