An electrospray ion source comprises: a needle capillary comprising a spray tip end and an opposite end; a nebulizing gas channel parallel to the needle capillary; an auxiliary gas channel parallel to the needle capillary; a heater parallel to a length of the auxiliary gas channel; a thermally conductive heat transfer member parallel to a length of the needle capillary and disposed between the needle capillary and the heater, said heat transfer member having a first end adjacent to the spray tip end of the needle capillary and a second end opposite to the first end; and a cooled heat sink member in thermal contact with the second end of the heat transfer member.

In a mass spectrometry apparatus, an electric field is applied to an injected specimen to ionize the specimen, and mass spectrometry of the specimen is performed. In an emitter which ionizes the specimen, a flashing process to increase a temperature of the emitter is repeatedly performed at a short-time interval during an injection period of the specimen. A flashing current controller controls a flashing current value to be applied to the emitter to increase, in a long term, a flashing temperature which the emitter reaches in the flashing process.

An ion trap includes: an ion trap including a plurality of electrodes; a rectangular voltage generator including a voltage source for generating a direct voltage and a switching section, the rectangular voltage generator configured to operate the switching section to generate a rectangular voltage by switching the direct voltage generated by the voltage source and to apply the rectangular voltage to at least one of the plurality of electrodes; and a switching section temperature controller configured to control a temperature of the switching section so as to maintain the temperature of the switching section at a target temperature which is higher than a highest reaching temperature of the switching section.

A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.

Devices, methods, and systems for trapping multiple ions are described herein. One device includes two or more ovens wherein each oven includes a heating element and a cavity for emitting atoms of a particular atomic species from an atomic source substance, a substrate having a number of apertures that allow atoms emitted from the atomic source substance to exit the oven and enter an ion trapping area and wherein each oven is positioned at a different ion loading area within the ion trapping area, and a plurality of electrodes that can be charged and wherein the charge can be used to selectively control the movement of a particular ion from a particular loading area to a particular ion trap location.

An ion analyzer includes a reaction chamber into which precursor ions derived from a sample component are introduced, a radical irradiation unit that generates and emits a predetermined type of radicals, a standard substance supply unit that individually supplies kinds of standard substances to the reaction chamber, where activation energy of radical addition reaction is known for each of the kinds of standard substances, and the activation energies are different in magnitude, an ion measurement unit that measures an amount of predetermined product ions generated from precursor ions derived from the standard substance by irradiation with the radicals, and a radical temperature calculation unit that obtains an amount of radicals that caused the radical addition reaction from the amount of the predetermined product ions and obtains a radical temperature based on a relationship between the amount of the radicals obtained for each kind of standard substance and activation energy.

A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.

Systems and methods for automatic sampling, digestion, and joining a plurality of sample introduction systems of a sample for subsequent analysis by ICP-MS are described. A system embodiment may include: a digestion vessel configured to receive a sample from a pressurized sample source; a shutoff valve configured to control a flow of the sample to the digestion vessel; a first syringe pump configured to introduce a reagent to the sample in the digestion vessel; a thermally-controlled block surrounding the digestion vessel and configured to control the temperature of the digestion vessel, wherein the thermally-controlled block increases the temperature of the digestion vessel to a first set temperature before digestion and wherein the thermally-controlled block decreases the temperature of the digestion vessel to a second set temperature after digestion; a level sensor configured to measure a level of the sample within the digestion vessel; a second syringe pump configured to introduce deionized water to the digestion vessel after digestion, based at least in part on the level measured by the level sensor; and a connector valve configured to receive digested sample from the digestion vessel and transfer the digested sample to an analysis system.

A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.

A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.