Patent classifications
H05K1/0268
FLEXIBLE ELECTRIC CIRCUIT FOR ULTRASOUND CATHETERS AND RELATED DEVICES AND METHODS
A flexible electronic circuit includes a plurality of leaves having a proximal section, a distal section, and an intermediate section. The plurality of leaves are bonded to each other within the distal section and loose within the intermediate section. The intermediate section also includes conductive connector pads for a wiring harness. A plurality of test connector pads are disposed on the plurality of leaves within the proximal section. The leaves within the proximal section may also be bonded to each other, for example in a ribbon or stepped configuration, in order to facilitate connection to testing apparatus. Once the circuit is tested, the proximal section can be severed from the intermediate section prior to installation of the circuit into a medical device, such as an intracardiac echocardiography catheter.
Motor driving circuit and motor driving device
A motor driving circuit includes a wiring pattern formed in a circuit board, which is configured such that electrical current flowing into a motor flows through the wiring pattern; and a current measurement circuit configured to measure an amount of electrical current flowing through the wiring pattern, based on an amount of voltage drop occurring in response to flowing of the electrical current. The motor driving circuit includes a drive unit configured to adjust a current measurement value measured by the current measurement circuit, based on first adjustment data that compensates for variation in resistance of the wiring pattern caused by an individual difference in the circuit board, and to drive the motor based on an adjusted current value which is the adjusted current measurement value.
Electronic device testing system, electronic device production system including same and method of testing an electronic device
There is described an electronic device testing system for testing an electronic device having a substrate on which is printed a metamaterial structure using an ink. The electronic device testing system generally has: a terahertz radiation emitter configured to emit an incident terahertz radiation beam to be incident on the metamaterial structure of the substrate, the incident terahertz radiation beam having power at least at the terahertz resonance frequency of the metamaterial structure; a terahertz radiation receiver configured to receive an outgoing terahertz radiation beam outgoing from the metamaterial structure and to measure an amplitude of an electric field of the outgoing terahertz radiation beam at least at the terahertz resonance frequency; and a controller configured to determine a conductivity value indicative of a conductivity of the ink based on said amplitude of the electric field of the outgoing terahertz radiation beam.
CHIP-ON-FILM PACKAGE, DISPLAY PANEL, AND DISPLAY DEVICE
A chip-on-film package includes a base substrate on which a first pad region, a second pad region, and a third region located between the first pad region and the second pad region are defined, a dummy pad disposed on the first pad region, input pads disposed on the first pad region, output pads disposed on the second region, a first detection line disposed on the base substrate, and a second detection line disposed on the base substrate. The first detection line is connected to a first input pad and a second input pad via the second pad region to form a first loop between the first input pad and the second input pad, and the second detection line is connected to the dummy pad and the first detection line via the third region to form a second loop between the dummy pad and the first input pad.
Contactors with signal pins, ground pins, and short ground pins
A system comprises: a contactor having a first surface, a second surface, a first hole, a second hole parallel to the first hole, and a third hole parallel to the first hole; a first signal pin held in the first hole of the contactor, extending to at least the second surface of the contactor, and extending to at least the first surface of the contactor; a first short ground pin held in the second hole of the contactor, extending to at least the second surface of the contactor, and extending within the first surface of the contactor; and a ground pin held in the third hole of the contactor, extending to at least the second surface of the contactor, and extending to at least the first surface of the contactor.
Horizontal probing fixture
A horizontal probing fixture includes two bridge modules each having two spaced-apart pedestals, and a bridge plate connecting the pedestals. A first sliding unit for carrying and sliding a probe device includes two first sliding blocks respectively mounted and slidable on the bridge plates of the bridge modules, a first slide plate having two opposite ends respectively connecting the first sliding blocks, and two locking modules respectively disposed on the first sliding blocks. Each first sliding block has a bottom end complementarily engaged to and slidable on the bridge plate of one of the bridge modules. The locking modules are operable to respectively lock or unlock the first sliding blocks relative to the bridge plates.
ELECTRONIC DEVICE
An electronic device includes a first substrate having a first bonding region, a first circuit, a second circuit, a third circuit, and a plurality of first conductive contacts. The first and second circuit are located at a first edge and a second edge of the first bonding region, the third circuit is located between the first and the second circuits. A second substrate having a second bonding region corresponding to the first bonding region in position and a fourth circuit, a fifth circuit, a sixth circuit, and a plurality of second conductive contacts. When the first substrate is bonded with the second substrate, the first circuit, the second circuit, the third circuit, the fourth circuit, the fifth circuit, and the sixth circuit form a loop, and the first and second conductive contacts are electrically connected to a plurality of signal circuits.
Apparatus and method for detecting wiring short in substrate
An apparatus for detecting a wiring short in a substrate includes a voltage source configured to apply a rising or falling measurement voltage to a first wiring of a substrate, a plurality of electrodes including first and second electrode elements capacitively coupled to the first and second wirings of the substrate, respectively, a sensing circuit configured to generate an output voltage based on a voltage or a current between the first and second electrode elements, and a processor configured to determine whether a short circuit connection having a resistance value greater than a reference resistance value is present between the first and second wirings based on a change rate of the output voltage after application of the measurement voltage. Methods for detecting wiring shorts in the substrate are further provided.
Circuit board and display system
To provide a circuit board in which a curvature of a display surface can be controlled, or to provide a highly portable circuit board. A circuit board includes a substrate with flexibility and a curvature control mechanism. The curvature control mechanism includes a first electromagnet and a second electromagnet provided over a first surface of the substrate, an insulating film provided over the first and second electromagnets, and wirings electrically connected to the first and second electromagnets.
Electro-optical device and electronic apparatus
A liquid crystal apparatus includes a first wiring substrate on which a first driving IC is mounted, a second wiring substrate disposed to overlap the first wiring substrate, a first terminal group electrically connected to the first wiring substrate and including a terminal electrically connected to the first driving IC, a second terminal group electrically connected to the second wiring substrate and including another terminal electrically connected to the terminal, and a monitoring pad provided on the second wiring substrate and electrically connected to the other terminal.