Patent classifications
H04N25/768
CHARGE DEMULTIPLEXING HIGH-SPEED CMOS TIME DELAY AND INTEGRATION IMAGING
Provided are apparatus, methods and techniques to perform a readout of a plurality (N) of Time Delay and Integration (TDI) pixel registers to receive respective signal charges at a plurality (N) of sense nodes (SNs). The readout uses a plurality (N) of charge steering (CST) gates to steer and demultiplex respective charges from respective pixel registers to corresponding SNs. Output is provided from the SNs for producing respective digital values (e.g. through parallel conversion using ADCs). In an embodiment, charges are transferred vertically to the CSTs for demultiplexing horizontally to the SNs. The CSTs may be configured in a multi-stage configuration to assist with good charge transfer. The CSTs may be associated with a barrier implant to assist with proper charge steering.
TIME DELAY INTEGRATION SENSOR WITH PIXELS HAVING DIFFERENT SENSING ABILITY
The present disclosure provides a time delay integration (TDI) sensor using a rolling shutter. The TDI sensor includes multiple pixel columns. Each pixel column includes multiple pixels arranged in an along-track direction, wherein two adjacent pixels or two adjacent pixel groups in every pixel column have a separation space therebetween. The separation space is equal to a pixel height multiplied by a time ratio of a line time difference of the rolling shutter and a frame period, or equal to a summation of at least one pixel height and a multiplication of the pixel height by the time ratio of the line time difference and the frame period. The TDI sensor generates image frames using pixels having different sensing ability for a processor to perform image combination.
TIME DELAY INTEGRATION SENSOR WITH PIXELS HAVING DIFFERENT SENSING ABILITY
The present disclosure provides a time delay integration (TDI) sensor using a rolling shutter. The TDI sensor includes multiple pixel columns. Each pixel column includes multiple pixels arranged in an along-track direction, wherein two adjacent pixels or two adjacent pixel groups in every pixel column have a separation space therebetween. The separation space is equal to a pixel height multiplied by a time ratio of a line time difference of the rolling shutter and a frame period, or equal to a summation of at least one pixel height and a multiplication of the pixel height by the time ratio of the line time difference and the frame period. The TDI sensor generates image frames using pixels having different sensing ability for a processor to perform image combination.
CONTROL METHOD BASED ON IMAGE CAPTURING APPARATUS, CONTROL METHOD AND APPARATUS FOR GIMBAL
A method of controlling a gimbal may comprise obtaining a capturing position of a target object in a captured image, the capturing position being determined by means of an image capturer, the image capturer being a camera having a manual lens or an automatic lens, and the image capturer being communicatively connected to the gimbal; determining, based on the capturing position, control parameters for a following operation on the target object; and controlling the gimbal according to the control parameters to achieve the following operation of the target object.
CONTROL METHOD BASED ON IMAGE CAPTURING APPARATUS, CONTROL METHOD AND APPARATUS FOR GIMBAL
A method of controlling a gimbal may comprise obtaining a capturing position of a target object in a captured image, the capturing position being determined by means of an image capturer, the image capturer being a camera having a manual lens or an automatic lens, and the image capturer being communicatively connected to the gimbal; determining, based on the capturing position, control parameters for a following operation on the target object; and controlling the gimbal according to the control parameters to achieve the following operation of the target object.
ULTRA-FAST SCANNING X-RAY IMAGING DEVICE
Disclosed is a linear array ultra-fast scanning x-ray imaging device. The linear array x-ray imaging device is single photon sensitive, operating in frame output mode and including a pixel array Application Specific Integrated Circuit including the readout pixel array. The ASIC includes digital control logic and sufficient memory to accumulate digital output frames in various modes of operation prior to output from the ASIC, permitting advanced imaging functionalities directly on the ASIC, while maintaining a dynamic range of 16 bits and single photon sensitivity. The effective or secondary frames output from the pixel array ASIC can be tagged with user provided external triggers synchronizing the effective frames to the x-ray beam energy and/or to the movement of the x-ray source or imaged object. This enables dual energy imaging and ultra-fast scanning, without complex and costly conventional photon counting x-ray imaging sensors. The system architecture is simpler and higher performance.
SOLID-STATE IMAGE PICKUP ELEMENT, IMAGE PICKUP APPARATUS, AND METHOD OF CONTROLLING SOLID-STATE IMAGE PICKUP ELEMENT
Image quality is to be improved in a solid-state image pickup element that performs time delay integration.
A correlated double sampling circuit generates a frame in which a predetermined number of lines each including a plurality of digital signals are arranged. A TDI frame memory retains a (K−1)-th frame generated before a K-th frame. A time delay integration circuit performs time delay integration processing of adding the line having a predetermined address in the K-th frame and the line having an address at a certain distance from the predetermined address in the (K−1)-th frame.
Programmable digital TDI EO/IR scanning focal plane array with multiple selectable TDI sub-banks
A TDI scanner including a dynamically programmable focal plane array including a two-dimensional array of detectors arranged in a plurality of columns and a plurality of rows, the array being divided into a plurality of banks separated from one another by gap regions, each bank including a plurality of sub-banks, and each sub-bank including at least one row of detectors, a ROIC coupled to the focal plane array and configured to combine in a TDI process outputs from detectors in each column of detectors in each sub-bank, and a controller configured to program the focal plane array to selectively and dynamically set characteristics of the focal plane array, the characteristics including a size and a location within the two-dimensional array of each of the plurality of sub-banks and the gap regions, the size corresponding to a number of rows of detectors included in the respective sub-bank or gap region.
SOLID-STATE IMAGING DEVICE, AND IMAGING APPARATUS
The speed of AD conversion is to be improved in a solid-state imaging device that performs time delay integration.
A solid-state imaging device includes: a pair of photoelectric conversion elements; a pair of floating diffusion layers; and a transfer unit that switches the transfer destination of each of the pair of photoelectric conversion elements to one of the pair of floating diffusion layers, and transfers electric charges to the transfer destination. In the solid-state imaging device including the pair of photoelectric conversion elements, the pair of floating diffusion layers, and the transfer unit, the transfer unit switches the transfer destination of each of the pair of photoelectric conversion elements to one of the pair of floating diffusion layers, and transfers electric charges to the transfer destination.
TIME DELAY INTEGRATION SENSOR WITH MULTIPLE SENSOR ARRAYS
The present disclosure provides a time delay integration (TDI) sensor using a rolling shutter. The TDI sensor includes two pixel arrays each having multiple pixel columns. Each pixel column includes multiple pixels arranged in an along-track direction, wherein two adjacent pixels or two adjacent pixel groups in every pixel column have a separation space therebetween. The separation space is equal to a pixel height multiplied by a time ratio of a line time difference of the rolling shutter and a frame period, or equal to a summation of at least one pixel height and a multiplication of the pixel height by a time ratio of the line time difference and the frame period. The TDI sensor doubles a number of times of integrating pixel data corresponding to the same position of a scene by arranging two separately operated pixel arrays.