In at least some embodiments, a system comprises a frequency generator configured to generate a second clock signal having a second frequency using a first clock signal having a first frequency. The second frequency is offset from the first frequency and each of a plurality of harmonic frequencies of the second frequency is offset from a harmonic frequency of the first frequency. The system also includes a power converter configured to produce a power signal that at least partially corresponds to the second frequency. The system further comprises an analog-to-digital converter (ADC) configured to sample and convert analog voltages at the first frequency. The ADC is powered by the power signal.

The present technology relates to a solid-state imaging device, an electronic apparatus, and an AD converter that are capable of suppressing the occurrence of an error in AD conversion results. The solid-state imaging device includes a pixel section having a plurality of pixels, a comparator for comparing a pixel signal outputted from the pixels with a reference signal, and a counter for counting the time of comparison made by the comparator. The comparator includes a first amplifier for comparing the pixel signal with the reference signal, a second amplifier that has a first transistor and amplifies an output signal of the first amplifier, and a second transistor having the same polarity as the first transistor. A gate of the second transistor is connected to an output end of the first amplifier, and a source and a drain of the second transistor are connected to the same fixed potential as a source of the first transistor. The present technology is applicable, for example, to a CMOS image sensor.

Methods and systems are provided for circuits. One method is for increasing device threshold voltage distribution of a plurality of devices of a circuit. The method includes adjusting a device threshold voltage of the plurality of devices by different amounts; and selecting a subset of the plurality of devices with adjusted device threshold voltage by a device selection module for performing a function associated with the circuit. In one aspect, a system for device threshold voltage adjustment is provided. The system includes a sensor module for sensing one or more of temperature and voltage values of a die having a plurality of devices for a circuit; and a threshold temperature and voltage compensation module for receiving an input value from the sensor module to compensate variation in a device threshold voltage caused by changes of one or more of temperature and voltage of the die.

A measurement system includes a gain chain configured to amplify an analog input signal; a range selector configured to select a gain between the analog input signal and a plurality of analog-to-digital converter (ADC) outputs from a plurality of ADCs, wherein each ADC output has a path, and a gain of each output path is made up of a plurality of gain stages in the gain chain; and a mixer configured to combine the plurality of ADC outputs into a single mixed output.

A transistor (M1) whose gate is capacitance-coupled to a wiring (L1) is connected between the wirings (L1, L2) connected to output nodes (OT1, OT2) outputting a reference voltage (VREF_OUT). A replica circuit (20) having a resistor (22) and a transistor (M2) connected in series is provided between the wirings (L1, L2). Gates of the transistors (M1, M2) are connected to each other. A differential amplifier (23) receives a voltage (V_RP) of a node (N1) between the resistor (22) and the transistor (M1) and a standard voltage (V_ID), and provides an output to the gate of the transistor (M2).

In at least some embodiments, a system comprises a frequency generator configured to generate a second clock signal having a second frequency using a first clock signal having a first frequency. The second frequency is offset from the first frequency and each of a plurality of harmonic frequencies of the second frequency is offset from a harmonic frequency of the first frequency. The system also includes a power converter configured to produce a power signal that at least partially corresponds to the second frequency. The system further comprises an analog-to-digital converter (ADC) configured to sample and convert analog voltages at the first frequency. The ADC is powered by the power signal.

The present disclosure relates to a voltage reference circuit and a method of providing a voltage reference. The voltage reference circuit uses a switched capacitor arrangement to move charge between capacitors during different phases of operation of the circuit to which the voltage reference is being provided. The circuit being provided with a voltage reference may be an analog-to-digital converter (ADC). A reservoir capacitor is used to supply the reference voltage. During a phase in which no voltage reference is required, charge is shared between the capacitors of the switched capacitor arrangement, in order to boost the charge on the reservoir capacitor. After charge sharing, the reservoir capacitor is topped up with an output from a reference buffer. The reservoir capacitor may then be used again in the next conversion phase.

A digital/analog converter circuit includes: a decoding unit that performs decoding processing on a bit signal in a predetermined part of a digital signal; and a selector circuit that selects and outputs a voltage depending on an output of the decoding unit, in which a switching device is disposed on at least one of inside of the decoding unit and an output unit side of the decoding unit, the switching device being controlled by a control signal different from the hit signal as a target for the decoding processing.

A circuit comprises a first amplifier coupled to a first and a second node; a differential capacitive load coupled to the first and the second node, the differential capacitive load coupled between drains of transistors in a cross coupled transistor circuit; a current mirror coupled to a source of each transistor; and a capacitor coupled between the sources of the transistors. A plurality of amplifiers can be coupled to the differential capacitive load, wherein each amplifier comprises a clock-less pre-amplifier of a comparator. The amplifiers may be abutted to one another such that an active transistor of a first differential stage in a first amplifier behaves as a dummy transistor for an adjacent differential stage in a second amplifier.

Disclosed herein is an analog-to-digital converter (ADC) for converting an input analog voltage to an output digital code, the ADC comprising a first node of the input analog voltage; nodes of a plurality of reference voltages; a plurality of comparators, inputs of each comparator being coupled to the first node and a node of a corresponding reference voltage of the plurality of reference voltages; a logic circuit block for receiving outputs of the plurality of comparators and generating the output digital code; and a voltage stabilizer, terminals of the voltage stabilizer being coupled with the first node and a node of a first reference voltage among the plurality of reference voltages.