This application discloses a temperature feedback control apparatus, method. The method includes two electric switches, a feedback control unit and an optical component. A first electric switch is configured to control that only a first channel of at least two channels that correspond to the first electric switch is conducted at a moment, to feed back an optical signal of a target optical component connected to the first channel to the feedback control unit. The feedback control unit is configured to calculate temperature of the corresponding optical component based on an electrical signal converted from the optical signal, to obtain a control signal. The second electric switch is configured to control, when the first channel is conducted, that only the second channel is conducted, to transmit the control signal to the target optical component to adjust its temperature. The optical component connects to both the first and second channels.

Integrated circuit dies, systems, and techniques are described related to multiple gate digital to analog converters operable at low temperatures. A multiple gate digital to analog converter includes a channel material spanning a length between a source and a drain and multiple gate structures of different sizes coupled to the channel material and spaced apart along the length. The multiple gate structures of the digital to analog converter are independently operable to convert a digital input to an analog output.

Methods and devices are provided for circuits. One device includes an adjustment circuit having an adjustable resistor for modifying a resistance value of a resistive device, the adjustment circuit connected to an adjustment terminal of the resistive device. The resistance value of the adjustable resistor changes, when a voltage or charge on the adjustment terminal of the adjustable resistor is changed. The adjustable resistor is a phase change element with an adjusting terminal to which different voltage values are applied for adjusting a conversion device threshold value.

A unity-gain buffer circuit structure, used to receive an input voltage and output an output voltage, includes a first operational amplifier and a second operational amplifier. The first operational amplifier includes a first positive input, a first output and a first negative input. The second operational amplifier, coupled electrically with the first operational amplifier, includes a second positive input, a second output and a second negative input. The second positive input is used to receive the output voltage. The second output, coupled with first negative input, is used to output a second output voltage. The second negative input, coupled with the second output, is used to receive the second output voltage. After the first negative input receives the second output voltage, an offset voltage between the output voltage outputted from the first operational amplifier and the input voltage received by the first operational amplifier is close to 0.

An analog-to-digital converter is connected to a crossbar array including a plurality of resistive memory cells. Each of the plurality of resistive memory cells includes a resistive element. The analog-to-digital converter includes a voltage generator and processing circuitry. The voltage generator includes at least one resistive memory element including a same resistive material as the resistive element included in the crossbar array, and is configured to generate a first voltage based on a reference voltage and the at least one resistive memory element and to divide the first voltage to generate at least one divided voltage. The processing circuitry is configured to compare a signal voltage generated from the crossbar array with the at least one divided voltage to generate at least one comparison signal and generate at least one digital signal corresponding to the signal voltage based on the at least one comparison signal.

A data acquisition system (DAS) for processing an input signal from a resistive sensor (e.g., Hall effect sensor) includes a sensor signal path that digitizes the input signal. An input impedance of the sensor signal path attenuates the input signal. A gain error corrector applies a gain error correction factor in a digital domain of the DAS to the digitized input signal to compensate for a loading effect to the resistive sensor. The sensor signal path includes an inverting amplifier that provides low distortion for the input signal and an ADC (e.g., delta-sigma, SAR, pipelined, auxiliary) that digitizes the input signal. A sensor characterization path digitizes the sensor resistance which the gain error corrector uses, along with the inverting amplifier input impedance, to calculate the gain error correction factor.

A data acquisition system (DAS) for processing an input signal from a resistive sensor (e.g., Hall effect sensor) includes a sensor signal path that digitizes the input signal. An input impedance of the sensor signal path attenuates the input signal. A gain error corrector applies a gain error correction factor in a digital domain of the DAS to the digitized input signal to compensate for a loading effect to the resistive sensor. The sensor signal path includes an inverting amplifier that provides low distortion for the input signal and an ADC (e.g., delta-sigma, SAR, pipelined, auxiliary) that digitizes the input signal. A sensor characterization path digitizes the sensor resistance which the gain error corrector uses, along with the inverting amplifier input impedance, to calculate the gain error correction factor.

A comparator circuit includes a first transistor configured to receive a first input and a second transistor configured to receive a second input. The comparator circuit further includes a third transistor coupled to a terminal of each of the first and second transistors. The third transistor is configured to be controlled by a first control signal. A gate of a fifth transistor is coupled to a terminal of a fourth transistor at a first node and a gate of the fourth transistor is coupled to a terminal of the fifth transistor at a second node. A sixth transistor is coupled between the first and fourth transistors. A seventh transistor is coupled between the second and fifth transistors. A gate of the sixth transistor and a gate of the seventh transistor are coupled together at a fixed voltage level.

This application discloses a temperature feedback control apparatus, method. The method includes two electric switches, a feedback control unit and an optical component. A first electric switch is configured to control that only a first channel of at least two channels that correspond to the first electric switch is conducted at a moment, to feed back an optical signal of a target optical component connected to the first channel to the feedback control unit. The feedback control unit is configured to calculate temperature of the corresponding optical component based on an electrical signal converted from the optical signal, to obtain a control signal. The second electric switch is configured to control, when the first channel is conducted, that only the second channel is conducted, to transmit the control signal to the target optical component to adjust its temperature. The optical component connects to both the first and second channels.

A device is provided comprising a first oscillator based analog-to-digital converter configured to receive an analog input signal and output a first digital signal and a second oscillator based analog-to-digital converter configured to receive an analog reference signal and output a second digital signal. The device further comprises output logic configured to generate a digital output signal based on the first digital signal and the second digital signal.