An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. Each channel receives a sampling clock with a different phase delay. The sampling clocks are overlapping multi-phase clocks rather than non-overlapping. Overlapping the multi-phase clocks allows the sampling pulse width to be enlarged, providing more time for the sampling switch to remain open and allow analog voltages to equalize through the sampling switch. Higher sampling-clock frequencies are possible than when non-overlapping clocks are used. The sampling clock is boosted in voltage by a bootstrap driver to increase the gate voltage on the sampling switch, reducing the ON resistance. Sampling clock and component timing skews are reduced to one LSB among all N channels.

An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. In each channel the ADC output is filtered, and a product derivative correlator generates a product derivative factor for correlation to two adjacent ADC channels. A matrix processor arranges the product derivative factors from the product derivative correlators into a matrix that is multiplied by a correlation matrix. The correlation matrix is a constant generated from an N×N shift matrix. The matrix processor outputs a sign-bit vector. Each bit in the sign-bit vector determines when tested SAR bits are set or cleared to adjust a channel's variable delay. Sampling clock and component timing skews are reduced to one LSB among all N channels.

A sampling clock generating circuit and an analog to digital converter includes a resistance variable circuit, a NOT-gate type circuit, and a capacitor, where an input end of the NOT-gate type circuit receives a pulse signal whose period is T; an output end of the NOT-gate type circuit is connected to one end of the capacitor; the other end of the capacitor is grounded; a power supply terminal of the NOT-gate type circuit is connected to a power supply; a ground terminal of the NOT-gate type circuit is connected to one end of the resistance variable circuit; and the other end of the resistance variable circuit is grounded; the NOT-gate type circuit is configured to: when the pulse signal is a high level, output a low level; and when the pulse signal is a low level, output a high level.

An apparatus can include a digital-to-analog converter (DAC) and calibration circuitry including an oscillator. The calibration circuitry can be coupled to an output of the DAC, the calibration circuitry to sample and count DAC output pulses for at least two consecutive pulses using at least two separate counter circuits. The calibration circuitry can determine error between at least two consecutive pulses and provide a correction value based on the error. The apparatus can further include correction circuitry to provide a calibration signal to the DAC based on the correction value.

An analog to digital converter (ADC) device includes ADC circuits, a calibration circuit and a skew adjusting circuit. The ADC circuits convert an input signal according to clock signals, to generate first quantized outputs. The calibration circuit calibrates the first quantized outputs to generate second quantized outputs. The skew adjusting circuit includes an estimating circuit and a feedback circuit. The estimating circuit analyzes the second quantized outputs to generate detection signals, wherein the detection signals are related to time difference information of the clock signals. The skew adjusting circuit outputs the detection signals as adjustment signals, wherein the adjustment signals are configured to reduce a clock skew of the ADC circuits. The feedback circuit analyzes the detection signals generated by the estimating circuit, to generate a feedback signal to the estimating circuit, wherein the estimating circuit is configured to adjust the detection signals according to the feedback signal.

A multi-layer time-interleaving (TI) device and method of operation therefor. This device includes a plurality of TI layers configured to receive a plurality of input clock signals and to output a plurality of output clock signals, each of which can be configured to drive subsequent devices. The layers include at least a first and second layer including a fine-grain propagation device and a barrel-shifting propagation device configured to retime the plurality of input clock signals to produce divided output clock signals. The device can include additional barrel-shifting propagation devices to time interleave an initial two layers to produce one or more additional layers. Using negative phase stepping, the plurality of output clock signals is produced with optimal timing margin and synchronized on a single clock edge.

An electronic device may include digital circuitry to operate via digital signals and analog circuitry to operate via analog signals. The electronic device may also include a fractal digital to analog converter (DAC) to convert a digital signal into an analog signal. The fractal DAC may include a unit cell array having a branching data path and multiple unit cells disposed in a fractal pattern. The fractal DAC may also include multiple decision units disposed within the unit cell array on the branching data path. Each decision unit may receive an incoming signal representative of at least a portion of the digital signal and direct each decision unit output to different branches of the unit cell array. The unit cells may be enabled based at least in part on the decision unit outputs to generate the analog signal.

Present invention discloses an ADC and an analog-to-digital conversion method. The ADC includes: a clock generator, including M transmission gates, where the M transmission gates are configured to receive a first clock signal that is periodically sent and separately perform gating control on the first clock signal, so as to generate M second clock signals, M is an integer that is greater than or equal to 2; M ADC channels that are configured in a time interleaving manner, configured to receive one analog signal and separately perform, under the control of the M second clock signals, sampling and analog-to-digital conversion on the analog signal, so as to obtain M digital signals, where each ADC channel is corresponding to one clock signal of the M second clock signals; and an adder, configured to add the M digital signals together in a digital field, so as to obtain a digital output signal.

A time and frequency domain signal conditioning device including one or more signal terminals, one or more rails, and a passive signal conditioning means for reducing a switching noise jitter signature present in an output signal of a feedback control loop circuitry with a plurality of noise carrying jittering ramps is disclosed. The passive signal conditioning means including the rails is characterized by a set of specified characteristics to condition pre-existing noise amplitude and slopes of the output signal such that the conditioned output signal cooperates with the feedback control loop circuitry. As a consequence the switching noise jitter signature which is produced by transient noise displacement or noise perturbation in the time domain when the output signal jitters can be reduced in the output of the feedback control loop circuitry.

The present disclosure provides an error compensation correction system and method for an analog-to-digital converter with a time interleaving structure, the system includes an analog-to-digital converter with a time interleaving structure, a master clock module, a packet clock module, an error correction module, an adaptive processing module and an overall MUX circuit. Through the error compensation correction system and method for the analog-to-digital converter with a time interleaving structure according to the present disclosure, lower correction hardware implementation complexity and higher stability are ensured. The system and method according to the present disclosure are particularly suitable for interchannel mismatch error correction of dense channel time interleaving ADC, and the performance of the time interleaving ADC is improved.