A digital-to-analog conversion circuit (60) for converting a digital input sequence to an analog representation is disclosed. It comprises a first DAC, (100) wherein the first DAC (100) is of a capacitive voltage division type having a capacitive load (110). Furthermore, it comprises a second DAC (120) having a resistive load (130). An output (104) of the first DAC (100) and an output (124) of the second DAC (120) are connected, such that said capacitive load (110) and said resistive load (130) are connected in parallel.

A digital-to-analog conversion circuit (60) for converting a digital input sequence to an analog representation is disclosed. It comprises a first DAC, (100) wherein the first DAC (100) is of a capacitive voltage division type having a capacitive load (110). Furthermore, it comprises a second DAC (120) having a resistive load (130). An output (104) of the first DAC (100) and an output (124) of the second DAC (120) are connected, such that said capacitive load (110) and said resistive load (130) are connected in parallel.

Disclosed is a SAR ADC (Ai) having an input for receiving an input voltage, a comparator, a first switch network configured to be controlled by the SAR state machine and connected to the input of the SAR ADC and to reference voltage nodes, and a first capacitor network. The first capacitor network has a first node connected to an input of the comparator, a second node, and a bridge capacitor (Cb) connected between the first node and the second node. Furthermore, the first capacitor network comprises a first set of capacitors having a first and a second terminal, wherein the first terminal of each capacitor in the first set is connected to the first node and the second terminal of each capacitor in the first set is connected to the switch network. Moreover, the first capacitor network comprises a second set of capacitors having a first and a second terminal, wherein the first terminal of each capacitor in the second set is connected to the second node and the second terminal of each capacitor in the first set is connected to the switch network. The SAR ADC further comprises a second capacitor network configured to control a gain of the SAR ADC.

A digital-to-analog converter for generating an analog output voltage in response to a digital value comprising a plurality of bits, the converter including: (i) a first switched resistor network having a first configuration and for converting a first input differential signal into a first analog output in response to a first set of bits in the plurality of bits; and (ii) a second switched resistor network, coupled to the first switched resistor network, having a second configuration, differing from the first configuration, and for converting a second input differential signal into a second analog output in response to a second set of bits in the plurality of bits.

A signal processing circuit includes first and second resistors between an input end terminal and an output end terminal, a filter circuit that has a capacitive element that is connected to connection terminals of the first and second resistors, and an amplification circuit that is connected to the filter circuit. A cutoff frequency of the filter circuit is set by values of the first resistor and the capacitive element and a gain of the amplification circuit is set by values of the first and second resistors and a value of a feedback resistor.

A digital-to-analog converter includes a resistor ladder, a first switch and a protection circuit. The first switch includes a first terminal and a second terminal that are respectively coupled to a rung of the resistor ladder and a reference voltage node. The protection circuit is coupled to the reference voltage node and to a reference voltage input terminal. The protection circuit includes a second switch, a third switch, and a fourth switch. First and second terminals of the second switch are respectively coupled to the reference voltage node and the reference voltage input terminal. First and second terminals of the third switch are respectively coupled to the reference voltage node and a reference voltage feedback terminal. The first and second terminals of the fourth switch are respectively coupled to the reference voltage input terminal and the reference voltage feedback terminal.

An operational amplifier includes a first differential input pair, a first switch and a second switch. The first differential input pair includes a first input transistor and a second input transistor. The first input transistor has a gate terminal coupled to an output terminal of the operational amplifier. The second input transistor has a gate terminal. The first switch is coupled between the gate terminal of the first input transistor and the gate terminal of the second input transistor. The second switch is coupled between a first input terminal of the operational amplifier and the gate terminal of the second input transistor.

Embodiments of an analog-to-digital converter (ADC), resistive digital-to-analog converter (DAC) circuits, and methods of operating an ADC are disclosed. In an embodiment, an analog-to-digital converter includes a DAC unit configured to convert a digital code to a first voltage in response to an input voltage of the ADC, a comparator configured to compare the first voltage with a second voltage to generate a comparison output, and a logic circuit configured to generate the digital code, to control the DAC unit based on the comparison output, and to output the digital code as a digital output of the ADC. The DAC unit includes a capacitive DAC and multiple resistive DACs. Each of the resistive DACs is connected to the first voltage through a respective capacitor.

A multiplying digital to analog converter (MDAC) includes a first resistor configured to be selectively connected to a current output node based on a first bit of a first portion of an input digital code and a second resistor configured to be selectively connected to the current output node based on a second bit of the first portion of the input digital code. A resistance of the second resistor is a resistance of the first resistor scaled by a factor. The MDAC further includes a first capacitor configured to be selectively connected to the current output node based on the first bit of the first portion and a second capacitor configured to be selectively connected to the current output node based on the second bit of the first portion. A capacitance of the second capacitor is a capacitance of the first capacitor scaled by an inverse of the factor.

A multiplying digital to analog converter (MDAC) includes a first resistor configured to be selectively connected to a current output node based on a first bit of a first portion of an input digital code and a second resistor configured to be selectively connected to the current output node based on a second bit of the first portion of the input digital code. A resistance of the second resistor is a resistance of the first resistor scaled by a factor. The MDAC further includes a first capacitor configured to be selectively connected to the current output node based on the first bit of the first portion and a second capacitor configured to be selectively connected to the current output node based on the second bit of the first portion. A capacitance of the second capacitor is a capacitance of the first capacitor scaled by an inverse of the factor.