A circuit comprises a first amplifier coupled to a first and a second node; a differential capacitive load coupled to the first and the second node, the differential capacitive load coupled between drains of transistors in a cross coupled transistor circuit; a current mirror coupled to a source of each transistor; and a capacitor coupled between the sources of the transistors. A plurality of amplifiers can be coupled to the differential capacitive load, wherein each amplifier comprises a clock-less pre-amplifier of a comparator. The amplifiers may be abutted to one another such that an active transistor of a first differential stage in a first amplifier behaves as a dummy transistor for an adjacent differential stage in a second amplifier

A circuit comprises a first amplifier coupled to a first and a second node; a differential capacitive load coupled to the first and the second node, the differential capacitive load coupled between drains of transistors in a cross coupled transistor circuit; a current mirror coupled to a source of each transistor; and a capacitor coupled between the sources of the transistors. A plurality of amplifiers can be coupled to the differential capacitive load, wherein each amplifier comprises a clock-less pre-amplifier of a comparator. The amplifiers may be abutted to one another such that an active transistor of a first differential stage in a first amplifier behaves as a dummy transistor for an adjacent differential stage in a second amplifier.

In one aspect a system is provided. The system a plurality of flash compare modules to output a set of unordered output signals based on an analog input signal; a plurality of device selection modules that receive the unordered output signals and generate ordered signals representing the analog input; and a temperature and voltage compensation module for receiving one or more of temperature and voltage signals from at least a temperature and voltage sensor module that senses one or more of temperature and voltage values that are used to compensate for changes in output signals caused by changes in one or more of die temperature and core voltage.

In accordance with embodiments of the present disclosure, a processing system may include a plurality of processing paths including a first processing path and a second processing path, a digital-to-analog stage output, and a controller. The first processing path may include a first digital-to-analog converter for converting the digital input signal into a first intermediate analog signal, the first digital-to-analog converter configured to operate in a high-power state and a low-power state. The second processing path may include a second digital-to-analog converter for converting a digital input signal into a second intermediate analog signal. The digital-to-analog stage output may be configured to generate an analog signal comprising a sum of the first intermediate analog signal and the second intermediate analog signal. The controller may be configured to operate the first digital-to-analog converter in the lower-power state when a magnitude of the digital input signal is below a threshold magnitude.

An analog-to-digital converter (ADC) and an operation method thereof are provided. The ADC includes: a comparator which compares a signal input through a first input terminal and a signal input through a second input terminal, and outputs an output value according to the comparison result. A successive approximation register receives the output value of the comparator, sets digital signal values from a most significant bit to a least significant bit, and outputs the digital signal values. A digital-to-analog converter receives the digital signal values, and converts it into an analog signal based on a reference voltage Vref, and outputs it to the second input terminal. A noise component is added to the input signal and to the analog signal Vdac.

An analog input voltage is converted to a digital code by, generating a first set of confirmed bits based on a first series of comparisons of an output of a digital-to-analog converter with the analog input voltage and generating a second set of confirmed bits based on a second series of comparisons of the output of the digital-to-analog converter with the analog input voltage. The first set of confirmed bits is independent of the second series of comparisons. The bits of the digital output code corresponding to the analog input voltage are generated based on the first set of confirmed bits, the second set of confirmed bits and a constant value representative of a voltage shift introduced in the digital-to-analog converter between the first series of comparisons and the second series of comparisons.

A circuit comprises a first amplifier coupled to a first and a second node; a differential capacitive load coupled to the first and the second node, the differential capacitive load coupled between drains of transistors in a cross coupled transistor circuit; a current mirror coupled to a source of each transistor; and a capacitor coupled between the sources of the transistors. A plurality of amplifiers can be coupled to the differential capacitive load, wherein each amplifier comprises a clock-less pre-amplifier of a comparator. The amplifiers may be abutted to one another such that an active transistor of a first differential stage in a first amplifier behaves as a dummy transistor for an adjacent differential stage in a second amplifier

A system may have a multiplexer and a controller. For a transition from a first pair of bits in first data provided to digital-to-analog converters (DACs) to a second pair of bits in second data, the controller may determine whether the transition is of a first type or of a second type, and in response to determining that the transition is of the first type, control the multiplexer to output the second pair of bits to the DACs. In response to determining that the transition is of the second type and the second pair of bits are to be swapped, the controller may control the multiplexer to output a swapped pair of bits to the DACs. Data output by the multiplexer based on the second data has a predetermined number of bits that have binary values different from those of corresponding bits in the first data.

The present disclosure relates to compensating for temperature variation of a mixer. Embodiments herein may include performing a single-point Fast Fourier Transform (FFT) (or complex downconversion with DC average) for a number of samples to obtain a transform for each of the number of samples, phase aligning a set of phases associated with each transform, and averaging each transform to generate an analog-to-digital converter (ADC) power value. Further, the disclosed embodiments may include generating a compensation value based on the analog-to-digital converter power value and applying the compensation value to the calibration circuit of the mixer to compensate for a second-order intermodulation product.

A solid-state imaging apparatus includes an imaging section in which a plurality of pixels, each of which has a photoelectric conversion element, are disposed in a matrix; a clock generation section; a reference signal generation section configured to generate a reference signal whose amplitude increases or decreases with the passage of time; a comparison section disposed corresponding to a column in an array of the plurality of pixels; a latch section disposed corresponding to the comparison section and configured to latch logic states of the plurality of phase signals; and a latch control section disposed corresponding to the comparison section, wherein the comparison section includes a differential amplifier, a current output element, and a third transistor, and wherein the comparison section outputs a second comparison signal based on the current output from the current output element after the second timing.