An image sensing device includes a first test block, a second test block, and a readout block. The first test block includes a plurality of first image sensing pixels structured to convert incident light carrying an image into a first pixel signal indicative of the image, and a first heating element structured to transmit heat to the first image sensing pixels. The second test block includes a plurality of second image sensing pixels that each include a light blocking structure to be shielded from receiving incident light to generate a second pixel signal without being directly exposed to the incident light, and a second heating element structured to transmit heat to the second image sensing pixels. The readout block processes the first pixel signal output from the first test block and the second pixel signal output from the second test block.

Techniques are provided to identify, correct, and/or replace anomalous pixels. In one example, a method includes receiving an image frame comprising a plurality of pixels arranged in a plurality of rows and columns. The pixels comprise image data associated with a scene and fixed pattern noise introduced by an imaging device. The method also includes performing a first process on a first set of the pixels to determine associated correction terms configured to reduce the fixed pattern noise, and applying the correction terms to the first set of the pixels in response to the first process. The method also includes performing a second process on a second set of the pixels to determine whether to replace the second set of the pixels to reduce the fixed pattern noise, and replacing at least a subset of the second set of the pixels in response to the second process. Additional methods and systems are also provided.

Provided herein may be an image sensing device and a method of operating the same. The image sensing device may include an image sensor configured to acquire an image including a plurality of pixel values, a memory configured to store reference gain values of each of a plurality of block areas included in the image, and an image processor configured to calculate gain values included in each of the plurality of block areas using the reference gain values and to output a correction image in which the reference gain values and the gain values are applied to the plurality of pixel values, wherein the block areas include a first block area and a second block area having a shorter distance from a center of the image than the first block area and having a size greater than that of the first block area.

To improve the image quality of image data in a solid-state imaging device that reads a signal according to a potential difference between respective floating diffusion regions of a pair of pixels.

A pixel unit is provided with a plurality of rows each including a plurality of pixels. A readout row selection unit selects any of the plurality of rows as a readout row every time a predetermined period elapses, and causes each of the plurality of pixels in the readout row to generate a signal potential according to a received light amount. A reference row selection unit selects a row different from a previous row from among the plurality of rows as a current reference row every time the predetermined period elapses, and causes each of the plurality of pixels in the reference row to generate a predetermined reference potential. A readout circuit unit reads a voltage signal according to a difference between the signal potential and the reference potential.

Techniques to test infrared detectors are disclosed. In one example, a focal plane array for an imaging system includes a plurality of infrared detectors arranged in a plurality of rows and columns where each of the infrared detectors is configured to provide an output signal in response to externally received thermal radiation associated with a scene. A plurality of offset circuits of the imaging system may be electrically coupled to the focal plane array and configured to selectively superimpose fixed-pattern noise on the output signals to provide modified output signals. A readout integrated circuit of the imaging system may be configured to provide the modified output signals for processing to test an integrity of the infrared detectors. Modified output signals that are outside an expected output range based on the thermal radiation and known offset may be determined defective. Related methods, devices, and systems are also provided.

A luminescent diode surface within the cold shield of an infrared camera to allow for continuous non-uniformity correction with uniform irradiance across an infrared IR detector array. Further provided by the inclusion of a luminescent diode surface within the cold shield paneling is the ability to change the diode bias providing a negative luminescent effect while utilizing reverse bias and an electro-luminescent effect while utilizing a forward bias. This may then further allow for multiple set points to provide continuous offset and gain correction and to correct non-linear response effects.

A luminescent diode surface within the cold shield of an infrared camera to allow for continuous non-uniformity correction with uniform irradiance across an infrared IR detector array. Further provided by the inclusion of a luminescent diode surface within the cold shield paneling is the ability to change the diode bias providing a negative luminescent effect while utilizing reverse bias and an electro-luminescent effect while utilizing a forward bias. This may then further allow for multiple set points to provide continuous offset and gain correction and to correct non-linear response effects.

A photoelectric conversion element includes a first pixel array including first light-receiving sections arranged in a direction and a second pixel array including second light-receiving sections arranged in the direction. Each of the first light-receiving sections includes a first pixel configured to receive at least light having a first wavelength inside a visible spectrum and a first pixel circuit configured to transmit a signal from the first pixel to a subsequent stage. Each of the second light-receiving sections includes a second pixel configured to receive at least light having a second wavelength outside the visible spectrum and a second pixel circuit configured to transmit a signal from the second pixel to the subsequent stage. The second pixel circuit is provided in a vicinity of the second pixel.

Techniques for facilitating imager verification systems and methods are provided. In one example, an imaging device includes a focal plane array. The focal plane array includes a detector array including a plurality of detectors, where each of the plurality of detectors is configured to detect electromagnetic radiation to obtain image data. The focal plane array further includes a readout circuit configured to perform a readout to obtain the image data from each of the plurality of detectors. The imaging device further includes a processing circuit configured to perform a verification of the imaging device based at least on the image data. Related methods and systems are also provided.

Techniques for facilitating imager verification systems and methods are provided. In one example, an imaging device includes a focal plane array. The focal plane array includes a detector array including a plurality of detectors, where each of the plurality of detectors is configured to detect electromagnetic radiation to obtain image data. The focal plane array further includes a readout circuit configured to perform a readout to obtain the image data from each of the plurality of detectors. The imaging device further includes a processing circuit configured to perform a verification of the imaging device based at least on the image data. Related methods and systems are also provided.