A drive device includes a driver configured to drive a high-side transistor and a low-side transistor; a first current detecting part for detecting one of an upper-side current that flows to the high-side transistor and a lower-side current that flows to the low-side transistor; a first current determining part that detects a sign of switching of a forward direction/reverse direction of the upper-side current or the lower-side current detected by the first current detecting part or the switching per se; and a slew rate adjusting part configured to control the driver such that a slew rate of the high-side transistor or the low-side transistor is adjusted according to a determination result of the first current determining part.

An RF signal switch circuit that allows connection of any of N radio frequency (RF) input terminals to a switch output port, either in a low loss mode, in a bypass mode, or, optionally, in a signal function mode. Embodiments of the invention allow for both a single switch in the series input path to a target circuit while still having the ability to isolate the bypass path from the target circuit. In the low loss and bypass mode, the circuit simultaneously exhibits low input insertion loss (and thus a low noise factor) and high bypass mode isolation.

Various methods and circuital arrangements for leakage reduction in MOS devices are presented. A pull-up circuit is selectively coupled to a gate of the MOS device to provide control of a voltage to the gate that is larger than a source voltage. Voltage switching circuits selectively couple different voltages to the body and/or back-gate terminals of the MOS device. During a standby mode of operation, the leakage current of the MOS device is decreased by driving the MOS device further into its subthreshold leakage region. During the standby mode, a threshold voltage of the MOS device is increased by coupling a voltage higher than the source voltage to the body and/or back-gate terminals. The MOS device can be a pass device used in low dropout regulator (LDO). During the standby mode, the LDO maintains output regulation by driving the MOS device further into its subthreshold leakage region and/or increasing the threshold voltage.

A gate drive circuit of a wide band gap power device (IGBT) includes a buffer, a di/dt sensing network, a turn-on circuit portion and turn-off circuit portion. The buffer, responsive to turn-on, supplies a first current via the first current path to the gate of the IGBT, and responsive to turn-off ceases the supply of the first current. The di/dt sensing network receives a feedback control signal representative of a voltage measurement across a parasitic inductance that exists between a Kelvin emitter and a power emitter of the The turn-on circuit portion, responsive to turn-on and a parasitic inductance of zero volts, supplies a second current via a second current path to the gate of the IGBT. The turn-off circuit portion, responsive to turn-off and a parasitic inductance of zero volts, discharges a gate capacitance of the IGBT through both the first current path and a third current path.

A power transistor module includes a power transistor device and a control circuit. The control circuit is electrically connected to the power transistor device for providing at least one gate voltage to drive the power transistor device, and adjusting the at least one gate voltage in response to an output power of the power transistor module. When the output power is greater than a predetermined power load, the at least one gate voltage has a first swing amplitude; and when the output power is less than or equal to the predetermined power load the at least one gate voltage has a second swing amplitude less than the first swing amplitude.

A switch activation system including a charge pump, a load monitor, and a switch driver. The charge pump drives a negative voltage node to a predetermined negative voltage level. The load monitor monitors the charge pump and to assert a break done signal after the charge pump begins driving the negative voltage back to the predetermined negative voltage level after being increased. The switch driver turns on a first electronic switch in response to assertion of a corresponding activation signal and assertion of the break done signal. The break done signal is asserted only after electronic switches being turned off are fully turned off to avoid conflict. The charge pump operates at a frequency based on a difference between a voltage level of the negative voltage node and the predetermined negative voltage level to drive the negative voltage node back to its predetermined level within a predetermined period of time.

A control circuit includes a detection module configured to detect an operating condition of a semiconductor switching device; a determining module configured to determine a gate allowable voltage of the semiconductor switching device based on the operating condition; and an output module configured to output a control signal to a driving power supply circuit of the semiconductor switching device based on the gate allowable voltage, to control the driving power supply circuit to provide a gate on voltage that is not higher than the gate allowable voltage and that is positively correlated with the gate allowable voltage for the semiconductor switching device. When the operating condition of the semiconductor switching device becomes better, the gate allowable voltage of the semiconductor switching device is increased.

Provided is a transistor drive circuit that drives a transistor to be driven and has a configuration including a controller that performs control to cause to temporally vary a circuit parameter contributing to a rise time or a fall time of the transistor to be driven.

A method is provided for driving a half bridge circuit that includes a first transistor and a second transistor that are switched in a complementary manner. The method includes generating an off-current during a plurality of turn-off switching events to control a gate voltage of the second transistor; measuring a transistor parameter of the second transistor during a first turn-off switching event during which the second transistor is transitioned to an off state, wherein the transistor parameter is indicative of an oscillation at the first transistor during a corresponding turn-on switching event during which the first transistor is transitioned to an on state; and activating a portion of the off-current for the second turn-off switching event, including regulating an interval length of the second portion for the second turn-off switching event based on the measured transistor parameter measured during the first turn-off switching event.

A semiconductor device includes a semiconductor layer, a first conductor disposed on the semiconductor layer, a second conductor disposed on the semiconductor layer so as to be separated from the first conductor, a relay portion that is formed on the semiconductor layer so as to straddle the first conductor and the second conductor and that is made of a semiconductor having a first conductivity type region and a second conductivity type region, a first contact by which the first conductivity type region and the second conductivity type region are electrically connected to the first conductor, and a second contact that electrically connects the first conductivity type region of the relay portion and the second conductor together and that is insulated from the second conductivity type region.