An N-channel interleaved Analog-to-Digital Converter (ADC) has a variable delay added to each ADC's input sampling clock. The variable delays are each programmed by a Successive-Approximation-Register (SAR) during calibration to minimize timing skews between channels. In each channel the ADC output is filtered, and a product derivative correlator generates a product derivative factor for correlation to two adjacent ADC channels. A matrix processor arranges the product derivative factors from the product derivative correlators into a matrix that is multiplied by a correlation matrix. The correlation matrix is a constant generated from an N×N shift matrix. The matrix processor outputs a sign-bit vector. Each bit in the sign-bit vector determines when tested SAR bits are set or cleared to adjust a channel's variable delay. Sampling clock and component timing skews are reduced to one LSB among all N channels.

A device, which includes an input, configured to read in an analog signal, an analog/digital converter, configured to convert the analog signal into a digital value, and a processor, configured to determine a digital measured value. The processor is further configured to derive a calibrated digital value from the digital value with the aid of a linear calibration function and to derive the digital measured value from the calibrated digital value with the aid of a nonlinear measurement function. The processor modifies the linear calibration function in response to a calibration signal, based on an algorithm, which is based on the nonlinear measurement function, and a number of predefined comparison measured values.

Disclosed is a calibration method of a capacitor array type successive approximation register analog-to-digital converter, comprising: obtaining an actual weight value of capacitors of a target bit and an error code between the actual weight value and an ideal weight value of the capacitors of the target bit; calibrating an output code of the SAR ADC to be calibrated with the error code by corresponding addition or subtraction to obtain a final calibrated output code. The calibration method breaks through the requirement that non-binary weights must meet the redundancy, and can realize a weight calibration in a traditional binary ADC and a digital calibration by simple addition and subtraction on the basis of the original code obtained by an analog-to-digital conversion, thus effectively avoiding the error problem in the traditional technology, increasing the calibration precision and accuracy, reducing the circuit complexity and calculation complexity caused by the non-binary weights calibration.

An analog-to-digital conversion system. A clock generator generates a first clock signal at a first frequency. An analog-to-digital converter (ADC) converts an input analog signal to a digital signal. The ADC operates based on the first clock signal at the first frequency. A calibration digital-to-analog converter (DAC) generates an analog reference signal from digital reference data. A fractional rate clock generator generates a second clock signal from the first clock signal. The second clock signal is at a second frequency that is a fractional rate of the first frequency, and the calibration DAC operates at the second frequency. An equalizer processes an output of the ADC to remove a distortion incurred by the ADC and a calibration circuitry generates coefficients for the equalizer based on the digital reference data and the output of the ADC to the analog reference signal.

A signal processing apparatus includes a plurality of time-interleaving digital-to-analog converters each configured to sample a digital input signal at a preset sub-DAC sample frequency, and to generate an analog sub-DAC output signal. The signal processing apparatus includes analog multiplexer that samples the plurality of sub-DAC output signals at a preset multiplexer clock frequency and generates a multiplexer output signal. The signal processing apparatus further includes a local ADC that receives the multiplexer output signal and generate a digital feedback signal. The signal processing apparatus further includes a digital compensation engine that receives the digital feedback signal from the local ADC and determine one or more distortion compensation parameters. The signal processing apparatus further includes a digital pre-processing stage that receives the one or more distortion compensation parameters from the digital compensation engine and performs distortion compensation pre-processing on the digital input signal.

An analog to digital converter (ADC) device includes ADC circuits, a calibration circuit and a skew adjusting circuit. The ADC circuits convert an input signal according to clock signals, to generate first quantized outputs. The calibration circuit calibrates the first quantized outputs to generate second quantized outputs. The skew adjusting circuit includes an estimating circuit and a feedback circuit. The estimating circuit analyzes the second quantized outputs to generate detection signals, wherein the detection signals are related to time difference information of the clock signals. The skew adjusting circuit outputs the detection signals as adjustment signals, wherein the adjustment signals are configured to reduce a clock skew of the ADC circuits. The feedback circuit analyzes the detection signals generated by the estimating circuit, to generate a feedback signal to the estimating circuit, wherein the estimating circuit is configured to adjust the detection signals according to the feedback signal.

The disclosure relates to a radar transceiver having a transmitter comprising a phase shifter. Example embodiments include a radar transceiver (200) having a normal mode of transmitter operation and a self-test mode of operation, the transceiver (200) comprising: a digital controller (116) configured to provide a digital control signal indicative of a phase shift; a digital to analogue converter (122) configured to receive the digital control signal and provide an analogue signal in accordance with the phase shift; a phase shifter (124) configured to receive the analogue signal and provide a phase shifted output signal for transmission; a dummy load (240) connected to receive the analogue signal from the digital to analogue converter (122) and to provide an analogue output; a resistor network (331) connected across an output of the dummy load (240); a testing module (335) configured to measure the analogue output of the dummy load (240); and a controller module (339) configured to control operation of the dummy load (240); testing module (335) and digital controller (116) during the self-test mode of operation by: enabling the dummy load (240); operating the digital controller (116) to provide a range of digital control signals to the digital to analogue converter (122); and operate the testing module (335) to measure the analogue output of the dummy load (240) to determine a measure of linearity of the digital to analogue converter (122).

Provided is a time-interleaved analog-digital converter including: a plurality of analog-digital converters which is located in each of a plurality of channels and converts an input analog signal into a plurality of partial digital signals; a plurality of sampling bandwidth adjusting units which is located in each of the plurality of channels and adjusts a plurality of sampling bandwidths of the plurality of channels in accordance with a plurality of bandwidth adjusting signals; and a sampling bandwidth control unit which estimates the plurality of sampling bandwidths and generates the plurality of bandwidth adjusting signals by which the plurality of sampling bandwidths matches each other.

The present application discloses a data converter (112). The data converter includes an input terminus (98), a digital-to-analog (D/A) converter (116) and a mapping unit (114). The input terminus is configured to receive an input signal. The D/A converter includes a plurality of D/A converter units configured to generate an output signal. The mapping unit is coupled between the input terminus and the D/A converter and is configured to cause the plurality of D/A conversion units to be equivalently arranged in a relative order in which the plurality of D/A conversion units are gated according to specific electrical characteristics of the plurality of D/A conversion units for digital-to-analog conversion. The present application further provides an A/D converter, a D/A converter and a related chip.

A method for non-linearity correction includes receiving a first output signal from a data signal path containing a first analog-to-digital converter and receiving a second output signal from a second analog-to-digital converter. The method also includes generating first non-linearity coefficients using the first output signal and generating second non-linearity coefficients using the first and second output signals. The method further includes applying, by a non-linearity corrector in the data signal path, the first and second non-linearity coefficients to compensate for non-linearity components in a digitized signal output from the first analog-to-digital converter to generate a corrected digitized signal.