The invention relates to a circuit arrangement comprising a control device, an input circuit for applying an input signal, a conditioning circuit electrically connected to the input circuit for converting the input signal into a measured signal, an analog-to-digital converter electrically connected to the conditioning circuit for converting the measured signal into a digital value, and a reference source that outputs a known reference signal. In this respect, a first switching apparatus is provided that selectively separate the input signal from the conditioning circuit or supplies it to the conditioning circuit and a second switching apparatus is provided that selectively supplies the reference signal to the input circuit or separates it from the input circuit, wherein the control device is configured to determine an offset error and to determine a gain error of the circuit arrangement.

A method of calibrating analog-to-digital converters, ADCs, of a charged particle-optical device comprises: providing, for each of the ADCs, image data of charged particles detected from a sample output by the ADC; calculating, for each of the ADCs, at least one statistical value from a distribution of the image data output by the ADC; and changing at least one setting of at least one of the ADCs based on the calculated at least one statistical values so as to compensate for any mismatch between the at least one statistical value of the ADCs.

A signal processing apparatus includes a plurality of time-interleaving digital-to-analog converters each configured to sample a digital input signal at a preset sub-DAC sample frequency, and to generate an analog sub-DAC output signal. The signal processing apparatus includes analog multiplexer that samples the plurality of sub-DAC output signals at a preset multiplexer clock frequency and generates a multiplexer output signal. The signal processing apparatus further includes a local ADC that receives the multiplexer output signal and generate a digital feedback signal. The signal processing apparatus further includes a digital compensation engine that receives the digital feedback signal from the local ADC and determine one or more distortion compensation parameters. The signal processing apparatus further includes a digital pre-processing stage that receives the one or more distortion compensation parameters from the digital compensation engine and performs distortion compensation pre-processing on the digital input signal.

A signal converting apparatus includes a comparing device, a first digital-slope quantizer, and a second digital-slope quantizer. The comparing device having a first input terminal and a second input terminal for receiving a first received signal and a second received signal, and for generating an output signal at an output port. The first digital-slope quantizer generates a first set of digital signals to monotonically adjust the first received signal and the second received signal at the first input terminal and the second input terminal during a first phase according to a first quantization unit. The second digital-slope quantizer generates a second set of digital signals to monotonically adjust the first received signal and the second received signal at the first input terminal and the second input terminal during a second phase after the first phase according to a second quantization unit.

A calibration unit and method therein for calibrating a TDC comprised in a digital PLL are disclosed. The TDC receives a signal from a free-running DCO and a reference signal, and measures the time difference between the DCO and reference signals. The calibration unit receives and processes data samples output from the TDC and generates a calibration lookup table in which each TDC output value has a calibration value. The calibration lookup table may be used for post-distortion. For each TDC output level the corresponding calibration value from the lookup table may be added to the output of the TDC for correction.

Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC), comprising differential digital delay lines including series coupled delay cells, wherein a delay time of a first delay line is controlled by a first input of the ADC and a delay time of a second delay line is controlled by a second input of the ADC. The ADC includes a pair of bypass multiplexers coupled at a predefined node location in the series coupled delay cells, latches each coupled with the series coupled delay cells, a converter circuit coupled with the plurality of latches configured to convert data from the latches into an output value of the ADC, and logic circuits configured to select data from the series coupled delay cells to the latches depending on a selected resolution of the differential digital delay line analog-to-digital converter.

Calibration of continuous-time (CT) residue generation systems can account and compensate for mismatches in magnitude and phase that may be caused by fabrication processes, temperature, and voltage variations. In particular, calibration may be performed by providing one or more known test signals as an input to a CT residue generation system, analyzing the output of the system corresponding to the known input, and then adjusting one or more parameters of a forward and/or a feedforward path of the system so that the difference in transfer functions of these paths may be reduced/minimized. Calibrating CT residue generation systems using test signals may help decrease the magnitude of the residue signals generated by such systems, and, consequently, advantageously increase an error correction range of such systems or of further stages that may use the residue signals as input.

An analog converter includes an offset/gain value storage unit that is composed of a nonvolatile memory and stores therein offset/gain values, an operation unit that performs analog-digital conversion by using the offset/gain values in the offset/gain value storage unit as values for an interpolation operation, a previous offset/gain value storage unit that is composed of a nonvolatile memory and stores therein, as previous offset/gain values, the offset/gain values in the offset/gain value storage unit used in the past, wherein the operation unit includes an offset/gain value setting unit that controls setting of the offset/gain values in the offset/gain value storage unit and storage of the previous offset/gain values in the previous offset/gain value storage unit.

The present disclosure provides an error compensation correction system and method for an analog-to-digital converter with a time interleaving structure, the system includes an analog-to-digital converter with a time interleaving structure, a master clock module, a packet clock module, an error correction module, an adaptive processing module and an overall MUX circuit. Through the error compensation correction system and method for the analog-to-digital converter with a time interleaving structure according to the present disclosure, lower correction hardware implementation complexity and higher stability are ensured. The system and method according to the present disclosure are particularly suitable for interchannel mismatch error correction of dense channel time interleaving ADC, and the performance of the time interleaving ADC is improved.

An analog-to-digital converter includes: a voltage-current converter receiving an analog input voltage, generating a first digital signal from the analog input voltage, and outputting a residual current remaining after the first digital signal; a current-time converter converting the residual current into a current time in a time domain; and a time-digital converter receiving the residual time, and generating a second digital signal from the residual time, wherein the first digital signal and the second digital signal are sequences of digital codes representing respective signal levels of the analog input voltage.