H01J49/401

Apparatus for detecting constituents in a sample and method of using the same

An apparatus for detecting constituents in a sample includes first and second drift tubes defining first and second drift regions, and a controllable electric field device within a fragmentation region coupled to the first and second drift tubes. The apparatus also includes a first ion shutter positioned between the first drift and fragmentation regions. The apparatus further includes a control system configured to regulate the first ion shutter, thereby facilitating injection of a selected portion of ions from the first drift region into the fragmentation region. The control system is also configured to regulate the controllable device to modify the selected portion of ions to generate predetermined ion fragments within the fragmentation region, thereby facilitating injection of a selected portion of the predetermined fragmented ions into the second drift region. A method of detecting constituents in a sample is facilitated through such an apparatus.

Orthogonal-flow ion trap array

An ion separation device comprising a plurality of electrodes arranged in a two-dimensional grid, a gas supply configured to provide a gas flow along the first direction, and an ion inlet arranged to receive ions. The plurality of electrodes is configured to create one or more pseudopotential barriers of increasing magnitude along a first direction. A drag force is applied to the ions by the gas flow is opposed by a pseudopotential gradient of the plurality of electrodes.

Multimode ion mirror prism and energy filtering apparatus and system for time-of-flight mass spectrometry

A mass analyzing apparatus and system are disclosed for time-of-flight (TOF) mass spectrometry analysis. A representative system includes a first electrostatic mirror prism to reflect a first ion beam and provide an intermediate ion beam having an intermediate TOF focus and having a spatial dispersion of ions proportional to ion kinetic energies; and a second electrostatic mirror prism to reflect the second ion beam and converge the spatial dispersion of ions to provide a third, recombined ion beam having an output TOF focus; and an ion detector arranged at the output TOF focus to receive and detect the ions of the third ion beam. A bandpass filter may be arranged at the intermediate TOF focus to selectively allow propagation of ions of the second ion beam having a selected range of ion kinetic energies. Configurations having additional electrostatic mirror prisms are disclosed, including for tandem MS-MS and selectable time-of-flight.

Imaging mass spectrometer

A time-of-flight mass spectrometer is disclosed comprising: an ion deflector (305) configured to deflect ions to different positions in a first array of positions at different times; a position sensitive ion detector (187); and ion optics (180) arranged and configured to guide ions from the first array of positions to the position sensitive detector (187) so as to map ions from the first array of positions to a second array of positions on the position sensitive detector (187); wherein the ion optics includes at least one ion mirror for reflecting the ions.

TOF MS detection system with improved dynamic range
11881387 · 2024-01-23 · ·

Apparatus and method are proposed for the strong improvement of dynamic range (DR) of detectors and of data systems for time-of-flight mass spectrometers (TOF MS) with periodically repetitive signals. TOF separated ions are converted into secondary particles, primarily electrons, and the flow of secondary particles is controllably attenuated to sustain the data acquisition system in a counting mode above the electronic noise threshold. The acquisition time is split between at least two time segments, characterized by alternated transmission efficiency SE of secondary particles. Using strong electron suppression (SE1) is employed for recording intense ion peak, while counting ions with either ADC, or TDC, or ADC with extracting peak centroids. A longer time segment employs an efficient electron transfer (SE=1) for detecting weak ion species. In another independent aspect, an ion-optical element is provided upstream of the ion detector and is configured to deflect, reflect or retard ions such that ions that have been scattered or fragmented in the time of flight region do not impact on the ion detector.

MULTIPLEXING METHOD FOR SEPARATORS
20200080967 · 2020-03-12 ·

The present disclosure provides a method comprising providing a sample to be analysed, separating successive populations of ions from said sample in a separator, wherein said populations of ions are introduced into said separator at regular intervals, and the intervals are timed such that at least some ions in a subsequent population of ions overlap ions in a preceding population of ions, varying one or more parameters of said separator such that different populations of ions experience different separation conditions, detecting ions from said populations of ions and obtaining a convolved data set, and deconvolving said convolved data set using the known variance of the parameters and outputting data corresponding to the successive populations of ions.

Orthogonal acceleration time-of-flight mass spectrometry

A multipole ion guide (30) including a plurality of rod electrodes arranged at an angle to the central axis (C) is placed within a collision cell (13) located in the previous stage of an orthogonal accelerator (16). Radio-frequency voltages with opposite phases are applied to the rod electrodes of the ion guide (30) so that any two rod electrodes neighboring each other in the circumferential direction have opposite phases of the voltage. A depth gradient of the pseudopotential is thereby formed from the entrance end toward the exit end within the space surrounded by the rod electrodes, and ions are accelerated by this gradient. During an ion-accumulating process, a direct voltage having the same polarity as the ions is applied to the exit lens electrode (132) to form a potential barrier for accumulating ions. Among the ions repelled by the potential barrier, ions having smaller m/z return closer to the entrance end. Therefore, when the potential barrier is removed and ions are discharged, ions having smaller m/z are discharged at later points in time than those having larger m/z. Therefore, a wide m/z range of ions can be simultaneously accelerated and ejected by an orthogonal accelerator (16).

Time-of-flight mass spectrometer
10566179 · 2020-02-18 · ·

An orthogonal acceleration time-of-flight (TOF) mass spectrometer in which an ion injected into an orthogonal acceleration area is periodically accelerated in a direction orthogonal to a direction of the injection and thereby ejected into a flight space. The mass spectrometer includes: an orthogonal acceleration electrode; a voltage supplier for applying a fixed level of voltage to the orthogonal acceleration electrode with a predetermined period; a TOF determiner for detecting an ion after a completion of a flight of the ion within the flight space, and determining the TOF of the ion; a storage section in which mass determination information defining a relationship between the TOF and mass-to-charge ratio of the ion depending on the period of the applied voltage is stored; and a mass-to-charge-ratio determiner for determining the mass-to-charge ratio of an ion from the TOF of the ion determined by the TOF determiner, based on the mass determination information.

TIME-OF-FLIGHT MASS SPECTROMETER AND PROGRAM
20200051804 · 2020-02-13 · ·

A time-of-flight mass spectrometer includes a flight tube, an ion introduction unit that is connected to the flight tube, an ion detector that detects an ion flown in the flight tube, and a control unit that controls the ion introduction unit and the flight tube, wherein: the control unit sequentially changes an accumulation state of the ion to be introduced into the flight tube by the ion introduction unit, for a plurality of measurement processes performed repeatedly.

Space focus time of flight mass spectrometer

A Time of Flight mass spectrometer is disclosed wherein a fifth order spatial focusing device is provided. The device which may comprise an additional stage in the source region of the Time of Flight mass analyser is arranged to introduce a non-zero fifth order spatial focusing term so that the combined effect of first, third and fifth order spatial focusing terms results in a reduction in the spread of ion arrival times T of ions arriving at the ion detector.