A MEMS micromirror device includes a monolithic body of semiconductor material having a first main surface and a second main surface, with the monolithic body having an opening extending from the second main surface and including a suspended membrane of monocrystalline semiconductor material extending between the opening and the first main surface of the monolithic body. The suspended membrane includes a supporting frame and a mobile mass carried by the supporting frame and rotatable about an axis parallel to the first main surface, with the mobile mass having a width less than a width of the opening. A reflecting region extends over the mobile mass.

A display device and a calibration method for the display device are provided. The calibration method includes obtaining calibration coefficients, from which a compressed approximation is determined. The display device obtains the compressed approximation data including basis vectors and reconstruction coefficients, and determines calibration data to at least partially offset a dependence of an optical throughput of the display device on a beam angle and a beam coordinate at the eyebox.

A method of projecting digital information on a real object in a real environment includes the steps of projecting digital information on a real object or part of a real object with a visible light projector, capturing at least one image of the real object with the projected digital information using a camera, providing a depth sensor registered with the camera, the depth sensor capturing depth data of the real object or part of the real object, and calculating a spatial transformation between the visible light projector and the real object based on the at least one image and the depth data. The invention is also concerned with a corresponding system.

A controller for a tiltable MEMS reflector is configured to oscillate the reflector about X axis or about X and Y axes, and to obtain information about current and past tilt angles. The controller is configured to evaluate tilt angles of the tiltable MEMS reflector at a later moment of time based on the previously obtained information about the tilt angles of the tiltable MEMS reflector at the different earlier moments of time. The controller may be further configured to energize the light source providing a light beam to the tiltable MEMS reflector at the later moment of time with brightness and color corresponding to the brightness and color of a pixel that will be painted by the tiltable MEMS reflector at the later moment of time. A statistical model may be combined with machine learning to accurately predict future tilt angles of the tiltable MEMS reflector.

A buried cavity is formed in a monolithic body to delimit a suspended membrane. A peripheral insulating region defines a supporting frame in the suspended membrane. Trenches extending through the suspended membrane define a rotatable mobile mass carried by the supporting frame. The mobile mass forms an oscillating mass, supporting arms, spring portions, and mobile electrodes that are combfingered to fixed electrodes of the supporting frame. A reflecting region is formed on top of the oscillating mass.

A method for automatically calibrating a system of projectors for displaying images, the method comprising the steps of selectively projecting pixels from a projector onto a projection surface, sensing the pixels as projected across the projection surface deriving a projector/screen mapping based on the selectively projected pixels and the sensed pixels, deriving a pixel correction function based on the projector/screen mapping, storing the pixel correction function by applying a texture map to a mapping mesh inside a graphical pipeline of a graphics processor unit (GPU), applying the pixel correction function to input image pixel data to produce corrected pixel data which corrects at least for misalignment, and driving the projector with the corrected pixel data.

Devices and methods are described herein to measure optical power in scanning laser projectors. In general, the devices and methods utilize a polarizing component and photodiode to measure optical power being generated by at least one laser light source. The polarizing component is configured to polarize at least a portion of the laser beam in a way that improves the accuracy and consistency of this optical power measurement. Specifically, the polarizing component filters at least a portion of the laser beam for one polarization state in a way that facilitates improved reliability in the amount of laser light directed into the photodiode.

The present subject matter relates to data storage in a computing system. In an example, the computing system includes a projector unit including a projector memory. The projector memory may store calibration data pertaining to a plurality of components of the computing system in the projector memory. The plurality of components may include the projector unit and a display unit. Further, the calibration data corresponds to information pertaining to calibrations performed during factory calibration of each of the plurality of components.

This disclosure relates to an image processing apparatus and a method, and a program that enable determination of the position and the shape of a PSF in a projection plane. The small pattern is a pattern that has a total of 35 dots of lateral seven dotslongitudinal five dots all being arranged therein at intervals of each 14 pixels, and a line having a width of one pixel (an outer frame) surrounds the 35 dots. A test pattern having the plurality of small patterns arranged therein and to be projected onto the overall screen is projected from a projector. From an image obtained by imaging this state using a camera, a PSF (Point Spread Function) of the projector is determined. This disclosure is applicable to, for example, a projection imaging apparatus that projects an image using a projector, that images the image projected by the projector, and that calculates the PSF.

A projection display includes an image display device that displays an image, a projection unit that projects the image displayed by the image display device to a projection surface, a light irradiator that irradiates the projection surface with linear light at an incident angle shallower than an incident angle of projection light, in which the linear light extends along a first direction within the projection surface, an imaging unit that has an optical axis different from an optical axis of the light irradiator, and performs capturing of the projection surface, and a signal processor that performs signal processing on an imaging signal outputted from the imaging unit. The imaging unit performs capturing of the linear light with which the projection surface is irradiated, and the signal processor corrects, on a basis of a captured image of the linear light, a distortion of the projected image.