A pixel arrangement comprises a photodiode, a circuit node, a transfer transistor coupled to the photodiode and to the circuit node, an amplifier with an input coupled to the circuit node, a first and a second capacitor, a first transistor coupled to an output of the amplifier and to the first capacitor, a second transistor coupled to the first transistor and to the second capacitor, and a coupling transistor coupled to the circuit node and to the second capacitor.

An image sensor device includes a sensor array and a processing circuit. The sensor array includes a plurality of pixel units each including a photodiode unit and a storage capacitor. The sensor array generates an image of a specific frame, and the photodiode unit is illuminated by a light ray to generate a photodiode current which is stored in the storage capacitor when the image sensor device performs an exposure operation. The processing circuit generates a reference current according to photodiode current(s) of photodiode unit(s) of pixel unit(s) before the exposure operation arranged for the specific frame starts, and predicts a length of an exposure time interval of the exposure operation for the specific frame based on the generated reference current.

An image sensor device includes a sensor array and a processing circuit. The sensor array includes a plurality of pixel units each including a photodiode unit and a storage capacitor. The sensor array generates an image of a specific frame, and the photodiode unit is illuminated by a light ray to generate a photodiode current which is stored in the storage capacitor when the image sensor device performs an exposure operation. The processing circuit generates a reference current according to photodiode current(s) of photodiode unit(s) of pixel unit(s) before the exposure operation arranged for the specific frame starts, and predicts a length of an exposure time interval of the exposure operation for the specific frame based on the generated reference current.

A photoelectric conversion apparatus includes an effective pixel circuit, a reference pixel circuit, a signal output unit, and a comparison unit. The effective pixel circuit includes a photoelectric conversion unit, and is configured to be controlled by using a control line and to output a digital signal based on electric charges generated by the photoelectric conversion unit. The reference pixel circuit includes a holding unit for holding the digital signal. The reference pixel circuit is configured to be controlled by using the control line together with the effective pixel circuit. The signal output unit is configured to output a signal to the holding unit so that a first digital signal with a predetermined value is held by the holding unit. The comparison unit is configured to compare the first signal with the digital signal output from the holding unit controlled to hold the first digital signal.

A light-detecting device includes a photoelectric conversion film configured to generate a hole as a photoelectric charge and a readout circuit. The readout circuit includes a first node configured to hold the photoelectric charge generated by the photoelectric conversion film and a first P-type metal oxide semiconductor (MOS) transistor connected to the first node and a constant voltage source.

A solid-state imaging device includes a light-receiving surface, a plurality of pixels each including a photoelectric conversion section that photoelectrically converts light incident through the light-receiving surface, and a separation section that electrically and optically separates each photoelectric conversion section. Each of the pixels includes a charge-holding section that holds charges transferred from the photoelectric conversion section, a transfer transistor that includes a vertical gate electrode reaching the photoelectric conversion section, and transfers charges from the photoelectric conversion section to the charge-holding section, and a light-blocking section disposed in a layer between the photoelectric conversion section and the charge-holding section. A plurality of the vertical gate electrodes are electrically coupled together in a plurality of first pixels adjacent to each other among the plurality of pixels.

An imaging device includes a varifocal lens and an imaging sensor which outputs a signal corresponding to light. The imaging sensor includes a photoelectric conversion unit which converts light into an electric charge, electric charge reading regions, transfer control electrodes, a gate control circuit which sequentially applies control signals to the transfer control electrodes to correspond to the position of the focal point of the varifocal lens, and a reading circuit which outputs a signal corresponding to the amount of the electric charge transferred to the electric charge reading regions. The gate control circuit repeats an operation of outputting each of the control signals when the position of the focal point is located in the focal ranges during a frame period.

A selection pixel where signal readout is performed and a reference pixel where signal readout is not performed are arranged in a pixel array section, and an amplification transistor of the selection pixel and an amplification transistor of the reference pixel each source electrode of which is connected in common to a common wire are connected with a constant current source via the common wire to form a differential amplification circuit. Then, a bypass control section which selectively establishes connection between the constant current source and a differential output node of the differential amplification circuit and limits a voltage of the differential output node to a predetermined voltage by causing a bypass current to flow between the constant current source and the differential output node, and a current path for bypass current that supplies the bypass current to the constant current source through the pixel array section are included.

A semiconductor device with a small circuit scale is provided. The semiconductor device includes a first circuit and a second circuit. The first circuit includes first to n-th (n is an integer of 2 or more) transistors and the second circuit includes (n+1)-th to 2n-th transistors. The first to n-th transistors are connected in parallel to each other and the (n+1)-th to 2n-th transistors are connected in series to each other. First to n-th signals are supplied to the first circuit and the second circuit. The first circuit has a function of outputting a first potential when each of potentials of the first to n-th signals is lower than or equal to a first reference potential, and outputting a second potential when at least one of the potentials of the first to n-th signals is higher than the first reference potential. The second circuit has a function of outputting a third potential when each of the potentials of the first to n-th signals is higher than a second reference potential, and outputting the first potential when at least one of the potentials of the first to n-th signals is lower than or equal to the second reference potential.

[Object] Provided are a light receiving device and a light receiving circuit that are capable of performing highly accurate ranging with an increased field of view (FOV).

[Solving Means] A light receiving device according to the present disclosure includes a light detector array including a plurality of pixels each configured to output a pulse in response to a reaction of a light detector with a photon, a counter circuit configured to count the pulse outputted from at least one of the pixels of the light detector array, and a control circuit configured to select, from the light detector array, one of the pixels to be enabled and one of the pixels to be disabled, on the basis of the number of counts of the pulse from the counter circuit.