An image processing device includes a target pixel detector configured to detect a plurality of target pixels in which noise is generated among a plurality of pixels included in an image sensor. The image processing device also includes a target pixel corrector configured to change target pixel values, which are pixel values of the plurality of target pixels, by using average pixel values of neighboring pixels included in a preset range based on a position of each of the plurality of target pixels. The image processing device further includes a target pixel compensator configured to compensate for the target pixel values by using an accumulation value obtained by accumulating values corresponding to a decimal fraction part of the average pixel values.

An image processing device includes a target pixel detector configured to detect a plurality of target pixels in which noise is generated among a plurality of pixels included in an image sensor. The image processing device also includes a target pixel corrector configured to change target pixel values, which are pixel values of the plurality of target pixels, by using average pixel values of neighboring pixels included in a preset range based on a position of each of the plurality of target pixels. The image processing device further includes a target pixel compensator configured to compensate for the target pixel values by using an accumulation value obtained by accumulating values corresponding to a decimal fraction part of the average pixel values.

An image sensor may include an array of image pixels arranged in rows and columns. Each column of pixels may be coupled to current source transistors and capacitance cancellation circuitry. The capacitance cancellation circuitry may include capacitors, a common source amplifier transistor, an autozero switch, a switch for selectively deactivating at least one of the capacitors during sample-and-hold reset and sample-and-hold signal operations.

It makes it easier to reduce the line capacitance of vertical signal lines in a solid-state image sensor in which signals are output via the vertical signal lines. The solid-state image sensor is provided with a logic circuit, a pixel circuit, and a negative capacitance circuit. In the solid-state image sensor, the logic circuit processes an analog signal. Also, in the solid-state image sensor, the pixel circuit generates an analog signal by photoelectric conversion, and outputs the analog signal to the logic circuit via a predetermined signal line. In the solid-state image sensor, the negative capacitance circuit is connected to the predetermined signal line.

A radiation imaging apparatus includes pixels arranged to form pixel rows and pixel columns. The pixels include first pixels and second pixels whose sensitivity to radiation is lower than the first pixels. The apparatus further includes a signal lines arranged to correspond to the pixel columns, a readout circuit configured to read out a signal from the pixels via the signal lines, and a processing unit configured to decide a correction value using signals read out from the second pixels and correct signals read out from the first pixels using the correction value. An internal structure of the readout circuit has a period. The second pixels are arranged such that there are two or more types of remainders of column numbers of pixel columns that include the second pixels divided by the period.

A radiographic imaging system includes a radiographic detector programmed to display the patient identifying information in human readable form and to access information about the patient stored in locations accessible through a network. Embodiments of methods and/or apparatus for a radiographic imaging system can include a radiographic detector including an image receptor to receive incident radiation and generate uncorrected electronic image data; network accessible storage and/or processor to generate calibration-corrected image data from the uncorrected electronic image data provided from the detector. The calibration-corrected image data can be further processed by the network accessible processor before transmitting a corrected image (e.g., DICOM image) back to the radiographic imaging system.

A CMOS optical sensor comprises spare readout channels to replace readout channels found defective at the end of the manufacturing process. These spare readout channels are dispatched over the width of the optical sensor (corresponding to the row direction) in the form of spare groups G.sub.m1, G.sub.m2, Gm.sub.3 of m spare readout channels each, m integer at least equal to 1. Each spare group is inserted between two successive default groups Gn.sub.1 and Gn.sub.2 of n default readout channels each and coupling means SW1 are configured to replace a defective default readout channel in a default group as well as any default readout channels of the group between the defective one and the spare group next to the default group of concern. Advantageously, for a row Row.sub.i being currently selected for CDS reading each pixel in the row, a row noise level V.sub.RN.sub.i is obtained from the A spare readout channels that are not used in the implemented repairing scheme, by sampling an analogic DC reference signal by each of the A spare readout channels and averaging the A values Sp.sub.k obtained. The row reference value V.sub.RN.sub.i is then subtracted from each of the pixel digital signal S.sub.i,j outputs for the current selected row, to finally obtain a signal value d.sub.i,j with row noise suppression.

An operating method of an imaging device comprising a plurality of shared pixels that share a floating diffusion node and each comprising sub-pixels covered by a micro-lens. The method involves generating a capture image from the plurality of shared pixels that receive light reflected from an object; compensating for the capture image using static phase information based on misalignment of the micro lens of each of the plurality of shared pixels; performing auto exposure control based on the compensation of the capture image; performing auto focus control based on the compensated capture image; and generating an output image by processing the compensated capture image.

Some image sensors include pixels with capacitors. The capacitor may be used to store charge in the imaging pixel before readout. The capacitor may be a metal-insulator-metal (MIM) capacitor that is susceptible to dielectric relaxation. Dielectric relaxation may cause lag in the signal on the capacitor that impacts the signal on the capacitor during sampling. The image sensor may include dielectric relaxation correction circuitry that leverages the linear relationship between voltage stress and lag signal to correct for dielectric relaxation. The image sensor may include shielded pixels that operate with a similar timing scheme as the imaging pixels in the active array. Measured lag signals from the shielded pixels may be used to correct imaging data.

Some image sensors include pixels with capacitors. The capacitor may be used to store charge in the imaging pixel before readout. The capacitor may be a metal-insulator-metal (MIM) capacitor that is susceptible to dielectric relaxation. Dielectric relaxation may cause lag in the signal on the capacitor that impacts the signal on the capacitor during sampling. The image sensor may include dielectric relaxation correction circuitry that leverages the linear relationship between voltage stress and lag signal to correct for dielectric relaxation. The image sensor may include shielded pixels that operate with a similar timing scheme as the imaging pixels in the active array. Measured lag signals from the shielded pixels may be used to correct imaging data.