An integrated circuit may include a full-scale reference generation circuit that corrects for variation in the gain or full scale of a set of interleaved analog-to-digital converters (ADCs). Notably, the full-scale reference generation circuit may provide a given full-scale or reference setting for a given interleaved ADC, where the given full-scale setting corresponds to a predefined or fixed component and a variable component (which may specify a given full-scale correction for a given full scale). For example, the full-scale reference generation circuit may include a full-scale reference generator replica circuit that outputs a fixed current corresponding to the fixed component. Furthermore, the full-scale reference generation circuit may include a full-scale reference generator circuit that outputs a first voltage corresponding to the given full-scale setting based at least in part on the fixed current and a variable current that, at least in part, specifies the given full-scale correction.

A method of processing an analog signal includes receiving, into signal processing circuitry from compensation circuitry, an offset compensation signal, the offset compensation signal having (i) a polarity opposite a polarity of a gain error of the signal processing circuitry and (ii) a magnitude equal to a nominal compensation value plus a deviation. The method includes generating, by the signal processing circuitry, an output signal based on an analog signal received into the signal processing circuitry, including applying the offset compensation signal to an intermediate signal generated by the signal processing circuitry. The method includes scaling the output signal based on the deviation between the magnitude of the offset compensation signal and the nominal compensation value.

The present disclosure provides an error compensation correction system and method for an analog-to-digital converter with a time interleaving structure, the system includes an analog-to-digital converter with a time interleaving structure, a master clock module, a packet clock module, an error correction module, an adaptive processing module and an overall MUX circuit. Through the error compensation correction system and method for the analog-to-digital converter with a time interleaving structure according to the present disclosure, lower correction hardware implementation complexity and higher stability are ensured. The system and method according to the present disclosure are particularly suitable for interchannel mismatch error correction of dense channel time interleaving ADC, and the performance of the time interleaving ADC is improved.

A signal converting apparatus includes a comparing device, a first digital-slope quantizer, and a second digital-slope quantizer. The comparing device has a first input terminal and a second input terminal for receiving a received signal and an adjustable reference voltage respectively, and for generating an output signal at an output port. The first digital-slope quantizer is coupled to the output port and the second input terminal for generating a first set of digital signals to monotonically adjust the adjustable reference voltage at the second input terminal during a first phase according to a first quantization unit. The second digital-slope quantizer is coupled to the output port and the second input terminal for generating a second set of digital signals to monotonically adjust the adjustable reference voltage at the second input terminal during a second phase after the first phase according to a second quantization unit.

An integrated circuit may include a full-scale reference generation circuit that corrects for variation in the gain or full scale of a set of interleaved analog-to-digital converters (ADCs). Notably, the full-scale reference generation circuit may provide a given full-scale or reference setting for a given interleaved ADC, where the given full-scale setting corresponds to a predefined or fixed component and a variable component (which may specify a given full-scale correction for a given full scale). For example, the full-scale reference generation circuit may include a full-scale reference generator replica circuit that outputs a fixed current corresponding to the fixed component. Furthermore, the full-scale reference generation circuit may include a full-scale reference generator circuit that outputs a first voltage corresponding to the given full-scale setting based at least in part on the fixed current and a variable current that, at least in part, specifies the given full-scale correction.

Comparator circuitry for use in a comparator to capture differences between magnitudes of a pair of comparator input signals in a series of capture operations defined by a reset signal, the circuitry comprising: latch circuitry, comprising a pair of latch input transistors which form corresponding parts of first and second current paths of the latch circuitry respectively, which current paths extend in parallel between high and low voltage sources, a pair of latch output nodes at corresponding positions along the first and second current paths of the latch circuitry respectively, and timing circuitry; and gain-stage circuitry, comprising a pair of cross-coupled gain-stage output transistors connected along respective first and second current paths of the gain-stage circuitry which extend in parallel between high and low voltage sources, and a pair of diode-connected gain-stage output transistors connected in parallel with the pair of cross-coupled gain-stage output transistors, respectively.

In an optical detection system, features of interest can be identified from ADC circuitry data prior to inter-circuit communication with downstream object or target processing circuitry. In this manner, a volume of data being transferred to such downstream processing circuitry can be reduced as compared to other approaches, simplifying the receive signal processing chain and providing power savings. First-tier signal processing circuitry to identify features of interest can be located on or within a commonly-shared integrated circuit package with ADC circuitry, and downstream processing circuitry for object processing or range estimation can be fed with a data link meeting less stringent requirements than a link between the ADC circuitry and first-tier signal processing circuitry

An apparatus is provided to calibrate an analog-to-digital converter (ADC). The apparatus includes a calibration circuitry coupled to an output of the ADC, wherein the calibration circuitry is to identify a maximum value and minimum value of the output of the ADC, and is to calibrate one or more performance parameters of the ADC according to the maximum and minimum values. The performance parameters include: gain of the ADC, offset of the ADC, and timing skew between the ADC and a neighboring ADC.

A switched-capacitor analog-to-digital converter (ADC) includes: a main digital-to-analog converter (DAC) circuit; a comparator coupled to the main DAC circuit and configured to determine whether the input to the comparator exceeds a pre-determined threshold; and a supplementary DAC circuit coupled to the main DAC circuit, wherein the switched-capacitor ADC is configured to operate in at least one of a first mode or a second mode, wherein in the first mode for measuring an offset of the switched-capacitor ADC, the supplementary DAC circuit is configured to shift a voltage at an output of the main DAC circuit by a first value having a first polarity, and wherein in the second mode for measuring a full-scale gain error of the switched-capacitor ADC, the supplementary DAC circuit is configured to shift the voltage at the output of the main DAC circuit by a second value having a second polarity opposite the first polarity.

A method and a circuit for measuring an absolute voltage signal, such that the circuit comprises: an A/D convertor, and a controller adapted for: a) obtaining a first digital reference value for a first reference signal having a positive temperature coefficient; b) obtaining a second digital reference value for a second reference signal having a negative temperature coefficient; c) obtaining a raw digital signal value for the signal to be measured, while applying a same reference voltage for step a) to c); and d) calculating the absolute voltage value in the digital domain using a mathematical function of the first and second digital reference value, and the raw digital signal value.