In certain aspects, an apparatus includes a gating circuit having an enable input, a signal input, and an output, wherein the enable input is configured to receive an enable signal. The apparatus also includes a toggle circuit having an output, wherein the toggle circuit is configured to toggle a logic state at the output of the toggle circuit based on the enable signal. The apparatus further includes a multiplexer having a first input, a second input, and an output, wherein the first input of the multiplexer is coupled to the output of the gating circuit, the second input of the multiplexer is coupled to the output of the toggle circuit. The multiplexer is configured to select one of the first input and the second input based on the enable signal, and couple the selected one of the first input and the second input to the output of the multiplexer.

In certain aspects, an apparatus includes a gating circuit having an enable input, a signal input, and an output, wherein the enable input is configured to receive an enable signal. The apparatus also includes a toggle circuit having an output, wherein the toggle circuit is configured to toggle a logic state at the output of the toggle circuit based on the enable signal. The apparatus further includes a multiplexer having a first input, a second input, and an output, wherein the first input of the multiplexer is coupled to the output of the gating circuit, the second input of the multiplexer is coupled to the output of the toggle circuit. The multiplexer is configured to select one of the first input and the second input based on the enable signal, and couple the selected one of the first input and the second input to the output of the multiplexer.

A scan chain architecture with lowered power consumption comprises a multiplexer selecting between a functional input and a test input. The output of the multiplexer is coupled to a low threshold voltage latch and, in test mode, to a standard threshold voltage latch. The low threshold voltage latch and standard threshold voltage latch are configured to store data when a clock input falls, using a master latch functional clock M_F_CLK, master latch test clock M_T_CLK, slave latch functional clock S_F_CLK, and slave latch test clock S_T_CLK. The slave latch has lower power consumption than the master latch.

Methods, apparatus, systems, and articles of manufacture are disclosed to buffer an input voltage. An example apparatus includes first inverter circuitry to invert the input voltage and produce a first inverted voltage; second inverter circuitry coupled to the first inverter circuitry, the second inverter circuitry to invert the first inverted voltage and produce a second inverted voltage at a rate based on a first current controlled transistor; third inverter circuitry coupled to the second inverter circuitry, the third inverter circuitry to invert the second inverted voltage and produce a third inverted voltage at a rate based on a second current controlled transistor; and fourth inverter circuitry coupled to the third inverter circuitry, the fourth inverter circuitry to invert the third inverted voltage and produce an output voltage, wherein the output voltage matches the input voltage.

Various methods and devices that involve pulsed signals are disclosed. An example minimum pulse-width (MPW) circuit comprises a first and second logic circuit. A first input of the first logic circuit is connected to an input of the MPW circuit. A first input of the second logic circuit is communicatively coupled to an output of the first logic circuit. The MPW circuit also comprises a MPW filter circuit communicatively coupled to an output of the second logic circuit, a one-shot circuit communicatively coupled to an output of the minimum pulse-width filter circuit and located on a first feedback path, and another one-shot circuit communicatively coupled to the output of the minimum pulse-width filter circuit and located on a second feedback path. A second input of the first logic circuit is on the first feedback path. A second input of the second logic circuit is on the second feedback path.

A fully integrated GaN driver comprising a digital logic signal inverter, a level shifter circuit, a UVLO circuit, an output buffer stage, and (optionally) a FET to be driven, all integrated in a single package. The level shifter circuit converts a ground reference 0-5 V digital signal at the input to a 0-10 V digital signal at the output. The output drive circuitry includes a high side GaN FET that is inverted compared to the low side GaN FET. The inverted high side GaN FET allows switch operation, rather than a source follower topology, thus providing a digital voltage to control the main FET being driven by the circuit.

Disclosed is a high voltage power system with enable control, comprising a high voltage start-up circuit, a PWM control module, and a driving module; the high voltage start-up circuit comprises a first transistor, a third transistor, a fourth transistor, a resistor, a diode, a VDD detection unit and an I/O interface unit; the high voltage start-up circuit is controlled by an input of a pin EN; when the pin EN is set, the high voltage start-up circuit stops working; the power system is shut off and doesn't restart, and enters a zero standby state; when the pin EN is reset, the high voltage start-up circuit restores to work, and the power system restarts and enters a normal working state. The power system having the high voltage start-up circuit with enable control has characteristics that the standby input power consumption and standby input current are both close to zero.

Circuits and methods control output voltage overshoot and undershoot of an SMPC in response to a load current transient. The SMPC control stage has at least one load variation detector that compares a feedback signal with at least one transient threshold level to determine that occurrence of the load current transient. When the load current transient has occurred, the at least one load variation detector causes a switch stage to be turned on to source or sink current to or from the load circuit to compensate the load current transient. A slope detector determines a change in polarity of the slope of the load current transient. When the slope changes polarity, the slope detector sends a signal for preventing an overshoot or an undershoot of the output voltage of the SMPC once the load current transient has been compensated.

A spike suppression circuit includes a wide bandgap transistor, a first transistor, a clamping circuit, and a capacitor. The wide bandgap transistor is depletion-type. The first transistor is coupled in series with the wide bandgap transistor. The clamping circuit provides a voltage difference, and is coupled to a common node between the wide bandgap transistor and the first transistor. The capacitor provides a supply voltage for the clamping circuit. When the first transistor is turned off, the capacitor can recycle spike energy at the common node.

Various implementations described herein are related to a device having header circuitry with first transistors that are configured to receive a supply voltage and provide a dynamically biased voltage. The device may include reference generation circuitry having multiple amplifiers that are configured to receive the supply voltage and provide reference voltages based on the supply voltage. The device may include bias generation circuitry having second transistors configured to track changes in the dynamically biased voltage and adjust the dynamically biased voltage by generating bias voltages based on the reference voltages and by applying the bias voltages to the header circuitry so as to adjust the dynamically biased voltage.