A level shift transistor of a first conductivity type configured to level shift a signal from a primary side circuit to a secondary side circuit between the primary side circuit having a primary side reference potential as reference and the secondary side circuit having a secondary side reference potential independent from the primary side reference potential as reference, a diode connected in a forward direction between a first main electrode of the level shift transistor and the secondary side circuit, a capacitor connected in parallel to the diode, and an inverter configured to invert the signal are provided. A control electrode of the level shift transistor is connected to a primary side power supply of the primary side circuit, and a second main electrode thereof is connected to an output of the inverter. The inverter operates between the primary side reference potential and the primary side power supply.

An apparatus is disclosed for operating a charge pump in a high-efficiency low-ripple burst mode. In an example aspect, the apparatus includes a charge pump with a flying capacitor, a switching circuit, and a burst-mode controller. The switching circuit is coupled to the flying capacitor and configured to selectively: be in a burst configuration to charge and discharge the flying capacitor based on a clock signal; or be in a pulse-skipping configuration. The burst-mode controller is coupled to the switching circuit and configured to trigger the switching circuit to transition from the pulse-skipping configuration to the burst configuration at a time that occurs between rising edges of the clock signal. The burst-mode controller is also configured to cause charging of the flying capacitor to occur for approximately half a period of the clock signal responsive to triggering the switching circuit to transition from the pulse-skipping configuration to the burst configuration.

An apparatus is disclosed for operating a charge pump in a high-efficiency low-ripple burst mode. In an example aspect, the apparatus includes a charge pump with a flying capacitor, a switching circuit, and a burst-mode controller. The switching circuit is coupled to the flying capacitor and configured to selectively: be in a burst configuration to charge and discharge the flying capacitor based on a clock signal; or be in a pulse-skipping configuration. The burst-mode controller is coupled to the switching circuit and configured to trigger the switching circuit to transition from the pulse-skipping configuration to the burst configuration at a time that occurs between rising edges of the clock signal. The burst-mode controller is also configured to cause charging of the flying capacitor to occur for approximately half a period of the clock signal responsive to triggering the switching circuit to transition from the pulse-skipping configuration to the burst configuration.

A clocked storage element comprises a first latch having an input data node, a clock input node and a first latch output data node, and a second latch having an input connected to the first latch output data node, a clock input node and a second latch output data node. The first and second latches can have a clocked pull-up current path consisting of two p-channel transistors between their respective output data nodes and the VDD supply line, and a clocked pull-down current path consisting of two n-channel transistors between their respective output data nodes and the VSS supply line.

A clock selector circuit receives a first input clock signal (CLK1) having a first frequency, and a second input clock signal (CLK2) having a second frequency. A phase difference detector is configured to detect when a phase difference occurs, over time, between the first input clock signal (CLK1) and the second input clock signal (CLK2), determined using when a clock edge crosses zero, and to signal this zero crossing to switching circuitry. The switching circuitry is configured, in response to receiving a zero-crossing signal from the phase difference detector, to detect an edge of opposite type to the predetermined type in the first input clock signal (CLK1) or in the second input clock signal (CLK2), and, in response to detecting said edge of opposite type, to switch an output clock signal (CLK_OUT) between the first input clock signal (CLK1) and the second input clock signal (CLK2).

A clock selector circuit receives a first input clock signal (CLK1) having a first frequency, and a second input clock signal (CLK2) having a second frequency. A phase difference detector is configured to detect when a phase difference occurs, over time, between the first input clock signal (CLK1) and the second input clock signal (CLK2), determined using when a clock edge crosses zero, and to signal this zero crossing to switching circuitry. The switching circuitry is configured, in response to receiving a zero-crossing signal from the phase difference detector, to detect an edge of opposite type to the predetermined type in the first input clock signal (CLK1) or in the second input clock signal (CLK2), and, in response to detecting said edge of opposite type, to switch an output clock signal (CLK_OUT) between the first input clock signal (CLK1) and the second input clock signal (CLK2).

A test method for a delay circuit and a test circuitry are provided. The test circuitry incudes the delay circuit that essentially includes multiple serially connected logic gates, a clock pulse generator at an input end of the delay circuit for generating one or more cycles of clock signals, and a counter at an output end of the delay circuit for counting the clock signals passing through the delay circuit. The test circuitry implements a test mode by switching lines to the clock pulse generator and the counter. The test circuitry relies on a comparison result of a counting result made by the counter and a number of the cycles of the clock signals to test any failure of the delay circuit.

A test method for a delay circuit and a test circuitry are provided. The test circuitry incudes the delay circuit that essentially includes multiple serially connected logic gates, a clock pulse generator at an input end of the delay circuit for generating one or more cycles of clock signals, and a counter at an output end of the delay circuit for counting the clock signals passing through the delay circuit. The test circuitry implements a test mode by switching lines to the clock pulse generator and the counter. The test circuitry relies on a comparison result of a counting result made by the counter and a number of the cycles of the clock signals to test any failure of the delay circuit.

A circuit and method for timing-tolerant optical pulse energy electrical conversion receives a current pulse stream converted from an input optical pulse stream (which may be periodic or nonperiodic), converts the current pulse stream to an electrical waveform of voltage pulses and detects each voltage pulse, e.g., by its leading edge. The conversion circuit may include a divider circuit for receiving the electrical waveform, dividing the waveform into a multi-channel output of divided electrical waveforms, and sequential logic circuits for adjusting a width window of each voltage pulse according to an adjustable delay.

A circuit and method for timing-tolerant optical pulse energy electrical conversion receives a current pulse stream converted from an input optical pulse stream (which may be periodic or nonperiodic), converts the current pulse stream to an electrical waveform of voltage pulses and detects each voltage pulse, e.g., by its leading edge. The conversion circuit may include a divider circuit for receiving the electrical waveform, dividing the waveform into a multi-channel output of divided electrical waveforms, and sequential logic circuits for adjusting a width window of each voltage pulse according to an adjustable delay.