A method of generating multiple gating signals for a multi-gated input/output (I/O) system. The system includes an output level shifter and an output driver which are coupled in series between an output node of a core circuit and an external terminal of a corresponding system. The method includes: generating first and second gating signals having corresponding first and second waveforms, the first waveform transitioning from a non-enabling state to an enabling state before the second waveform transitions from the non-enabling state to the enabling state; receiving the first gating signal at the output level shifter; and receiving the second gating signal at the output driver.

According to one embodiment, a semiconductor device includes first, second, third, and fourth circuits. A first voltage is applied to the first circuit. A second voltage is applied to each of the second, third and fourth circuits. The third circuit is configured to generate a first control signal and a second control signal based on a signal generated by the first circuit and a signal generated by the second circuit. The fourth circuit is configured to output an output signal based on the first control signal and the second control signal. The output signal is brought to a high impedance state when at least one of the first voltage or the second voltage is not applied.

An integrated circuit includes a signal pad, an output buffer having an output coupled to the signal pad and having an enable input, an input buffer having an input coupled to the signal pad and having an enable input, a counter, and a gating circuit. The counter is enabled to start counting down a predetermined count value when a voltage on the signal pad is both higher than a predetermined low threshold voltage and lower than a predetermined high threshold voltage, wherein the predetermined low threshold voltage corresponds to a threshold below which a voltage corresponds to a logic level zero and the predetermined high threshold voltage corresponds to a threshold above which a voltage corresponds to a logic level one. The gating circuit is configured to, in response to the counter expiring, disable the input buffer and the output buffer.

A device includes a first connection pin, a second connection pin, a third connection pin, and a fourth connection pin. The second connection pin is configured to be connected to a supply voltage. The fourth connection pin is configured to be coupled to a reference voltage. The device further includes a first transistor including: a first gate and a first source/drain coupled to the first connection pin; a second transistor including a second gate and a second source/drain connected to the first transistor; and a third transistor including a third gate, a third source/drain connected to the second transistor, and a fourth source/drain connected to the fourth connection pin. The third transistor is configured to be controlled by a digital signal using the third connection pin. Both the first gate and the second gate are directly connected to the second connection pin.

A bi-directional level shift circuit shifts signal levels between a first signal line and a second signal line. The circuit includes a first transistor and a second transistor. The first transistor includes a first gate connected to the second signal line, a first source connected to the first signal line, and a first drain connected to a voltage rail which supplies voltage. The second transistor includes a second gate connected to the voltage rail, a second source connected to the first signal line, and a second drain connected to the second signal line.

An impedance calibration circuit includes a first code generation circuit connected to a first reference resistor, and configured to generate a first code for forming a resistance based on the first reference resistor, by using the first reference resistor; a second code generation circuit configured to form a resistance of a second reference resistor less than the resistance of the first reference resistor, based on the first code, and generate a second code by using the second reference resistor; and a target impedance code generation circuit configured to generate a target impedance code based on the first code, the second code, and a target impedance value, and form an impedance having the target impedance value in a termination driver connected to the impedance calibration circuit, based on the target impedance code.

A chip package used as a logic drive, includes: multiple semiconductor chips, a polymer layer horizontally between the semiconductor chips; multiple metal layers over the semiconductor chips and polymer layer, wherein the metal layers are connected to the semiconductor chips and extend across edges of the semiconductor chips, wherein one of the metal layers has a thickness between 0.5 and 5 micrometers and a trace width between 0.5 and 5 micrometers; multiple dielectric layers each between neighboring two of the metal layers and over the semiconductor chips and polymer layer, wherein the dielectric layers extend across the edges of the semiconductor chips, wherein one of the dielectric layers has a thickness between 0.5 and 5 micrometers; and multiple metal bumps on a top one of the metal layers, wherein one of the semiconductor chips is a FPGA IC chip, and another one of the semiconductor chips is a NVMIC chip.

A system (for generating multi-gated power-on control signals) includes: a multi-gated input/out (I/O) interface configured to receive at least first and second gating signals; and a gated power-on control (POC) signals generator configured to generate at least the first and second gating signals for the multi-gated I/O interface, a waveform of the first gating signal being different from a waveform of the second gating signal.

A bi-directional level shift circuit shifts signal levels between a first signal line and a second signal line. The circuit includes a first transistor and a second transistor. The first transistor includes a first gate connected to the second signal line, a first source connected to the first signal line, and a first drain connected to a voltage rail which supplies voltage. The second transistor includes a second gate connected to the voltage rail, a second source connected to the first signal line, and a second drain connected to the second signal line.

An impedance calibration circuit includes a first code generation circuit connected to a first reference resistor, and configured to generate a first code for forming a resistance based on the first reference resistor, by using the first reference resistor; a second code generation circuit configured to form a resistance of a second reference resistor less than the resistance of the first reference resistor, based on the first code, and generate a second code by using the second reference resistor; and a target impedance code generation circuit configured to generate a target impedance code based on the first code, the second code, and a target impedance value, and form an impedance having the target impedance value in a termination driver connected to the impedance calibration circuit, based on the target impedance code.