An inertial force sensor includes: an acceleration detection element; a temperature sensor that detects an ambient temperature of the acceleration detection element; a bridge circuit that processes an output signal from the acceleration detection element; an AD converter that converts an analog signal output from the bridge circuit into a digital signal, and outputs the digital signal; a calculation circuit that performs calculation on the output signal from the AD converter; and a storage that stores correction data for correcting a variation in the output signal from the AD converter due to a temperature change. The correction data are coefficients of a formula expressed by a calibration curve that is a quadratic or higher-degree curve, and the storage stores, as the correction data, the coefficients of the calibration curve of each of a plurality of patterns that differ between a predetermined temperature or more and less than the predetermined temperature.

A reconfigurable sensor monitoring system includes software tunable filters, each of which is programmable to condition one type of analog signal. A processor coupled to the software tunable filters receives each type of analog signal so-conditioned.

A device is provided comprising a first oscillator based analog-to-digital converter configured to receive an analog input signal and output a first digital signal and a second oscillator based analog-to-digital converter configured to receive an analog reference signal and output a second digital signal. The device further comprises output logic configured to generate a digital output signal based on the first digital signal and the second digital signal.

Methods and devices are provided for circuits. One device includes an adjustment circuit having an adjustable resistor for modifying a resistance value of a resistive device, the adjustment circuit connected to an adjustment terminal of the resistive device. The resistance value of the adjustable resistor changes, when a voltage or charge on the adjustment terminal of the adjustable resistor is changed. The adjustable resistor is a phase change element with an adjusting terminal to which different voltage values are applied for adjusting a conversion device threshold value.

An analog to digital converter temperature compensation system comprising a comparator configured to compare an analog input signal to a compensated feedback signal and generate a comparator output. A SAR module processes the comparator output to generate a digital signal. A digital to analog converter, biased by a biasing signal having temperature change induced error, is configured to convert the digital signal to a feedback signal and a detector is configured to detect a signal that is proportional to temperature. A look-up table is configured to receive and convert the signal that is proportional to temperature to a compensation signal such that the compensation signal compensates for the temperature change induced error in the biasing signal. A summing node combines the feedback signal with the compensation signal to create a compensated feedback signal.

A unity-gain buffer circuit structure, used to receive an input voltage and output an output voltage, includes a first operational amplifier and a second operational amplifier. The first operational amplifier includes a first positive input, a first output and a first negative input. The second operational amplifier, coupled electrically with the first operational amplifier, includes a second positive input, a second output and a second negative input. The second positive input is used to receive the output voltage. The second output, coupled with first negative input, is used to output a second output voltage. The second negative input, coupled with the second output, is used to receive the second output voltage. After the first negative input receives the second output voltage, an offset voltage between the output voltage outputted from the first operational amplifier and the input voltage received by the first operational amplifier is close to 0.

The disclosure discloses a temperature compensation circuit and method for a neural network computing-in-memory array. Reference arrays sparsely inserted in the computing-in-memory array are adopted to provide a reference voltage for ADCs, so that an input voltage and a reference voltage of the ADCs have a same temperature coefficient. Finally, after analog-to-digital conversion by the ADC, the digital output of the ADC is not affected by the external temperature, thereby ensuring the operational precision of the neural network. According to the temperature compensation circuit of the disclosure, the reference arrays have the same structure as the computing-in-memory array. The insertion density of the reference arrays is related to the temperature field where the computing-in-memory arrays are located. One reference array may provide the reference voltage of the ADC for a plurality of computing-in-memory arrays, thereby minimizing the increase of area and power consumption caused by inserting the reference arrays.

Methods and devices are provided for circuits. One device includes an adjustment circuit having an adjustable resistor for modifying a resistance value of a resistive device, the adjustment circuit connected to an adjustment terminal of the resistive device. The resistance value of the adjustable resistor changes, when a voltage or charge on the adjustment terminal of the adjustable resistor is changed. The adjustable resistor is a phase change element with an adjusting terminal to which different voltage values are applied for adjusting a conversion device threshold value.

A reference voltage generating circuit includes: an operational amplifier including a first input terminal connected to a first node and a second input terminal connected to a second node; a first transistor connected between a ground terminal and the first node, wherein a first current flows in the first transistor; a second transistor connected to the ground terminal; and a first variable resistor connected between the second transistor and the second node, wherein the first variable resistor has a first resistance value for adjusting the first current, based on a change in a current characteristic of the first transistor caused by a variation in a process of forming the first transistor. The reference voltage generating circuit provides a reference voltage, based on a voltage of the first node and a voltage across the first variable resistor.

The present invention provides a reference voltage buffer comprises a reference voltage generator, a first operational amplifier, a first transistor, a first group of resistors, a first load, a second transistor, a second group of resistors and a second load. In the reference voltage buffer, the first load and the second load use active device to increase the settling time, and the first load, the second load and the reference voltage generator of the reference voltage buffer are resigned to have the same characteristics in response to the temperature variation to overcome the PVT issue, and the first load and the second load of the reference voltage buffer use the open-loop design to have large full-scale of the output reference voltages.