An amplifier includes an input circuit configured to receive an analog input signal and a feedback signal, and output an analog error signal based on the analog input signal and the feedback signal. An ADC is configured to convert the analog error signal into a digital signal in a phase domain. A digital control circuit is configured to generate a digital control signal based on the digital signal in the phase domain. An output circuit is configured to generate an amplified output signal based on the digital control signal, and a feedback circuit is configured generate the feedback signal based on the amplified output signal.

Disclosed are a system and a battery management integration circuit using an incremental analog-to-digital converter (ADC), which can reduce the consumption of the amount of a bias current. The system includes an incremental ADC configured to perform accumulation on an analog signal during an oversampling period and a bias current generator configured to provide a bias current for the accumulation of the incremental ADC. The bias current generator provides a first amount of the bias current in a first period defined from start timing of oversampling to preset timing during the oversampling period, and provides a second amount of the bias current, smaller than the first amount of the bias current, in a second period subsequent to the first period.

Methods and devices to mitigate time varying impairments in sensors are described. The application of such methods and devices to pressure sensors facing time varying parasitic capacitances due to water droplets is detailed. Benefits of auto-zeroing technique as adopted in disclosed devices is also described.

A system includes: a first temperature sensor configured to measure a first temperature of exhaust at a first location of an exhaust system of a vehicle; a second temperature sensor configured to measure a second temperature of exhaust at a second location of the exhaust system of the vehicle; a first analog to digital (A/D) converter configured to receive a first analog signal from the first temperature sensor, to sample the first analog signal to produce first samples, and to generate first digital values corresponding to the first temperature based on the first samples, respectively; and a second A/D converter a configured to receive a second analog signal from the second temperature sensor, to sample the second analog signal to produce second samples, and to generate second digital values corresponding to the second temperature based on the second samples, respectively.

An embodiment converter circuit comprises an analog-to-digital signal conversion path. An input port receives an analog input signal having an offset, and an output port delivers a digital output signal quantized over M levels. The digital output signal is sensed by a digital-to-analog feedback path which comprises a digital-to-analog converter applying to the input port an analog feedback signal produced as a function of an M-bit digital word under control of a two-state signal having alternating first and second states. M-bit digital word generation circuitry coupled to the digital-to-analog converter and sensitive to the two-state signal produces, alternately, during the first states, a first M-bit digital word which is a function of the digital output signal quantized over M levels, and, during the second states, a second M-bit digital word which is a function a correction value of the offset in the analog input signal.

An analog-to-digital converter configured to convert an analog signal into a digital signal includes a first converter configured to receive an input signal of an analog type, compare the input signal with a plurality of reference signals, select one of the plurality of reference signals based on the comparison, and output an upper bit that is a portion of the digital signal based on the selected reference signal, a second converter configured to perform an oversampling operation n times based on a residue signal indicating a difference between an upper analog signal corresponding to the upper bit value and the input signal and output an intermediate bit value of the digital signal corresponding to the first to n-th oversampling signals generated respectively during the oversampling operations performed n times, and a third converter configured to output a lower bit value of the digital signal corresponding to the n-th oversampling signal.

A circuitry for an incremental delta-sigma modulator includes at least an incremental delta-sigma modulator and a sample-and-hold element, the sample-and-hold element being arranged in front of the incremental delta-sigma modulator and providing an input voltage for the incremental delta-sigma modulator in the charged state, wherein the sample-and-hold element includes a capacitor for charging the input voltage for the incremental delta-sigma modulator, wherein a first switch is arranged in front of the capacitor, and a second switch is arranged behind the capacitor, wherein the first switch is open when the second switch is closed so as to provide, at the incremental delta-sigma modulator, an input voltage decreasing in amount, in particular a decaying input voltage, or wherein the second switch is open when the first switch is closed so as to charge the capacitor of the sample-and-hold element. In addition, a method of operating a circuitry for an incremental delta-sigma modulator is proposed.

Circuitry generates base-to-emitter voltages (Vbe1, Vbe2) of two BJTs biased at different current densities, a base-to-emitter voltage (Vbe) of a BJT biased so Vbe is complementary to absolute temperature and has a curved non-linearity across temperature, and base-to-emitter voltages (Vbe1_c, Vbe2_c) of two BJTs biased by a temperature independent constant current and a current proportional to absolute temperature so Vbe2_c−Vbe1_c has the same but opposite curved non-linearity across temperature as Vbe. A sampling circuit samples these voltages and provides them to inputs of a loop filter. Filter outputs are quantized to produce a bitstream. The sampling circuit: when the received bit of the bitstream is zero, causes integration of Vbe1−Vbe2 to produce a voltage proportional to absolute temperature (αΔVbe); and when the received bit of the bitstream is one, causes integration of Vbe2_c−Vbe_Vbe1_c to produce a negative voltage complementary to absolute temperature −Vbe_c without non-linearity across temperature.

An analog-to-digital converter (ADC) is provided. The ADC receives an analog input signal and generates a digital code. The ADC includes a sigma-delta modulator (SDM), a decimation filter and a detection circuit. The SDM includes a loop filter, a quantizer and a digital-to-analog converter (DAC). The loop filter receives the analog input signal. The quantizer is coupled to the loop filter and quantizes an output of the loop filter to generate a digital output signal. The DAC is coupled to the quantizer and the loop filter. The decimation filter is coupled to the SDM and converts the digital output signal into the digital code. The detection circuit is coupled to the SDM and detects a node voltage of the SDM and generate a control signal. The control signal is utilized to control the loop filter, the quantizer, a feedback path of the SDM and/or a feedforward path of the SDM.

A system includes: a first temperature sensor configured to measure a first temperature of exhaust at a first location of an exhaust system of a vehicle; a second temperature sensor configured to measure a second temperature of exhaust at a second location of the exhaust system of the vehicle; a first analog to digital (A/D) converter configured to receive a first analog signal from the first temperature sensor, to sample the first analog signal to produce first samples, and to generate first digital values corresponding to the first temperature based on the first samples, respectively; and a second A/D converter a configured to receive a second analog signal from the second temperature sensor, to sample the second analog signal to produce second samples, and to generate second digital values corresponding to the second temperature based on the second samples, respectively.