A buffer circuit is provided. The buffer circuit includes a Current Differencing Transconductance Amplifier (CDTA) comprising a first input node and a second input node each configured to receive a respective one of a first signal and a second signal. The buffer circuit further includes a first source follower circuit coupled to a first output node of the CDTA and configured to generate a first buffer output signal based on a first output signal of the CDTA. Additionally, the buffer circuit includes a second source follower circuit coupled to a second output node of the CDTA and configured to generate a second buffer output signal based on a second output signal of the CDTA. The buffer circuit further includes a first feedback path comprising at least one of a first resistive element and a first capacitive element. The first feedback path couples an output node of the first source follower circuit to the first input node of the CDTA. In addition, the buffer circuit includes a second feedback path comprising at least one of a second resistive element and a second capacitive element. The second feedback path couples an output node of the second source follower circuit to the second input node of the CDTA.

An analog-to-digital converter (ADC) includes a coarse ADC that receives an analog input voltage, generates a first digital signal based on the analog input voltage using a successive approximation register (SAR) method, and outputs a residual voltage remaining after the first digital signal is generated. The ADC further includes an amplifier that receives the residual voltage and a test voltage, generates a residual current by amplifying the residual voltage by a predetermined gain, and generates a test current by amplifying the test voltage by the gain. The ADC further includes a fine ADC that receives the residual current and generates a second digital signal based on the residual current using the SAR method, and an auxiliary path that receives the test current and generates a gain correction signal based on the test current. The gain of the amplifier is adjusted based on the gain correction signal.

An integrated circuit includes a multiplexer circuit configured to provide an output signal on a conductive line, a programmable gain amplifier having a non-inverting input connected to the conductive line to receive the output signal from the multiplexer, a slew rate adjust circuit connected at a first node on the conductive line between the multiplexer circuit and the programmable gain amplifier, a first switch including a first terminal connected to the first node and a second terminal connected to the input of the programmable gain amplifier, and a low pass filter connected between the first and second terminals of the first switch.

An analog-digital conversion apparatus includes: an analog-digital converter (ADC) included in an integrated circuit (IC) and configured to operate based on a sampling clock constituting a portion of a plurality of clocks; and a driver included in the IC and configured to operate based on another portion of the plurality of clocks, and produce a driving signal based on a digital value output from the ADC. The ADC and the driver are synchronized with each other based on an interrupt request (Irq) of the IC.

A multiplexer includes a charging circuit; a plurality of sampling switches receiving a plurality of input signals; and a plurality of boosting circuits connected between the sampling switches and the charging circuit and sharing the charging circuit. First and second charging switches of the charging circuit are controlled by a first clock signal. Each of the boosting circuits includes a first boosting switch connected to a first node of the charging circuit and a gate of one of the sampling switches, a second boosting switch connected between a second node of the charging circuit and the one sampling switch, and a level shifter configured to control the first boosting switch and the second boosting switch in response to a second clock signal and a selection signal.

A pipeline analog to digital converter includes converter circuitries. The converter circuitries are configured to sequentially convert an input signal to be digital codes. The converter circuitries includes a first converter circuitry and a second converter circuitry. The first converter circuitry is configured to a convert a first signal to be a first digital code in the digital codes, and generate a first residue signal according to the first signal and the first digital code. The second converter circuitry is configured to receive the first signal and the first digital code to quantize the first signal according to the first digital code, in order to generate a second digital code in the digital codes, and generate a second residue signal according to the first residue signal and the second digital code.

Methods and systems for analog-to-digital conversion using two side branches that may be operated with overlapped timing such that a sampling phase may be overlapped with a previous conversion phase. Some embodiments provide a method of successive approximation A/D converting, comprising sampling a first signal onto a first capacitor that is configured to selectively couple to an analog input of a comparator, sampling a second signal onto capacitors that are coupled to a second analog input of the comparator and configured for charge redistribution successive approximation A/D conversion; carrying out, based on the first signal and the second signal, a charge redistribution successive approximation A/D conversion using the capacitors; and while carrying out the charge redistribution successive approximation A/D conversion based on the first and second signals, sampling a third signal onto a third capacitor that is configured to selectively couple to the analog input of a comparator.

A voltage detection circuit measures a plurality of cell voltages of an assembled battery configured by connecting a plurality of cells in series. The voltage detection circuit includes a plurality of input terminals connected to respective electrodes of the plurality of cells through a plurality of voltage detection lines; a multiplexer that periodically selects and outputs voltages of a plurality of cells in a group, a plurality of series cells configured as the group; an analog-to-digital (AD) converter that AD-converts an output voltage from the multiplexer and outputs digital data of the output voltage; and a control circuit that controls a timing for the selection by the multiplexer and a timing for the AD conversion. The control circuit switches over a time interval for which the multiplexer selects each of the cells to change a period of the AD conversion.

An integrated circuit includes an analog-to-digital converter (ADC) having selectable first and second analog channel inputs and a digital output. A window comparator coupled to the digital output. The window comparator configured to compare a digital value on the digital output to first and second threshold values. A programmable clock circuit configured to provide a clock signal to the ADC. A controller that, response to assertion of the trigger signal, is configured to generate a sample rate control signal to the clock circuit to cause the clock circuit to increase the frequency of the clock signal and toggle selection between the first and second analog channel inputs. A result comparison circuit having a comparison input coupled to the digital output. The result comparison circuit is configured to compare a first digital conversion output from the ADC toa second digital conversion output from the ADC.

One example discloses a reconfigurable analog to digital converter (ADC) device, including: an analog front end (AFE) configured to receive a set of analog input signals and generate a corresponding set of digital output signals; wherein the AFE includes a set of reconfigurable ADC conversion circuits; and a sequencer coupled to the AFE and configured to control the set of reconfigurable ADC conversion circuits with a first AFE channel configuration at a first time and a second AFE channel configuration at a second time.