A solid-state imaging device capable of suppressing variations in reference voltages and improving performance of reference voltages is provided. According to one embodiment, the solid-state imaging device includes a pixel outputting a luminance signal voltage corresponding to an amount of incident light, reference voltages, a reference voltage generation circuit outputting a ramp signal and an inverse ramp signal, and an AD converter, and the AD converter includes a comparator including an amplifier coupled to one input terminal, a reference voltage and an input terminal coupled to each of the ramp signals via a capacitor, and an input terminal coupled to each of the reference voltage and the ramp signal via a capacitor, and a ramp current cancel circuit coupled to each of the reference voltages via a cancel capacitor.

Methods and systems 10 are provided for circuits. One method is for increasing device threshold voltage distribution of a plurality of devices of a circuit. The method includes adjusting a device threshold voltage of the plurality of devices by different amounts; and selecting a subset of the plurality of devices with adjusted device threshold voltage by a device selection module for performing a function associated with the circuit. In one aspect, a system for device threshold voltage adjustment is provided. The system includes a sensor module for sensing one or more of temperature and voltage values of a die having a plurality of devices for a circuit; and a threshold temperature and voltage compensation module for receiving an input value from the sensor module to compensate variation in a device threshold voltage caused by changes of one or more of temperature and voltage of the die.

A rollable display device includes a rollable display and a first protection film disposed on a first surface of the rollable display. The first protection film extends beyond a first display edge of the rollable display. The rollable display device further includes a second protection film disposed on a second surface of the rollable display facing the first surface of the rollable display. The second protection film extends beyond the first display edge of the rollable display. The rollable display device additionally includes a first adhesive layer disposed between the rollable display and the first protection film. The rollable display device further includes second adhesive layer disposed between the rollable display and the second protection film, and a first adhesion part disposed adjacent to the first display edge of the rollable display and between the first protection film and the second protection film.

A differential amplifier circuit amplifies a difference between an input analog signal and a ramp signal which changes over time and outputs a difference signal. An amplifying element amplifies the difference signal and outputs the same as an amplified signal. A time measuring unit measures a length of a conversion period until a level of the analog signal substantially coincides with a level of the ramp signal on the basis of a level of the amplified signal and outputs the same as a digital signal obtained by converting the analog signal. One end of a capacitor is connected to one of an input terminal and a predetermined connection terminal of the amplifying element. A switch connects the other end of the capacitor to the other of the input terminal or the predetermined connection terminal in the conversion period, and disconnects the other end outside the conversion period.

A digital-to-analog converter has both a plurality of DAC stages and a plurality of dummy stages. Each DAC stage causes a glitch or disturbance to a pair of reference voltages when the DAC stage changes its switching state. Each dummy stage also causes a similar glitch or disturbance to the pair of reference voltages when the dummy stage changes its switching state. The dummy stages are controlled to change their switching state responsive to how many DAC stages change their switching state such that a total glitch induced onto the reference voltages remains substantially constant across a succession of digital words converted by the digital-to-analog converter into an analog output signal.

A system for regulating an output of a switched mode power supply circuit is configured to provide electric power to a load. The system may include a filter circuit. The filter circuit may be configured to suppress ripple signals at the power output. The system may include a feedback sense circuit including at least one feedback input end and at least one feedback output end. The feedback sense circuit may be configured for generating a feedback signal based on an output ripple signal at a filter input end and a DC regulation signal at a filter output end. The at least one feedback output end may be configured to be electrically coupled to the switched mode power supply circuit. Further, a switching of the switched mode power supply circuit may be based on the feedback signal.

A stage, suitable for use in an analog to digital converter or a digital to analog converter where the stage comprises a plurality of slices that can be operated together to form a composite output, can have reduced thermal noise, whilst each slice on its own has sufficiently small capacitance to respond quickly to changes in digital codes applied to the slice. This allows a fast conversion to be achieved without loss of noise performance.

The present invention relates to semiconductor integrated circuitry, and in particular to such circuitry where one or a plurality of similar or identical operating units are each operable to carry out an operation dependent on a reference signal. One example of such an operating unit is a sub-ADC unit of analogue-to-digital converter (ADC) circuitry, which employs one or more such sub-ADC units to convert samples of an input analogue signal into representation digital values. Where there are a plurality of sub-ADC units, they may each convert samples of an input analogue signal into representative digital values. They may also operate in a time-interleaved manner so that their conversion rate (from sample to digital value) can be lower than the overall sample rate by a factor of the number of sub-ADC units.

A measurement system includes a source unit to provide a source signal to a sample and a voltage source and/or a current source and a memory. The system also includes a measurement unit configured to acquire from the sample an measurement signal that may be responsive to the source signal and a voltage measuring unit, a current measuring unit, and/or a capacitance measuring unit, and a memory. The system also includes a control unit including a digital signal processing unit; a source converter; a measurement converter. The system further includes a synchronization unit configured to synchronize clocks of the digital signal processing unit, the source converter, the measurement converter, the source unit, and the measurement unit; a calibration unit for calibrating aspects of the system including the control unit; and a reference voltage supply configured to supply a common reference voltage for the control unit.

In at least some embodiments, a system comprises a frequency generator configured to generate a second clock signal having a second frequency using a first clock signal having a first frequency. The second frequency is offset from the first frequency and each of a plurality of harmonic frequencies of the second frequency is offset from a harmonic frequency of the first frequency. The system also includes a power converter configured to produce a power signal that at least partially corresponds to the second frequency. The system further comprises an analog-to-digital converter (ADC) configured to sample and convert analog voltages at the first frequency. The ADC is powered by the power signal.