A semiconductor device includes a device isolation layer defining first and second active regions, a buried contact connected to the second active region, and first and second bit line structures disposed on the first and second active regions. Each of the first and second bit line structures comprises a bit line contact part and a bit line pass part. The bit line contact part is electrically connected to the first active region. The bit line pass part is disposed on the device isolation layer. A height of a lowest part of the buried contact is smaller than a height of a lowest part of the bit line pass part. The height of the lowest part of the buried contact is greater than a height of a lowest part of the bit line contact part. A lower end of the bit line pass part is buried in the second active region.

A semiconductor memory device includes a substrate including a cell area and a peripheral area, a plurality of capacitors including a plurality of lower electrodes arranged in the cell area, a plurality of capacitor dielectric layers covering the plurality of lower electrodes, and an upper electrode on the plurality of capacitor dielectric layers, an etch stop layer covering the upper electrode, a filling insulation layer covering the etch stop layer and arranged in the cell area and the peripheral area, a plurality of wiring lines on the filling insulation layer, and a first wiring contact plug electrically connecting at least one of the plurality of wiring lines to the upper electrode. The upper electrode includes a first upper electrode layer covering the plurality of capacitor dielectric layers and including a semiconductor material and a second upper electrode layer covering the first upper electrode layer and including a metallic material.

The present disclosure provides a semiconductor structure having an air gap surrounding a lower portion of a bit line, and a manufacturing method of the semiconductor structure. The semiconductor structure includes a substrate; a bit line structure disposed over the substrate; a first dielectric layer, surrounding the bit line structure; a second dielectric layer, surrounding a lower portion of the first dielectric layer, wherein the second dielectric layer is separated from the first dielectric layer by a first air gap; and a third dielectric layer, surrounding an upper portion of the first dielectric layer and sealing the first air gap.

A method of forming a semiconductor memory device includes the following steps. First of all, a substrate is provided, and a plurality of gates is formed in the substrate, along a first direction. Next, a semiconductor layer is formed on the substrate, covering the gates, and a plug is then in the semiconductor layer, between two of the gates. Then, a deposition process is performed to from a stacked structure on the semiconductor layer. Finally, the stacked structure is patterned to form a plurality of bit lines, with one of the bit lines directly in contact with the plug.

An apparatus comprising active areas and shallow trench isolation structures on a base material. A first conductive material is vertically adjacent to an active area of the active areas and between laterally adjacent shallow trench isolation structures. A second conductive material is vertically adjacent to the first conductive material and between the laterally adjacent shallow trench isolation structures. A silicon carbide material is on sidewalls of the shallow trench isolation structures and exhibits substantially vertical sidewalls. An oxide material is adjacent to the active areas and shallow trench isolation structures, a nitride material is adjacent to the oxide material, and a digit line is adjacent to the second conductive material. An electronic system and methods of forming an apparatus are also disclosed.

A method of forming a semiconductor device comprising forming a silicon carbide material on a patterned material. The silicon carbide material is subjected to a plasma to expose horizontal portions of the silicon carbide material to the plasma. The horizontal portions of the silicon carbide material are selectively removed, and the patterned material is removed to form a pattern of the silicon carbide material.

The present disclosure discloses a method of manufacturing a semiconductor structure and a semiconductor structure, and relates to the technical field of semiconductors. The method includes: providing a base, active regions arranged at intervals along a first direction being arranged in the base; forming, on the base, bit line structures arranged at intervals; forming a contact structure between two adjacent ones of the bit line structures; forming a barrier structure on the contact structure, the barrier structures being arranged in correspondence with and connected to the bit line structure, and a first recess being formed between any adjacent barrier structures; and forming a conductive structure in the first recess, the conductive structure including a protective layer and a conductive portion, and the protective layer wrapping a sidewall and a bottom wall of the conductive portion.

A semiconductor device includes a semiconductor substrate, an active region on the semiconductor substrate and including a first semiconductor material, an isolation layer on the semiconductor substrate and a side surface of the active region, a first gate structure in a first gate trench crossing the active region, a second gate structure in a second gate trench in the isolation layer, the second gate structure being parallel to the first gate structure and adjacent to the active region, a semiconductor layer covering at least a part of the side surface of the active region, the semiconductor layer including a second semiconductor material different from the first semiconductor material, and at least a part of the semiconductor layer being between the active region and the second gate structure, and source/drain regions in the active region on opposite sides of the first gate trench.

A semiconductor device includes: an active region defined by a device isolation layer formed in a substrate; a word line configured to cross the active region, the word line extending in a first direction and being formed in the substrate; a bit line extending in a second direction perpendicular to the first direction on the word line; a first contact connecting the bit line to the active region; a first mask for forming the active region, the first mask being formed on the active region; and a second mask of which a height of a top surface thereof is greater than a height of a top surface of the active region, the second mask covering the word line, wherein the active region has a bar shape that extends to form an acute angle with respect to the first direction.

Some embodiments include an integrated assembly having an active region which contains semiconductor material. The active region includes first, second and third source/drain regions within the semiconductor material, includes a first channel region within the semiconductor material and between the first and second source/drain regions, and includes a second channel region within the semiconductor material and between the second and third source/drain regions. The semiconductor material includes at least one element selected from Group 13 of the periodic table. A digit line is electrically coupled with the second source/drain region. A first transistor gate is operatively proximate the first channel region. A second transistor gate is operatively proximate the second channel region. A first storage-element is electrically coupled with the first source/drain region. A second storage-element is electrically coupled with the third source/drain region. Some embodiments include methods of forming integrated assemblies.