Patent classifications
H03M1/0845
ANALOG-TO-DIGITAL CONVERTER (ADC) WITH IMPROVED POWER DISTURBANCE REDUCTION
Disclosed herein is an analog-to-digital converter (ADC) for converting an input analog voltage to an output digital code, the ADC comprising a first node of the input analog voltage: nodes of a plurality of reference voltages; a plurality of comparators, inputs of each comparator being coupled to the first node and a node of a corresponding reference voltage of the plurality of reference voltages; a logic circuit block for receiving outputs of the plurality of comparators and generating the output digital code; and a voltage stabilizer, terminals of the voltage stabilizer being coupled with the first node and a node of a first reference voltage among the plurality of reference voltages.
CIRCUITS FOR ON-SITU DIFFERENTIAL IMPEDANCE BALANCE ERROR MEASUREMENT AND CORRECTION
Circuits are used to sense and compensate or mitigate the imbalance errors, hence restoring the intended benefits of differential processing. In particular, the impedance mismatch between the positive and negative branches of a balanced system is sensed by digitizing an error voltage developed by injecting suitable common mode stimuli. The mismatch is then trimmed out by introducing and properly setting up a digitally controlled impedance that counters the original impedance mismatch and hence rebalances the signal path on-situ and prior to exercising the signal processing chain.
SOLID-STATE IMAGING DEVICE, ELECTRONIC APPARATUS, AND AD CONVERTER
The present technology relates to a solid-state imaging device, an electronic apparatus, and an AD converter that are capable of suppressing the occurrence of an error in AD conversion results.
The solid-state imaging device includes a pixel section having a plurality of pixels, a comparator for comparing a pixel signal outputted from the pixels with a reference signal, and a counter for counting the time of comparison made by the comparator. The comparator includes a first amplifier for comparing the pixel signal with the reference signal, a second amplifier that has a first transistor and amplifies an output signal of the first amplifier, and a second transistor having the same polarity as the first transistor. A gate of the second transistor is connected to an output end of the first amplifier, and a source and a drain of the second transistor are connected to the same fixed potential as a source of the first transistor. The present technology is applicable, for example, to a CMOS image sensor.
SOLID-STATE IMAGING DEVICE, ELECTRONIC APPARATUS, AND AD CONVERTER
The present technology relates to a solid-state imaging device, an electronic apparatus, and an AD converter that are capable of suppressing the occurrence of an error in AD conversion results.
The solid-state imaging device includes a pixel section having a plurality of pixels, a comparator for comparing a pixel signal outputted from the pixels with a reference signal, and a counter for counting the time of comparison made by the comparator. The comparator includes a first amplifier for comparing the pixel signal with the reference signal, a second amplifier that has a first transistor and amplifies an output signal of the first amplifier, and a second transistor having the same polarity as the first transistor. A gate of the second transistor is connected to an output end of the first amplifier, and a source and a drain of the second transistor are connected to the same fixed potential as a source of the first transistor. The present technology is applicable, for example, to a CMOS image sensor.
ANALOG SYSTEM AND ASSOCIATED METHODS THEREOF
A plurality of devices of a circuit perform a function associated with the circuit. A compensation module obtains a temperature value and/or core voltage value associated with the circuit and uses the temperature value and/or the core voltage value to adjust at least one device of the plurality of devices. The adjustment may include using one or more source resisters connected to the at least one device of the plurality of devices to adjust a device voltage threshold. The plurality of devices may perform analog to digital conversion, and the compensation module may generate a digital offset value using the temperature value and/or the core voltage value and add or subtract the digital offset value from an unadjusted digital output value to compensate for a change in the temperature value and/or the core voltage value.
Compensation of non-linearity at digital to analog converters
An apparatus for compensating for nonlinearities in a DAC caused by variabilities of a power supply. The apparatus may include a power supply, a processing component, and a front-end circuit. The power supply may generate power, where the power includes variabilities in a power. The processing component may generate a digital signal. The front-end circuit may be operatively coupled to the power supply and the processing component. The front-end circuit may receive the power from the power supply, identify the nonlinearities in the power, receive the digital signal from the processing component, and adjust the digital signal for the nonlinearities to obtain an input signal to send to a digital to analog converter (DAC).
IMAGE ELEMENT, PROCESSING METHOD, AND ELECTRONIC DEVICE
The present technology relates to an imaging element, a processing method, and an electronic device which are capable of reducing deterioration in an image quality of a captured image caused by power fluctuation. A counting unit includes a counting operation unit that performs a counting operation of counting the count value and a dummy operation unit that performs a dummy counting operation at a timing complementary to the counting operation of the counting operation unit. The present technology can be applied to, for example, an imaging element that counts a count value and performs AD conversion.
Comparator, ad converter, photoelectric conversion device, imaging system, and movable object
A disclosed comparator includes a comparison circuit including a differential unit that compares an input signal with a reference signal and changes a level of a signal output to a first node in accordance with a result of comparison and an amplifier unit that includes a load element and outputs a signal in accordance with a potential of the first node to a second node, and a positive feedback circuit that is connected to the second node and a third node and changes a level of a signal at the third node at a rate higher than a change rate of a level of a signal at the second node in accordance with a change in a level of a signal at the second node.
DIGITAL-TO-ANALOG CONVERTER AND APPARATUS INCLUDING THE SAME
An apparatus configured to transmit and receive a radio frequency (RF) signal is provided. The apparatus includes a digital-to-analog converter (DAC) configured to convert a digital signal into an analog signal, a power amplifier configured to amplify the analog signal, and an antenna configured to output, as the RF signal, the amplified analog signal to the outside. The DAC includes a current cell matrix including a plurality of current cells configured to generate the analog signal, a plurality of normal paths configured to control the plurality of current cells to be turned on or off, based on the digital signal, and a plurality of alternative paths configured to selectively consume power, based on a pattern of the digital signal.
Analog system and associated methods thereof
In one aspect a system is provided. The system a plurality of flash compare modules to output a set of unordered output signals based on an analog input signal; a plurality of device selection modules that receive the unordered output signals and generate ordered signals representing the analog input; and a temperature and voltage compensation module for receiving one or more of temperature and voltage signals from at least a temperature and voltage sensor module that senses one or more of temperature and voltage values that are used to compensate for changes in output signals caused by changes in one or more of die temperature and core voltage.