A solid-state imaging device includes: a pixel array unit in which a plurality of pixels are arranged in rows and columns; a plurality of column signal lines which are provided in one-to-one correspondence with pixel columns; a column processor including a plurality of column AD circuits provided in one-to-one correspondence with the plurality of column signal lines; a power supply variation detector which is connected to a power supply wire through which a power supply voltage is transmitted to each of the pixels, and which detects, in correspondence with pixel rows, power supply variation components attributed to variations in the power supply voltage; and a power supply variation corrector which corrects, for each of the pixel rows, a pixel signal detected by the column processor, using the power supply variation components detected by the power supply variation detector.

Implementations described herein disclose a laser diode driver that allows switching low-voltage (LV) high-speed devices with while driving high voltage current to a laser diode without risking destroying the LV devices. Specifically, the laser diode driver disclosed herein is a pulsed high speed digital to analog (DAC) driver that uses high-speed LV transistors in advanced nodes for high-speed switching of current nodes.

Methods and devices are provided for circuits. One device includes an adjustment circuit having an adjustable resistor for modifying a resistance value of a resistive device, the adjustment circuit connected to an adjustment terminal of the resistive device. The resistance value of the adjustable resistor changes, when a voltage or charge on the adjustment terminal of the adjustable resistor is changed. The adjustable resistor is a phase change element with an adjusting terminal to which different voltage values are applied for adjusting a conversion device threshold value.

The present technology relates to a signal processing device, an image pickup element, and an electronic device capable of suppressing power source variation due to driving of a counter. The signal processing device according to the present technology includes a first A/D converter which performs A/D conversion on an analog signal by using a first counter being a predetermined counter and a second A/D converter which performs the A/D conversion on the analog signal by using a second counter count timing of which is the same as that of the first counter and a polarity of a count value of which is opposite to that of the first counter. The first and second A/D converters are arranged in the vicinity of each other such that power source variations thereof affect both. The present technology may be applied to the image pickup element and the electronic device, for example.

The present technology relates to an imaging element, a processing method, and an electronic device which are capable of reducing deterioration in an image quality of a captured image caused by power fluctuation. A counting unit includes a counting operation unit that performs a counting operation of counting the count value and a dummy operation unit that performs a dummy counting operation at a timing complementary to the counting operation of the counting operation unit. The present technology can be applied to, for example, an imaging element that counts a count value and performs AD conversion.

The present technology relates to a solid-state imaging device, an electronic apparatus, and an AD converter that are capable of suppressing the occurrence of an error in AD conversion results.

The solid-state imaging device includes a pixel section having a plurality of pixels, a comparator for comparing a pixel signal outputted from the pixels with a reference signal, and a counter for counting the time of comparison made by the comparator. The comparator includes a first amplifier for comparing the pixel signal with the reference signal, a second amplifier that has a first transistor and amplifies an output signal of the first amplifier, and a second transistor having the same polarity as the first transistor. A gate of the second transistor is connected to an output end of the first amplifier, and a source and a drain of the second transistor are connected to the same fixed potential as a source of the first transistor. The present technology is applicable, for example, to a CMOS image sensor.

A noise filtering circuit, a digital to analog converter and an electronic device are provided. The noise filtering circuit comprises a first amplifier configured to receive a bias voltage at a first input terminal, receive a bias output voltage at a second input terminal though a feedback path, and compensate for a difference between the bias voltage and the bias output voltage; a first transistor connected to an output of the first amplifier and having a gate to which an off-voltage is applied; a first capacitor connected to the first transistor; a second capacitor connected to the output of the first amplifier; a second transistor connected to the second capacitor and having a gate to which an off-voltage is applied, and a second amplifier having an input terminal connected to the first capacitor and a second input terminal connected to the second transistor.

Circuits are used to sense and compensate or mitigate the imbalance errors, hence restoring the intended benefits of differential processing. In particular, the impedance mismatch between the positive and negative branches of a balanced system is sensed by digitizing an error voltage developed by injecting suitable common mode stimuli. The mismatch is then trimmed out by introducing and properly setting up a digitally controlled impedance that counters the original impedance mismatch and hence rebalances the signal path on-situ and prior to exercising the signal processing chain.

In at least some embodiments, a system comprises a frequency generator configured to generate a second clock signal having a second frequency using a first clock signal having a first frequency. The second frequency is offset from the first frequency and each of a plurality of harmonic frequencies of the second frequency is offset from a harmonic frequency of the first frequency. The system also includes a power converter configured to produce a power signal that at least partially corresponds to the second frequency. The system further comprises an analog-to-digital converter (ADC) configured to sample and convert analog voltages at the first frequency. The ADC is powered by the power signal.

The present technology relates to a solid-state imaging device, an electronic apparatus, and an AD converter that are capable of suppressing the occurrence of an error in AD conversion results. The solid-state imaging device includes a pixel section having a plurality of pixels, a comparator for comparing a pixel signal outputted from the pixels with a reference signal, and a counter for counting the time of comparison made by the comparator. The comparator includes a first amplifier for comparing the pixel signal with the reference signal, a second amplifier that has a first transistor and amplifies an output signal of the first amplifier, and a second transistor having the same polarity as the first transistor. A gate of the second transistor is connected to an output end of the first amplifier, and a source and a drain of the second transistor are connected to the same fixed potential as a source of the first transistor. The present technology is applicable, for example, to a CMOS image sensor.