H01L31/062

Multispectral imaging device and manufacturing method thereof
10249662 · 2019-04-02 ·

The present disclosure provides a multispectral imaging device, comprising the following layers and components arranged in sequence following a direction of incident light: a color filter layer, comprising a plurality of color filters transparent for specific wavebands; a first transparent electrode layer continuously formed in imaging area; a first conversion layer continuously formed in imaging area to convert visible light to electric signals; a first flat topography comprising plurality of pixel electrodes and with surface roughness less than 5 nm; a second conversion layer to convert NIR light to electric signals; and circuit components to process the electric signals. Benefit from the first continuous conversion layer formed on the flat topography, high light utilization, low spectral cross-talk, low dark current are achieved in the multispectral imaging device.

Solid state image pickup element and method of manufacturing solid state image pickup element
10229945 · 2019-03-12 · ·

Provided is a solid state image pickup element including a MOS type transistor which amplifies a signal which is based on electric charges generated in a photoelectric conversion unit of a pixel. A channel region of the transistor is divided into a source-side region and a drain-side region. When a conductivity type of the transistor is defined as a first conductivity type and a conductivity type which is opposite to the first conductivity type is defined as a second conductivity type, a concentration of a first conductivity type impurity in the source-side region is higher than a concentration of the first conductivity type impurity in the drain-side region or a concentration of a second conductivity type impurity in the drain-side region is higher than a concentration of the second conductivity type impurity in the source-side region.

Switching device, and resistive random access memory including the same as a selection device
10217797 · 2019-02-26 · ·

A switching device includes a first electrode, a switching layer having a non-memory characteristic, and a second electrode that are disposed over a substrate. The switching layer includes an oxide of a first atom or a nitride of the first atom, and a second atom is doped in the oxide or the nitride. The second atom forms a trap site trapping a conductive carrier in the switching layer when a voltage having an absolute value that is smaller than an absolute value of a predetermined threshold voltage is applied between the first and the second electrodes. The second atom forms a moving path through which the conductive carrier moves between the first electrode and the second electrode when a voltage having an absolute value that is greater than an absolute value of a predetermined threshold voltage is applied between the first and the second electrodes.

Field-effect photovoltaic elements

Photovoltaic devices such as solar cells having one or more field-effect hole or electron inversion/accumulation layers as contact regions are configured such that the electric field required for charge inversion and/or accumulation is provided by the output voltage of the photovoltaic device or that of an integrated solar cell unit. In some embodiments, a power source may be connected between a gate electrode and a contact region on the opposite side of photovoltaic device. In other embodiments, the photovoltaic device or integrated unit is self-powering.

Field-effect photovoltaic elements

Photovoltaic devices such as solar cells having one or more field-effect hole or electron inversion/accumulation layers as contact regions are configured such that the electric field required for charge inversion and/or accumulation is provided by the output voltage of the photovoltaic device or that of an integrated solar cell unit. In some embodiments, a power source may be connected between a gate electrode and a contact region on the opposite side of photovoltaic device. In other embodiments, the photovoltaic device or integrated unit is self-powering.

Laterally diffused metal-oxide semiconductor field-effect transistor

A laterally diffused metal-oxide semiconductor field-effect transistor, comprising a substrate, a first conductivity type well region, a second conductivity type well region, a drain electrode in the first conductivity type well region, a source electrode and a body region in the second conductivity type well region, and a gate electrode arranged across surfaces of the first conductivity type well region and the second conductivity type well region, and also comprising a floating layer ring arranged on the top of the first conductivity type well region and located between the gate electrode and the drain electrode and a plurality of groove polysilicon electrodes running through the floating layer ring and stretching into the first conductivity type well region.

Solid-state imaging device, camera module and electronic apparatus

A solid-state imaging device includes a plurality of photoelectric conversion units, a floating diffusion unit that is shared by the plurality of photoelectric conversion units and converts electric charge generated in each of the plurality of photoelectric conversion units into a voltage signal, a plurality of transfer units that are respectively provided in the plurality of photoelectric conversion units and transfer the electric charge generated in the plurality of photoelectric conversion units to the floating diffusion unit, a first transistor group that is electrically connected to the floating diffusion unit and includes a gate and source/drain which are arranged with a first layout configuration, and a second transistor group that is electrically connected to the floating diffusion unit, includes a gate and source/drain arranged with a second layout configuration symmetrical to the first layout configuration, and is provided in a separate area from the first transistor group.

Semiconductor device and method for fabricating the same
10186597 · 2019-01-22 · ·

A method for fabricating a semiconductor device includes: forming a semiconductor structure including a pattern; forming an epitaxial layer having a first dopant concentration in the pattern; forming in-situ an interface layer having a second dopant concentration higher than the first dopant concentration, over the epitaxial layer; forming a metal silicide layer over the interface layer; and forming a metal plug over the metal silicide layer.

Systems, methods, and devices having stretchable integrated circuitry for sensing and delivering therapy

System, devices and methods are presented that integrate stretchable or flexible circuitry, including arrays of active devices for enhanced sensing, diagnostic, and therapeutic capabilities. The invention enables conformal sensing contact with tissues of interest, such as the inner wall of a lumen, a the brain, or the surface of the heart. Such direct, conformal contact increases accuracy of measurement and delivery of therapy. Further, the invention enables the incorporation of both sensing and therapeutic devices on the same substrate allowing for faster treatment of diseased tissue and fewer devices to perform the same procedure.

Device and forming method thereof
10170376 · 2019-01-01 · ·

A device includes a first vertical nanowire, a second vertical nanowire and a gate. The first vertical nanowire is disposed on a substrate, wherein the first vertical nanowire includes a silicon germanium channel part. The second vertical nanowire is disposed on the substrate beside the first vertical nanowire, wherein the second vertical nanowire includes a silicon channel part. The gate encircles the silicon germanium channel part and the silicon channel part. The present invention provides a method of forming said device including the following steps. A substrate is provided. A silicon vertical nanowire is formed on the substrate. A germanium containing layer is formed on sidewalls of the silicon vertical nanowire. Germanium atoms of the germanium containing layer are driven into the silicon vertical nanowire, thereby forming a silicon germanium channel part of the silicon vertical nanowire. A gate encircling the silicon germanium channel part is formed.