A semiconductor device configured to perform an A/D conversion of a wide range of signals is provided. A semiconductor device includes: an input voltage detection unit configured to detect an analog input voltage; a reference voltage setting unit configured to set a reference voltage based on the detected input voltage; an amplifier configured to amplify a difference between the input voltage and the reference voltage; an ADC configured to perform an A/D conversion of an amplified signal; and an arithmetic processing unit configured to calculate a digital voltage corresponding to the input voltage based on a result of the A/D conversion and the reference voltage.

A semiconductor device configured to perform an A/D conversion of a wide range of signals is provided. A semiconductor device includes: an input voltage detection unit configured to detect an analog input voltage; a reference voltage setting unit configured to set a reference voltage based on the detected input voltage; an amplifier configured to amplify a difference between the input voltage and the reference voltage; an ADC configured to perform an A/D conversion of an amplified signal; and an arithmetic processing unit configured to calculate a digital voltage corresponding to the input voltage based on a result of the A/D conversion and the reference voltage.

A semiconductor device configured to perform an A/D conversion of a wide range of signals is provided. A semiconductor device includes: an input voltage detection unit configured to detect an analog input voltage; a reference voltage setting unit configured to set a reference voltage based on the detected input voltage; an amplifier configured to amplify a difference between the input voltage and the reference voltage; an ADC configured to perform an A/D conversion of an amplified signal; and an arithmetic processing unit configured to calculate a digital voltage corresponding to the input voltage based on a result of the A/D conversion and the reference voltage.

A semiconductor device configured to perform an A/D conversion of a wide range of signals is provided. A semiconductor device includes: an input voltage detection unit configured to detect an analog input voltage; a reference voltage setting unit configured to set a reference voltage based on the detected input voltage; an amplifier configured to amplify a difference between the input voltage and the reference voltage; an ADC configured to perform an A/D conversion of an amplified signal; and an arithmetic processing unit configured to calculate a digital voltage corresponding to the input voltage based on a result of the A/D conversion and the reference voltage.

Disclosed herein are a power supply apparatus, and an electric apparatus and a vacuum cleaner having the power supply apparatus. According to an aspect of the present disclosure, the power supply apparatus includes: a first power converter configured to convert a first Alternating Current (AC) voltage into a Direct Current (DC) voltage; a second power converter configured to drop the DC voltage output from the first power converter and transfer the dropped DC voltage to a power storage unit, and to boost a DC voltage of the power storage unit and output the boosted DC voltage; and a third power converter configured to convert a DC voltage among the DC voltage output from the first power converter and the boosted DC voltage output from the second power converter, into a second AC voltage, and to transfer the second AC voltage to a load.

Disclosed herein are a power supply apparatus, and an electric apparatus and a vacuum cleaner having the power supply apparatus. According to an aspect of the present disclosure, the power supply apparatus includes: a first power converter configured to convert a first Alternating Current (AC) voltage into a Direct Current (DC) voltage; a second power converter configured to drop the DC voltage output from the first power converter and transfer the dropped DC voltage to a power storage unit, and to boost a DC voltage of the power storage unit and output the boosted DC voltage; and a third power converter configured to convert a DC voltage among the DC voltage output from the first power converter and the boosted DC voltage output from the second power converter, into a second AC voltage, and to transfer the second AC voltage to a load.

An electronic device includes a transistor having a body and a body biasing circuit. The body biasing circuit includes a threshold estimator circuit to estimate a threshold voltage of the transistor and a comparison circuit to compare the threshold voltage of the transistor to a reference threshold voltage and to generate a comparison signal based thereupon. A bias adjust circuit generates a body biasing voltage that biases the body of the transistor as a function of the comparison signal, the body biasing voltage being a voltage that, when applied to the body of the transistor, adjusts the threshold voltage thereof to be equal to the reference threshold voltage.

An electronic device includes a transistor having a body and a body biasing circuit. The body biasing circuit includes a threshold estimator circuit to estimate a threshold voltage of the transistor and a comparison circuit to compare the threshold voltage of the transistor to a reference threshold voltage and to generate a comparison signal based thereupon. A bias adjust circuit generates a body biasing voltage that biases the body of the transistor as a function of the comparison signal, the body biasing voltage being a voltage that, when applied to the body of the transistor, adjusts the threshold voltage thereof to be equal to the reference threshold voltage.

A switch power converter and method of testing and adjusting is provided. A switch power unit comprises at least a power switch for transform of the power. A controller is configured to generate a control signal for the power switch. A detector is configured to detect an output voltage signal and/or an output current signal of the switch power unit and output a sampling signal. A testing and adjusting unit is configured to receive the sampling signal and output a testing signal to the controller. The testing and adjusting unit comprises a compensator. The compensator attends the testing and adjusting of the switch power converter. An AC disturbing signal various in frequency causes the difference in the sampling signal and the testing signal so as to test open-loop transfer function of the switch power converter, the compensator compensates frequency response characteristic of the switch power converter, when the frequency response characteristic of the switch power converter doesn't match a target frequency response characteristic.

A switch power converter and method of testing and adjusting is provided. A switch power unit comprises at least a power switch for transform of the power. A controller is configured to generate a control signal for the power switch. A detector is configured to detect an output voltage signal and/or an output current signal of the switch power unit and output a sampling signal. A testing and adjusting unit is configured to receive the sampling signal and output a testing signal to the controller. The testing and adjusting unit comprises a compensator. The compensator attends the testing and adjusting of the switch power converter. An AC disturbing signal various in frequency causes the difference in the sampling signal and the testing signal so as to test open-loop transfer function of the switch power converter, the compensator compensates frequency response characteristic of the switch power converter, when the frequency response characteristic of the switch power converter doesn't match a target frequency response characteristic.