H03K19/215

Low-loss arithmetic circuit and operating method of the same
11816449 · 2023-11-14 · ·

The disclosure relates to a low-loss arithmetic circuit, which includes a plurality of arithmetic units, a plurality of storage units, and one or more reset MOSFETs. Each arithmetic unit includes 4 MOSFETs. The disclosure also relates to an operating method of the low-loss arithmetic circuit and a low-loss Processing-in-Memory circuit.

Data compressor logic circuit

A compressor includes a logic circuit having transistors of a first channel type to receive a plurality of bit signals, and transistors of a second channel type, different from the first channel type, to receive the plurality of bit signals. The transistors of the first channel type are configured to generate an XOR logic output based on the plurality of bit signals, and the transistors of the second channel type are configured to generate, substantially simultaneous with the generation of the XOR logic output, an XNOR logic output based on the plurality of bit signals. The compressor includes NAND gates to receive multiplicand and multiplier bit signals.

FABRICATION OF A MAJORITY LOGIC GATE HAVING NON-LINEAR INPUT CAPACITORS

A new class of logic gates are presented that use non-linear polar material. The logic gates include multi-input majority gates. Input signals in the form of digital signals are driven to non-linear input capacitors on their respective first terminals. The second terminals of the non-linear input capacitors are coupled a summing node which provides a majority function of the inputs. The majority node is then coupled driver circuitry which can be any suitable logic gate such as a buffer, inverter, NAND gate, NOR gate, etc. In the multi-input majority or minority gates, the non-linear charge response from the non-linear input capacitors results in output voltages close to or at rail-to-rail voltage levels. Bringing the majority output close to rail-to-rail voltage eliminates the high leakage problem faced from majority gates formed using linear input capacitors.

Compact 3D stacked-CFET architecture for complex logic cells

A 3D IC includes a substrate having a substrate surface, a first stack of semiconductor devices stacked along a thickness direction of the substrate, and a second stack of semiconductor devices stacked along the thickness direction of the substrate and provided adjacent to the first stack in a direction along the substrate surface. Each semiconductor device of the first and second stack includes a gate and a pair of source-drain regions provided on opposite sides of the respective gate, and each gate of the first and second stack is a split gate. A gate contact is physically connected to a first split gate of a first one of the semiconductor devices. The gate contact forms at least part of a local interconnect structure that electrically connects the first semiconductor device to a second semiconductor device in the 3D IC.

2-input NAND gate with non-linear input capacitors

A new class of logic gates are presented that use non-linear polar material. The logic gates include multi-input majority gates. Input signals in the form of digital signals are driven to non-linear input capacitors on their respective first terminals. The second terminals of the non-linear input capacitors are coupled a summing node which provides a majority function of the inputs. The majority node is then coupled driver circuitry which can be any suitable logic gate such as a buffer, inverter, NAND gate, NOR gate, etc. In the multi-input majority or minority gates, the non-linear charge response from the non-linear input capacitors results in output voltages close to or at rail-to-rail voltage levels. Bringing the majority output close to rail-to-rail voltage eliminates the high leakage problem faced from majority gates formed using linear input capacitors.

Neural network with synapse string array

Provided is a binary neural network including: a synapse string array in which multiple synapse strings are sequentially connected. The synapse string includes: first and second cell strings, each including memory cell devices connected in series; and switching devices connected to first ends of two-side ends of the first and second cell strings. The memory cell devices of the first and second cell strings are in one-to-on correspondence to each other, and a pair of the memory cell devices being in one-to-on correspondence to each other have one-side terminals electrically connected to each other to constitute one synapse morphic device. A plurality of the pairs of memory cell devices configured with the first and second cell strings constituting each synapse string constitute a plurality of the synapse morphic devices. The synapse morphic devices of each synapse string are electrically connected to the synapse morphic devices of other synapse strings.

Method and system for providing a variation resistant magnetic junction-based XNOR cell usable in neuromorphic computing

A hardware cell and method for performing a digital XNOR of an input signal and weights are described. The hardware cell includes input lines, a plurality of pairs of magnetic junctions, output transistors and at least one selection transistor coupled with the output transistors. The input lines receive the input signal and its complement. The magnetic junctions store the weight. Each magnetic junction includes a reference layer, a free layer and a nonmagnetic spacer layer between the reference layer and the free layer. The free layer has stable magnetic states and is programmable using spin-transfer torque and/or spin-orbit interaction torque. The first magnetic junction of a pair receives the input signal. The second magnetic junction of the pair receives the input signal complement. The output transistors are coupled with the magnetic junctions such that each pair of magnetic junctions forms a voltage divider. The output transistors form a sense amplifier.

Majority logic gate with non-linear input capacitors

A new class of logic gates are presented that use non-linear polar material. The logic gates include multi-input majority gates. Input signals in the form of digital signals are driven to non-linear input capacitors on their respective first terminals. The second terminals of the non-linear input capacitors are coupled a summing node which provides a majority function of the inputs. The majority node is then coupled driver circuitry which can be any suitable logic gate such as a buffer, inverter, NAND gate, NOR gate, etc. In the multi-input majority or minority gates, the non-linear charge response from the non-linear input capacitors results in output voltages close to or at rail-to-rail voltage levels. Bringing the majority output close to rail-to-rail voltage eliminates the high leakage problem faced from majority gates formed using linear input capacitors.

Full adder cell with improved power efficiency
11294631 · 2022-04-05 · ·

An adder circuit that includes an operand input and a second operand input to an XNOR cell. The XNOR cell is configured to provide the operand input and the second operand input to both a NAND gate and a first OAI cell. A second OAI cell transforms the output of the XNOR cell into a carry out signal.

XOR based non-overlapping clock generator

A non-overlapping clock generator generating an in-phase output clock signal and a reversed-phase output clock signal which are non-overlapped with each other, includes: a first and a second XOR gates, a first and a second load transistors, which are cross coupled, and includes: a first and a second delay circuits. The first delay circuit is coupled between the in-phase output clock signal and a control terminal of the first load transistor. The second delay circuit is coupled between the reversed-phase output clock signal and a control terminal of the second load transistor. Each of the XOR gates includes at least one pass transistor logic circuit configured to execute XOR logic operation and coupled to a first control voltage. A non-overlapping period is determined according to the first control voltage and/or a first delay period of the first delay circuit and a second delay period of the second delay circuit.