A system includes a multiplying digital-to-analog converter (MDAC). The system also includes an input-side component coupled to the MDAC and configured to provide a code to the MDAC. The system also includes a reference voltage source coupled to the MDAC and configured to provide a reference voltage to the MDAC. The MDAC comprises a nonlinear calibration circuit configured to adjust an output of the MDAC nonlinearly based on the code, the reference voltage, and an output of the nonlinear calibration circuit.

A system includes a multiplying digital-to-analog converter (MDAC). The system also includes an input-side component coupled to the MDAC and configured to provide a code to the MDAC. The system also includes a reference voltage source coupled to the MDAC and configured to provide a reference voltage to the MDAC. The MDAC comprises a nonlinear calibration circuit configured to adjust an output of the MDAC nonlinearly based on the code, the reference voltage, and an output of the nonlinear calibration circuit.

In an embodiment a semiconductor device includes a first diode and a second diode of specified sizing or biasing ratio, a negative voltage supply, a first resistor for a proportional to absolute temperature (PTAT) voltage drop, wherein the first diode is connected between the negative supply voltage and the first resistor, an array of dynamically matched current sources employing a dynamic element matching controller, wherein the first resistor is connected between the first diode and a first input of the array, and wherein the second diode is connected between the negative supply voltage and a second input of the array and a successive approximation register (SAR) feedback loop configured to drive a voltage difference to zero, wherein the voltage difference occurs between a first node present between the first resistor and the first input of the array and a second node present between the second diode and the second input of the array.

An analog-to-digital converter (ADC) includes an input circuit configured to receive a first analog signal output from a first sensor or a second analog signal output from a second sensor according to an operation mode and a bit stream; a filter configured to filter an output signal from the input circuit; a quantization circuit configured to generate the bit stream from an output signal of the filter; and a digital circuit configured to generate a first digital signal corresponding to the first analog signal or a second digital signal corresponding to the second analog signal by filtering the bit stream, wherein the operation mode includes a first mode selecting the first sensor and a second mode selecting the second sensor, and wherein the digital circuit refers to the second digital signal generated during the second mode to generate the first digital signal during the first mode.

A voltage reference circuit includes a bandgap circuit and a temperature compensation circuit. The temperature compensation circuit includes a first trim circuit, a second trim circuit, and a resistive digital-to-analog converter. The resistive digital-to-analog converter is coupled to the first trim circuit, the second trim circuit, and the bandgap circuit. The resistive digital-to-analog converter is configured to generate a temperature compensation voltage, and to provide the temperature compensation voltage to the bandgap circuit.

The present invention provides a reference voltage buffer comprises a reference voltage generator, a first operational amplifier, a first transistor, a first group of resistors, a first load, a second transistor, a second group of resistors and a second load. In the reference voltage buffer, the first load and the second load use active device to increase the settling time, and the first load, the second load and the reference voltage generator of the reference voltage buffer are resigned to have the same characteristics in response to the temperature variation to overcome the PVT issue, and the first load and the second load of the reference voltage buffer use the open-loop design to have large full-scale of the output reference voltages.

Methods and devices are provided for circuits. One device includes an adjustment circuit having an adjustable resistor for modifying a resistance value of a resistive device, the adjustment circuit connected to an adjustment terminal of the resistive device. The resistance value of the adjustable resistor changes, when a voltage or charge on the adjustment terminal of the adjustable resistor is changed. The adjustable resistor is a phase change element with an adjusting terminal to which different voltage values are applied for adjusting a conversion device threshold value.

Provided herein may be a temperature sensing circuit and a semiconductor device having the same. The temperature sensing circuit may include an analog voltage generation circuit configured to convert a temperature into a voltage and output a temperature voltage, an analog-digital converter configured to convert the temperature voltage into a digital code, and a compensation circuit configured to adjust the digital code and then output an operation code to remove noise from the temperature voltage.

The present invention relates to telecommunication techniques and integrated circuit (IC) devices. In a specific embodiment, the present invention provides a laser deriver apparatus that includes a main DAC section and a mini DAC section. The main DAC section processes input signal received from a pre-driver array and generates an intermediate output signal. The mini DAC section provides a compensation signal to reduce distortion of the intermediate output signal. The intermediate output signal is coupled to output terminals through a cascode section and/or a T-coil section. There are other embodiments as well.

An analog-to-digital converter is connected to a crossbar array including a plurality of resistive memory cells. Each of the plurality of resistive memory cells includes a resistive element. The analog-to-digital converter includes a voltage generator and processing circuitry. The voltage generator includes at least one resistive memory element including a same resistive material as the resistive element included in the crossbar array, and is configured to generate a first voltage based on a reference voltage and the at least one resistive memory element and to divide the first voltage to generate at least one divided voltage. The processing circuitry is configured to compare a signal voltage generated from the crossbar array with the at least one divided voltage to generate at least one comparison signal and generate at least one digital signal corresponding to the signal voltage based on the at least one comparison signal.