The present disclosure provides an analogue to digital converter (ADC) (100), which includes: a capacitive digital to analogue converter (DAC) (120) configured to sample and hold a received sampling input signal and a latched comparator (140) including a first metal oxide semiconductor field effect transistor (MOSFET) (202); a second MOSFET (204) connected in parallel to the first MOSFET; a third MOSFET (226), wherein a third source terminal of the third MOSFET (226) is coupled with first drain terminal and second drain terminal of the first and second MOSFET (202, 204), wherein a sampling switch (130) is configured to the third source terminal to selectively allow voltage to be supplied to the third MOSFET (226), and wherein the sampling switch is configured to disallow voltage to be supplied to the third MOSFET when the ADC is sampling the input signal.

A pipelined ADC system comprising: a first ADC stage comprising a trainable neural network layer and configured to receive an analog input signal, and convert it into a first n-bit digital output representing said analog input signal; a DAC circuit comprising a trainable neural network layer and configured to receive said first n-bit digital output, and convert it into an analog output signal representing said first n-bit digital output; and a second ADC stage comprising a trainable neural network layer and configured to receive a residue analog input signal of said analog input signal, and convert it into a second n-bit digital output representing said residue analog input signal; wherein said first and second n-bit digital outputs are combined to generate a combined digital output representing said analog input signal.

Apparatus includes an ADC configured to convert an analog signal to a digital signal, a comparator having a first input responsive to the analog signal, a second input responsive to the digital signal, and an output at which a comparison signal is provided, and an output checker configured to process the comparison signal to generate a fault signal indicative of whether a fault has occurred in the ADC. The comparator can be an analog comparator in which case the digital signal is converted to an analog signal for the comparison or a digital comparator in which case an additional ADC is provided to convert the analog signal into a digital signal for the comparison. Embodiments include more than one ADC in which case summation elements are provided to sum the analog signals and the digital signals for the comparison.

A microphone assembly includes a transducer element and a processing circuit. The processing circuit includes an analog-to-digital converter (ADC) configured to receive, sample and quantize a microphone signal generated by the transducer element to generate a corresponding digital microphone signal. The processing circuit includes a feedback path including a digital loop filter configured to receive and filter the digital microphone signal to provide a first digital feedback signal and a digital-to-analog converter (DAC) configured to convert the first digital feedback signal into a corresponding analog feedback signal. The processing circuit additionally includes a summing node at the transducer output configured to combine the microphone signal and the analog feedback signal.

A device of integration of an electric current received on an integration node, includes an operational amplifier, an integration capacitor, and a circuit for modifying an output voltage of the operational amplifier formed by a charge transfer circuit configured to be connected on the integration node and to transfer charges into the integration capacitor. The device also includes a comparison circuit configured to trigger the modification circuit at least once during the integration duration, and a storage circuit configured to store the number of triggerings which have occurred during the integration duration. The received electric current is calculated according to the output voltage as well as to the number of triggerings multiplied by the modification of the output voltage induced by the modification circuit.

A magnetometer includes a measurement value transducer that supplies a signal to a first amplifier device; a summation element that reduces an output signal range of an output signal of the first amplifier device; a second amplifier device that amplifies an output signal of the summation element; a low-pass filter filtering an output signal of the second amplifier device; an analog-digital converter converting output of the filter into digital form; and a correction element that divides the digital signal by a correction factor that corresponds to the defined gain factor of the second amplifier device and adds a digital correction signal to the quotient to form a resulting signal, where a scope of the correction signal corresponds to the defined attenuation of the output signal of the first amplifier device.

Exemplary multipath digital microphone described herein can comprise exemplary embodiments of adaptive ADC range multipath digital microphones, which allow low power to be achieved for amplifiers or gain stages, as well as for exemplary adaptive ADCs in exemplary multipath digital microphone arrangements described herein, while still providing a high DR digital microphone systems. Further non-limiting embodiments can comprise an exemplary glitch removal component configured to minimize audible artifacts associated with the change in the gain of the exemplary adaptive ADCs.

A microphone assembly includes a transducer element and a processing circuit. The processing circuit includes an analog-to-digital converter (ADC) configured to receive, sample and quantize a microphone signal generated by the transducer element to generate a corresponding digital microphone signal. The processing circuit includes a feedback path including a digital loop filter configured to receive and filter the digital microphone signal to provide a first digital feedback signal and a digital-to-analog converter (DAC) configured to convert the first digital feedback signal into a corresponding analog feedback signal. The processing circuit additionally includes a summing node at the transducer output configured to combine the microphone signal and the analog feedback signal.

A readout circuit that includes an amplifier circuitry, an analog-to-digital converter, a feedback circuit and a control logic is introduced. The amplifier circuitry may receive and amplify a differential signal that is obtained according to an input signal and a feedback signal to generate an amplified signal. The analog-to-digital converter is configured to convert the amplified signal to generate a n-bit digital code, wherein n is a positive integer. The feedback circuit is configured to search and generate a m-bit digital code based on a value of the n-bit digital code and convert the m-bit digital code to generate the feedback signal, wherein m is a positive integer. The control logic is coupled to the analog-to-digital converter and the feedback circuit, and configured to control the analog-to-digital converter and the feedback circuit. A multi-bit digital output of the readout circuit is generated according to the n-bit digital code and the m-bit digital code.

Performing a temperature measurement operation includes a first phase and a second phase. The first phase includes providing a voltage indicative of a measured temperature to a first input of a comparator, providing a ramp signal to a second input of the comparator, and generating at an output of the comparator, pulses based on a comparison of the first input to the second input of the comparator. The second phase includes providing the voltage indicative of a measured temperature to the second input of the comparator, providing the ramp signal to the first input of the comparator, and generating at an output of the comparator, pulses based on a comparison of the first input to the second input of the comparator. Performing the temperature measurement operation also includes utilizing the pulses generated during the first and second phases to provide a digital indication of the measured temperature.