Implementations of chip packaging structures, semiconductor structures and fabricating methods thereof are disclosed. A chip packaging structure comprises a substrate comprising: a signal transmitting wiring structure embedded in the substrate, and a thermal transmitting wiring structure embedded in the substrate. The chip packaging structure further comprises a first chip on the substrate and electrically connected with the signal transmitting wiring structure. The chip packaging structure further comprises at least one thermal conductive structure on the substrate, in thermal contact with the thermal transmitting wiring structure, and laterally surrounding the first chip.

A method includes depositing a first metal layer on a package component, wherein the package component comprises a first device die, forming a dielectric layer on the package component, and plating a metal thermal interface material on the first metal layer. The dielectric layer includes portions on opposing sides of the metal thermal interface material. A heat sink is bonded on the metal thermal interface material. The heat sink includes a second metal layer physically joined to the metal thermal interface material.

A package structure includes a circuit substrate, a package unit, a thermal interface material and a cover. The package unit is disposed on and electrically connected with the circuit substrate. The package unit includes a first surface facing the circuit substrate and a second surface opposite to the first surface. A underfill is disposed between the package unit and the circuit substrate, surrounding the package unit and partially covering sidewalls of the package unit. The cover is disposed over the package unit and over the circuit substrate. An adhesive is disposed on the circuit substrate and between the cover and the circuit substrate. The thermal interface material includes a metal-type thermal interface material and is disposed between the cover and the package unit. The thermal interface material physically contacts the second surface and the sidewalls of the package unit and physically contacts the underfill.

In one example, an electronic device includes a substrate including a substrate inner side, a substrate outer side opposite to the substrate inner side, substrate lateral sides connecting the substrate inner side to the substrate outer side, a dielectric structure, a conductive structure, and a substrate internal stiffener at the substrate inner side. An electronic component is coupled to the conductive structure and includes a lower side proximate to the substrate inner side, an upper side opposite to the lower side, and a lateral side connecting the lower side to the upper side. An underfill is between the lower side of the electronic component and the substrate inner side and covering the substrate internal stiffener. An encapsulant covers a portion of the substrate inner side, a portion of the underfill; and a portion of the first electronic component. Other examples and related methods are also disclosed herein.

A semiconductor device includes a wiring substrate and a semiconductor element. The wiring substrate includes an insulating layer and a wiring layer. The semiconductor element includes a first electrode and is fixed to the wiring substrate with the first electrode facing the wiring substrate. The wiring layer includes a first wiring pattern on a surface of the insulating layer on the opposite side from the semiconductor element. The wiring layer further includes a first via interconnect. The first via interconnect is formed of a sintering material of metal and fills in a first through hole piercing through the first wiring pattern and the insulating layer to expose the first electrode. The first via interconnect electrically connects the first wiring pattern and the first electrode.

Packaged electronic device, having a C-shaped leadframe including a base section and a pair of transverse sections extending transversely to the base section. A first die and a second die have a first contact region at a first main surface and a second contact region at the second main surface; the first main surfaces of the first and the second dice are attached to a first face of the base section of the leadframe. A first lead is coupled to the second contact region of the first die and has a first external contact portion. A second lead is coupled to the second contact region of the second die and has a second external contact portion. A packaging mass surrounds the leadframe, the first lead and the second lead, embeds the first and the second dice and extends level with the base section and with the transverse sections of the leadframe as well as with the external contact portions of the leads.

A display device includes a bank including an opening defining pixels, light emitting elements disposed in the pixels, a color conversion layer disposed on the light emitting elements in the opening, a capping layer overlapping the color conversion layer, and a color filter layer disposed on the capping layer. The color filter layer includes a low refractive material.

There may be provided a stiffener assembly for a semiconductor package. The stiffener assembly may include a corner member and a frame member. A primary mating element of the corner member and a secondary mating element of the frame member may be configured to interlock with each other to form a connection joint that permits movement of the secondary mating element relative to the primary mating element.

A package comprising a first substrate; an integrated device coupled to the first substrate through at least a first plurality of solder interconnects; an inter substrate interconnect structure coupled to the first substrate through at least a second plurality of solder interconnects. The inter substrate interconnect structure comprises an inner interconnect; a dielectric layer coupled to the inner interconnect; and an interconnect coupled to the dielectric layer, wherein the interconnect surrounds the dielectric layer and the inner interconnect; a second substrate coupled to the inter substrate interconnect structure through at least a third plurality of solder interconnects; and an encapsulation layer coupled to the first substrate and the second substrate.

A semiconductor device according to the present embodiment includes a first insulating substrate having a first surface and a second surface opposite the first surface. First and second electrically conductive layers are provided on a side of the first surface. A plurality of semiconductor chips each have a third surface facing the first surface, a fourth surface opposite the third surface, a first electrode provided on the third surface, and a second electrode provided on the fourth surface. The first electrode is electrically connected to the first electrically conductive layer. A common electrode plate has a fifth surface facing the fourth surface, is electrically connected to the second electrodes of the semiconductor chips in common, and is electrically connected to the second electrically conductive layer. A second insulating substrate is provided on a side of the second surface of the first insulating substrate.