A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

A driver circuit includes a first output terminal, a first switch, a second switch, a third switch and a power source. The first output terminal is arranged for outputting a data output. The first switch is selectively coupled between the first output terminal and a power supply node according to a data input. The second switch is selectively coupled between the first output terminal and a first reference node according to the data input. The third switch is selectively coupled between the first reference node and a reference voltage. The power source is configured to selectively provide one of a supply voltage signal and a supply current signal to the power supply node. When the power source is configured to provide the supply voltage signal, the third switch is switched on. When the power source is configured to provide the supply current signal, the third switch is switched off.

A driver circuit includes a first output terminal, a first switch, a second switch, a third switch and a power source. The first output terminal is arranged for outputting a data output. The first switch is selectively coupled between the first output terminal and a power supply node according to a data input. The second switch is selectively coupled between the first output terminal and a first reference node according to the data input. The third switch is selectively coupled between the first reference node and a reference voltage. The power source is configured to selectively provide one of a supply voltage signal and a supply current signal to the power supply node. When the power source is configured to provide the supply voltage signal, the third switch is switched on. When the power source is configured to provide the supply current signal, the third switch is switched off.

A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

A storage element that is operable based on a system clock signal, the storage element including a clock gating circuitry configured to generate a gated clock signal based on at least one Boolean signal and the system clock signal or a preprocessed system clock signal, wherein the clock gating circuitry comprises physical connections of small capacitance such that tapping of at least one of the physical connections results in a hold-time violation. Also, a hardware-based cryptography accelerator or a secured processing system including at least one such storage element, and a method for operating at least one storage element.

A storage element that is operable based on a system clock signal, the storage element including a clock gating circuitry configured to generate a gated clock signal based on at least one Boolean signal and the system clock signal or a preprocessed system clock signal, wherein the clock gating circuitry comprises physical connections of small capacitance such that tapping of at least one of the physical connections results in a hold-time violation. Also, a hardware-based cryptography accelerator or a secured processing system including at least one such storage element, and a method for operating at least one storage element.

A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

The disclosure discloses a lookup table-based circuit aging detection sensor, including a control circuit, two voltage controlled oscillators (VCOs), two shaping circuits, a phase comparator, a 3-digit voter, a beat-frequency oscillator, an 8-digit counter, a latch, a lookup table array and a digital-analogue converter. The control circuit respectively connects with the phase comparator, the 3-digit voter, the 8-digit counter, the first and the second VCOs. The first and second VCOs connect with the first and second shaping circuits respectively. The first and second shaping circuits connect with the phase comparator. The phase comparator connects with the 3-digit voter. The 3-digit voter connects with the beat-frequency oscillator. The beat-frequency oscillator respectively connects with the 8-digit counter and the latch. The 8-digit counter connects with the latch. The latch connects with the lookup table array. The lookup table array connects with the digital-analogue converter.