Facilitating minimization of non-linearity effects of a delay of a capacitance-to-voltage (C2V) converter on an output of a gyroscope is presented herein. A sense output signal of a sense mass of the gyroscope and a drive output signal of a drive mass of the gyroscope are electronically coupled to respective analog-to-digital converter (ADC) inputs of bandpass sigma-delta ADCs of the gyroscope. The bandpass sigma-delta ADCs include respective C2V converters that are electronically coupled, via respective feedback loops, to the respective ADC inputs to facilitate reductions of respective propagation delays of the bandpass sigma-delta ADCs. Respective ADC outputs of the bandpass sigma-delta ADCs are electronically coupled to demodulator inputs of a demodulator of the gyroscope that transforms the sense output into an output of the MEMS gyroscope representing an external stimulus that has been applied to the sense mass.

Reference scaling, op amp balancing and chopper stabilization techniques for delta-sigma modulators of analog-to-digital converters are provided. For reference scaling, unit elements in a feedback digital-to-analog (DAC) converter are driven by a reference voltage or disconnected from active circuitry to realize three DAC levels. While disconnected, the unit elements deliver no charge to the device which results in power saving and a reduction in thermal noise. Op amp balancing involves down-sampling the quantizer output followed by up-sampling on the feedback path and filtering to hold a DAC value of the signal for a duration of a sampling period to generate the feedback signal. Chopper stabilization is performed by chopping an operational transconductance amplifier of the integrator at a chopping frequency equal to the sampling frequency.

A sigma-delta modulation device includes a detection circuit and a sigma-delta modulator. The detection circuit is configured to detect an input signal to generate a detection signal, and compare the detection signal and a threshold to generate a control signal. The sigma-delta modulator is coupled to the detection circuit and configured to store a plurality of noise transfer functions, select one of the noise transfer functions according to the control signal, and convert the input signal into an output signal according to the noise transfer function.

Systems, apparatuses, and methods for performing digital pre-distortion compensation of digital-to-analog converter non-linearity are described. A correction circuit receives a digital input word and couples a portion of the most significant bits (MSB's) of the digital input word to a correction lookup table (LUT). A correction value is retrieved from a correction LUT entry that matches the MSB's of the digital input word. Next, the correction value is added to the original digital input word in the digital domain. Then, the sum generated by adding the correction value to the original digital input word is optionally clipped if the sum exceeds the DAC core's input range. Next, the DAC core converts the sum into an analog value that is representative of the digital input word. The above approach helps to reduce non-linearities introduced by the DAC core in an energy-efficient manner by performing a correction in the digital domain.

Analog circuits are often non-linear, and the non-linearities can hurt performance. Designers would trade off power consumption to achieve better linearity. An efficient and effective calibration technique can address the non-linearities and reduce the overall power consumption. A dither signal injected to the analog circuit can be used to expose the non-linear behavior in the digital domain. To detect the non-linearities, a counting approach is applied to isolate non-linearities independent of the input distribution. The approach is superior to and different from other approaches in many ways.

The amplifier load current cancellation in a current integrator comprises applying an input current to an operational transconductance amplifier provided with an integration capacitor for current integration, leading an output current of the operational transconductance amplifier through a sensing resistor, thus producing a voltage drop over the sensing resistor, generating a cancellation current dependent on the voltage drop over the sensing resistor, and injecting the cancellation current to the output current, before or after the output current passes the sensing resistor, thus eliminating a dependence of the output current on the input current.

A fractional-N phase-locked loop (PLL) has a time-to-voltage converter with second order non linearity. The time-to voltage-converter provides an analog error signal indicating a phase difference between the reference clock signal with a period error and a feedback signal supplied by a fractional-N feedback divider. The spur results in quantization noise associated with the fractional-N feedback divider being frequency translated. To address the frequency translated noise, a spur cancellation circuit receives a residue signal indicative of the quantization noise and a spur signal indicative of the spur. The non-linearity of the time-to-voltage converter is mimicked digitally through terms of a polynomial generated to cancel the noise. The generated polynomial is coupled to a delta sigma modulator that controls a digital to analog converter that adds/subtracts a voltage value to/from the error signal to thereby cancel the quantization noise including the frequency translated quantization noise.

A semiconductor device includes a signal input circuit configured to select one of the plurality of differential sensor signals according to a channel selection signal; an amplifier circuit configured to amplify an output of the signal input circuit; and an analog-to-digital converter (ADC) configured to convert an output of the amplifier circuit into a digital value, wherein each of the plurality of sensor signals is a differential signals and the signal input circuit changes polarity of an output signal thereof according to a first chopping signal, and wherein the ADC includes a delta-sigma modulator configured to generate a bit stream from an output of the amplifier circuit; an output chopping circuit configured to adjust phase of the bit stream according to the first chopping signal; and a filter configured to filter an output of the output chopping circuit and to output the digital value.

A mixed-domain circuit has a differential pair of Digital-to-Time Converters (DTCs), one receiving a reference clock and the other receiving a feedback clock. A Time-to-Digital Converter (TDC) compares outputs from the differential pair of DTCs and generates a digital error value that controls a digital loop filter that controls a Digitally-Controlled Oscillator (DCO) that generates an output clock. A Multi-Modulus Divider (MMD) generates the feedback clock. An accumulated modulation from a delta-sigma modulator is compared to the digital error value by a Least-Mean Square (LMS) correlator to adjust supply voltage or current sources in the pair of DTCs to compensate for errors. A capacitor in each DTC has a charging time adjusted by the accumulated modulation. The DTC can be reduced to a Time-to-Voltage Converter (TVC) and the analog voltages on the capacitors input to an Analog-to-Digital Converter (ADC) to generate the digital error value.

A mixed-domain circuit has a differential pair of Digital-to-Time Converters (DTCs), one receiving a reference clock and the other receiving a feedback clock. A Time-to-Digital Converter (TDC) compares outputs from the differential pair of DTCs and generates a digital error value that controls a digital loop filter that controls a Digitally-Controlled Oscillator (DCO) that generates an output clock. A Multi-Modulus Divider (MMD) generates the feedback clock. An accumulated modulation from a delta-sigma modulator is compared to the digital error value by a Least-Mean Square (LMS) correlator to adjust supply voltage or current sources in the pair of DTCs to compensate for errors. A capacitor in each DTC has a charging time adjusted by the accumulated modulation. The DTC can be reduced to a Time-to-Voltage Converter (TVC) and the analog voltages on the capacitors input to an Analog-to-Digital Converter (ADC) to generate the digital error value.