A SAR ADC and an electronic device are disclosed. The SAR ADC includes a read clock generation circuit, configured to connect to a first output terminal and a second output terminal of a dynamic comparator, and generate a read clock signal for reading a first or a second comparison result based on the first and the second comparison result received from the dynamic comparator. The invention reads the comparison result using the read clock signal generated by grabbing the output of the comparator, and can improve the overall analog-to-digital conversion speed of the SAR ADC. Further, the present invention can detect the occurrence of metastable state of the comparator by judging that the output of the comparator has no pulse, and read the comparison result based on the backup clock generated by the operating clock of the comparator.

Apparatuses and methods can be related to implementing a Bayesian neural network in a memory. A Bayesian neural network can be implemented utilizing a resistive memory array. The memory array can comprise programmable memory cells that can be programed and used to store weights of the Bayesian neural network and perform operations consistent with the Bayesian neural network.

Apparatuses and methods can be related to implementing a Bayesian neural network in a memory. A Bayesian neural network can be implemented utilizing a resistive memory array. The memory array can comprise programmable memory cells that can be programed and used to store weights of the Bayesian neural network and perform operations consistent with the Bayesian neural network.

The present invention discloses an analog-to-digital conversion circuit having remained time measuring mechanism is provided. A digital-to-analog conversion (DAC) circuit samples input voltages to generate output voltages. A comparator compares the output voltages to generate a comparison result. A control circuit switches a configuration of the DAC circuit by using a digital code according to the comparison result. A comparison determining circuit sets a stage indication signal at a finished state after the comparison result is generated. A comparison stage counting circuit accumulates a termination number according to the stage indication signal to set a conversion indication signal at the finished state when the termination number reaches a predetermined number. A time accumulating circuit starts to accumulate a remained time when the conversion indication signal is at the finished state and finishes accumulation when a sampling indication signal is at a sampling state.

An analog-to-digital conversion system includes: a first conversion device configured to communicate with a first analog-to-digital converter configured to convert a first analog signal into a first digital signal; a second conversion device configured to communicate with a second analog-to-digital converter configured to convert a second analog signal into a second digital signal; a first reference low power supply; and a second reference low power supply. The first conversion device is configured to correct the first digital signal, based on a variation amount of a second reference low voltage or a second reference low current. The second conversion device is configured to correct the second digital signal, based on a variation amount of a first reference low voltage or a first reference low current.

A sensing circuit includes a first input selecting circuit connected to a first sensing line and a second sensing line, a first path setting circuit that sets a path of a first sensing signal received from the first sensing line or a path of a second sensing signal received from the second sensing line, a second path setting circuit that sets a path of a sensing reference voltage, a first switch matrix connected to the first path setting circuit and the second path setting circuit, a first mode setting circuit connected to a first output terminal of the first switch matrix, a first common sensing amplifier connected to the first mode setting circuit, a second mode setting circuit connected to a second output terminal of the first switch matrix, and a second common sensing amplifier connected to the second mode setting circuit.

A sensing circuit includes a first input selecting circuit connected to a first sensing line and a second sensing line, a first path setting circuit that sets a path of a first sensing signal received from the first sensing line or a path of a second sensing signal received from the second sensing line, a second path setting circuit that sets a path of a sensing reference voltage, a first switch matrix connected to the first path setting circuit and the second path setting circuit, a first mode setting circuit connected to a first output terminal of the first switch matrix, a first common sensing amplifier connected to the first mode setting circuit, a second mode setting circuit connected to a second output terminal of the first switch matrix, and a second common sensing amplifier connected to the second mode setting circuit.

A counter includes a sampling unit suitable for sampling a logic state of a least significant bit (LSB) during a counting hold section, the counting hold section is present between first and second ramp sections; and a toggling control unit suitable for, in response to a clock and a sampling signal outputted from the sampling unit, generating the LSB according to a first voltage level of a counting target signal during a second part of the first ramp section and generating the LSB according to a second voltage level of the counting target signal during a first part of the second ramp section.

A counter includes a sampling unit suitable for sampling a logic state of a least significant bit (LSB) during a counting hold section, the counting hold section is present between first and second ramp sections; and a toggling control unit suitable for, in response to a clock and a sampling signal outputted from the sampling unit, generating the LSB according to a first voltage level of a counting target signal during a second part of the first ramp section and generating the LSB according to a second voltage level of the counting target signal during a first part of the second ramp section.

An embodiment includes an analog-to-digital converter device. A device may include a first track and hold amplifier configured to receive an analog input signal. The device may also include a plurality of paths coupled to an output of the first track and hold amplifier. Each path of the plurality of paths includes a second track and hold amplifier coupled to the first track and hold amplifier, and a successive approximation register analog-to-digital converter coupled to an output of the second track and hold amplifier. The successive-approximation analog-to-digital converter may include heterojunction bipolar transistors, a comparator, R-2R DAC, and a SiGe BiCMOS quasi-CML SAR register and sequencer.