Patent classifications
H03M1/121
CURRENT-BASED TRACK AND HOLD CIRCUIT
An example sample-and-hold circuit includes a first and second input resistors, each having first and second terminals; first and second transistors coupled in series between the second terminals of the first and second input resistors; and third and fourth input resistors, each having first and second terminals; and third and fourth transistors coupled in series between the second terminals of the third and fourth input resistors. The control terminals of the first and third transistors are coupled together, and the control terminals of the second and fourth transistors are coupled together.
ADC SAMPLING DATA IDENTIFICATION METHOD AND SYSTEM, INTEGRATED CIRCUIT AND DECODING DEVICE
An ADC sampling data identification method and system, integrated circuit and decoding device are disclosed. The ADC sampling data identification method includes in the integrated circuit, converting sampling data from n time interleaved ADC chips into serial data, generating a preamble sequence, combining the serial data with the generated preamble sequence to obtain new serial data, sending the new serial data to a decoding device, generating a clock signal that matches the new serial data, and sending the clock signal to the decoding device; and in the decoding device, receiving the new serial data and the clock signal from the ADC integrated circuit, obtaining the preamble sequence for combining according to an agreement with the ADC integrated circuit, and identifying a start position of the sampling data from the time interleaved ADC chips.
ADC SLICER RECONFIGURATION FOR DIFFERENT CHANNEL INSERTION LOSS
A receiver having analog-to-digital converters (ADC) is disclosed. The ADCs may be reconfigured based on the insertion loss mode of the receiver. For example, different portions of a plurality of time-interleaved successive approximation (SAR) ADC slices included in at least one sub-ADC of each time-interleaved ADC may be enabled depending on which of a plurality of insertion loss modes is selected for operation of the receiver.
Integrated measurement systems and methods for synchronous, accurate materials property measurement
A measurement system includes a source unit to provide a source signal to a sample and a voltage source and/or a current source and a memory. The system also includes a measurement unit configured to acquire from the sample an measurement signal that may be responsive to the source signal and a voltage measuring unit, a current measuring unit, and/or a capacitance measuring unit, and a memory. The system also includes a control unit including a digital signal processing unit; a source converter; a measurement converter. The system further includes a synchronization unit configured to synchronize clocks of the digital signal processing unit, the source converter, the measurement converter, the source unit, and the measurement unit; a calibration unit for calibrating aspects of the system including the control unit; and a reference voltage supply configured to supply a common reference voltage for the control unit.
ADC reconfiguration for different data rates
A receiver having analog-to-digital converters (ADC) is disclosed. The ADCs may be reconfigured based on the data rate of the receiver. For example, more portions of each time-interleaved ADC may be enabled to support a higher data rate of the receiver and less portions of the ADCs may be used to support a lower data rate of the receiver.
RECEIVER DEVICE AND RECEPTION METHOD
Provided is a receiver device including a first A/D converter (203), a second A/D converter (204), an amplifier (205) which is provided at a previous stage of the second A/D converter (204), and a digital signal processing unit (207). The digital signal processing unit (207) includes an amplitude comparison unit (211) configured to compare an amplitude of a digital signal output from the first A/D converter (203) and an amplitude of a digital signal output from the second A/D converter (204) to make a determination, and to output a determination result, and a selector (212) configured to select one of the digital signal output from the first A/D converter (203) or the digital signal output from the second A/D converter (204) based on the determination result.
High resolution multiplexing system
A method is provided for measuring time varying particle fluxes with improved temporal resolution and signal to noise ratio. The particles can be photons, neutrons, electrons or electrically charged particles. The method includes a set of electronic and/or optical components and a set of algorithms that implement N-fold temporal multiplexing of the input flux. The system can be used to measure other types of flux by using a transducer to convert the flux into a compatible form. The system can include a transducer such as a scintillator that operates to convert particle flux incident into a photon flux proportional to the amplitude of particle flux. The invention can be used with multiplexing methods known to those skilled in the art, for example Hadamard and Fourier methods.
ELECTRONIC DEVICES CONVERTING INPUT SIGNALS TO DIGITAL VALUE AND OPERATING METHODS OF ELECTRONIC DEVICES
An electronic device which may include an analog-to-digital converter circuit that converts a level of an input signal to digital input values in response to a clock signal, an oscillator that generates the clock signal, a first equalization circuit that generates digital output signals by equalizing the digital input values, a first phase detector circuit that detects phases of the digital output signals and generates digital phase values, a loop filter that generates a first digital output value based on the digital phase values, a second equalization circuit that generates digital intermediate values by equalizing the digital input values, and a second phase detector circuit that detects phases of the digital intermediate values and to generate a second digital output value. The oscillator may adjust a frequency of the clock signal based on the first digital output value and the second digital output value.
ANALOG-TO-DIGITAL CONVERTER CIRCUIT WITH A NESTED LOOK UP TABLE
Disclosed herein is an analog-to-digital converter circuit configured for digitizing an analog input signal. The analog-to-digital converter comprises an analog input configured for receiving the analog input signal. The analog-to-digital converter circuit further comprises at least one sub-ADC connected to the analog input signal, wherein the at least one sub-ADC is configured to output at least one encoded output vector in response to receiving the analog input signal. The analog-to-digital converter circuit further comprises a lookup circuit comprising a nested lookup table. The lookup circuit is configured to select an output value from the nested lookup table using the at least one encoded output vector, wherein the lookup circuit is configured to provide the output value as the digitization of the analog input signal.
Receiver device and reception method
Provided is a receiver device including a first A/D converter (203), a second A/D converter (204), an amplifier (205) which is provided at a previous stage of the second A/D converter (204), and a digital signal processing unit (207). The digital signal processing unit (207) includes an amplitude comparison unit (211) configured to compare an amplitude of a digital signal output from the first A/D converter (203) and an amplitude of a digital signal output from the second A/D converter (204) to make a determination, and to output a determination result, and a selector (212) configured to select one of the digital signal output from the first A/D converter (203) or the digital signal output from the second A/D converter (204) based on the determination result.