Imaging by cryo-electron microscopy (cryo-EM) requires that a sample be encased in an amorphous solid, such as amorphous ice. In current cryo-EM preparation systems, once the sample has been deposited on an EM grid and coated in the amorphous solid, the EM grid must be removed from vacuum and then transferred into the vacuum of the cryo-EM system. As a result, samples deposited on the grid are exposed to damage and contamination. The present invention provides improved EM grid handling systems and devices compatible with advanced cryo-EM sample preparation techniques and which reduce or eliminate exposure of the sample on the grid to atmosphere and elevated temperatures. These methods and devices will also significantly reduce handling time and complexities associated with cryo-EM sample preparation.

A flight tube 246 is hollow, and ions emitted from an ion emission unit are introduced into the flight tube 246. A reflectron 244 is provided in the flight tube 246, and is configured by coaxially arranging a plurality of annular electrodes 244A and 244B. A vacuum vessel 247A that becomes in a vacuum state during analysis is formed in the vacuum chamber 247, and the flight tube 246 is provided in the vacuum vessel 247A. A temperature control mechanism 248 controls a temperature of the flight tube 246. An ambient temperature sensor 250 detects an ambient temperature outside the vacuum chamber 247. A target temperature of the temperature control mechanism 248 is set on the basis of the ambient temperature detected by the ambient temperature sensor 250.

A biological sample is placed on a sample stage (8). The sample stage (8) includes a tray (82), a heater (83), and a temperature sensor (84). On the tray (82), a placement surface (821) on which a biological sample is placed is formed. The heater (83) heats a surface of the tray (82) on an opposite side to the placement surface (821) side. The temperature sensor (84) is provided on an opposite side of the heater (83) to the tray (82) side. The tray (82) is attachable to and detachable from the heater (83).

Systems and methods for automatic sampling, digestion, and joining a plurality of sample introduction systems of a sample for subsequent analysis by ICP-MS are described. A system embodiment may include: a digestion vessel configured to receive a sample from a pressurized sample source; a shutoff valve configured to control a flow of the sample to the digestion vessel; a first syringe pump configured to introduce a reagent to the sample in the digestion vessel; a thermally-controlled block surrounding the digestion vessel and configured to control the temperature of the digestion vessel, wherein the thermally-controlled block increases the temperature of the digestion vessel to a first set temperature before digestion and wherein the thermally-controlled block decreases the temperature of the digestion vessel to a second set temperature after digestion; a level sensor configured to measure a level of the sample within the digestion vessel; a second syringe pump configured to introduce deionized water to the digestion vessel after digestion, based at least in part on the level measured by the level sensor; and a connector valve configured to receive digested sample from the digestion vessel and transfer the digested sample to an analysis system.

A mass spectrometer comprising: a vacuum chamber; and an ion inlet assembly for transmitting analyte ions into the vacuum chamber; wherein the spectrometer is configured to operate in a cooling mode in which it selectively controls one or more gas flow to the ion inlet assembly for actively cooling the ion inlet assembly.

A time-of-flight mass spectrometry device includes: an ion introduction unit; a vacuum chamber connected to the ion introduction unit; a support member provided inside the vacuum chamber; a flight tube having a part of the outer surface supported by the support member and provided inside the vacuum chamber; a temperature sensor provided in the vicinity of a connection portion with the support member of the vacuum chamber; a temperature adjustment element provided in the vicinity of the connection portion; and a temperature control unit that controls the temperature adjustment element based on a measurement result of the temperature sensor.

An electrospray ion source comprises: a needle capillary comprising a spray tip end and an opposite end; a nebulizing gas channel parallel to the needle capillary; an auxiliary gas channel parallel to the needle capillary; a heater parallel to a length of the auxiliary gas channel; a thermally conductive heat transfer member parallel to a length of the needle capillary and disposed between the needle capillary and the heater, said heat transfer member having a first end adjacent to the spray tip end of the needle capillary and a second end opposite to the first end; and a cooled heat sink member in thermal contact with the second end of the heat transfer member.

A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.

A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.

An ion trap includes: an ion trap including a plurality of electrodes; a rectangular voltage generator including a voltage source for generating a direct voltage and a switching section, the rectangular voltage generator configured to operate the switching section to generate a rectangular voltage by switching the direct voltage generated by the voltage source and to apply the rectangular voltage to at least one of the plurality of electrodes; and a switching section temperature controller configured to control a temperature of the switching section so as to maintain the temperature of the switching section at a target temperature which is higher than a highest reaching temperature of the switching section.