According to an embodiment, a mass spectrometry apparatus includes a beam irradiator, a laser irradiator, a mass spectrometer and a controller. The beam irradiator irradiates a sample with an ion beam. The laser irradiator irradiates a space above the sample with laser light. The mass spectrometer performs mass spectrometry of an ionized particle. The controller controls at least one of the laser irradiator and the mass spectrometer on the basis of an analysis result of the mass spectrometer.

A shielding plate 6 having a forward-side slit opening 61 and return-side slit opening 62 is placed in a free flight space 3 with no electric field. Ions which significantly deviate from a reference path are removed by the shielding plate 6 on both the forward-side and return-side paths. The opening width of the forward-side slit opening 61 is smaller than that of the return-side slit opening 62. Those opening widths and the placement position of the shielding plate 6 are determined based on the result of an ion trajectory calculation by accurate simulation. As compared to a conventional device with a shielding plate placed only on the return side, the present configuration allows for an increase in the opening width of the return-side slit opening while achieving the same level of resolving power. The ion transmission ratio is thereby improved, and the analytical sensitivity is enhanced.

A shielding plate 6 having a forward-side slit opening 61 and return-side slit opening 62 is placed in a free flight space 3 with no electric field. Ions which significantly deviate from a reference path are removed by the shielding plate 6 on both the forward-side and return-side paths. The opening width of the forward-side slit opening 61 is smaller than that of the return-side slit opening 62. Those opening widths and the placement position of the shielding plate 6 are determined based on the result of an ion trajectory calculation by accurate simulation. As compared to a conventional device with a shielding plate placed only on the return side, the present configuration allows for an increase in the opening width of the return-side slit opening while achieving the same level of resolving power. The ion transmission ratio is thereby improved, and the analytical sensitivity is enhanced.

Disclosed herein is an ion analysis instrument comprising a Time of Flight (TOF) mass analyser comprising a reflectron. The instrument is operable in at least a first mode and a second mode, wherein in said first mode ions are caused to turn around at a first point in the reflectron and wherein in said second mode ions are caused to turn around at a second point in the reflectron such that the distance traveled by ions within the Time of Flight mass analyser is greater in the second mode than the distance traveled by ions within the Time of Flight mass analyser in the first mode. In this way, the operating modes can be selectively optimised for the analysis of ions of different masses.

The four-dimensional microscope includes a sample plate, a laser device, an aperture, an extraction plate, a hexapole, a quadrupole, a time-of-flight mass analyzer, a detector, and a device for supplying a voltage to the sample plate, the aperture, the extraction plate and the hexapole and the quadrupole. By utilizing the tunneling effect of photo-induced electrons on surfaces of semiconductor materials under laser irradiation and the electron capture ionization, mass-to-charge ratios and signal intensities of the ions resulting from the capture of interfacially transferred photo-induced electrons and subsequent photo-chemical reactions are measured, and image reconstruction is performed to obtain microscopic images. By using the present invention, not only active photo-catalytic sites of the semiconductor materials are imaged but also various structures of intermediates and products of photo-chemical reactions can be determined.

A Time of Flight analyser comprising a flight tube (160) and a reflectron (170), wherein the reflectron comprises a stack of electrodes (172) that are compressed against the flight tube such that they remain parallel to each other under compression.

A miniature time-of-flight mass spectrometer (TOF-MS) was developed for a NASA/ASTID program beginning 2008. The primary targeted application for this technology is the detection of non-volatile (refractory) and biological materials on landed planetary missions. Both atmospheric and airless bodies are potential candidate destinations for the purpose of characterizing mineralogy, and searching for evidence of existing or extant biological activity.

The invention relates to the operation of an energy-focusing and solid-angle-focusing reflector for time-of-flight mass spectrometers with pulsed ion acceleration into a flight tube, e.g. from an ion source with ionization by matrix-assisted laser desorption (MALDI). The objective of the invention is to generate high mass resolution in wide mass ranges up to high masses above eight kilodaltons by varying at least one operating voltage on one of the diaphragms of the reflector which can be varied according to a suitable time function during the spectrum acquisition. It may also be advantageous to adapt the operation of the accelerating voltages in the starting region of the ions accordingly. These measures make it possible to achieve a mass resolution much higher than R=100,000 in a wide mass range extending up to and above eight kilodaltons.

According to an embodiment, a mass spectrometry apparatus includes a beam irradiator, a laser irradiator, a mass spectrometer and a controller. The beam irradiator irradiates a sample with an ion beam. The laser irradiator irradiates a space above the sample with laser light. The mass spectrometer performs mass spectrometry of an ionized particle. The controller controls at least one of the laser irradiator and the mass spectrometer on the basis of an analysis result of the mass spectrometer.

A voltage supply for a mass analyser is provided. The voltage supply comprises a voltage source, a first voltage output, a second voltage output, and a voltage divider network. The first voltage output is configured to provide a first voltage to a first electrode of the mass analyser, wherein the first electrode of the mass analyser has a first mass shift per volt perturbation. The second voltage output is configured to provide a second voltage to a second electrode of the mass analyser, wherein the second electrode of the mass analyser has a second mass shift per volt perturbation. The second mass shift per volt perturbation opposes the first mass shift per volt perturbation. The voltage divider network comprises a first resistor and a second resistor. The first resistor is configured to define the first voltage, the first resistor having a first temperature coefficient. The second resistor is configured to define the second voltage, the second resistor having a second temperature coefficient. The second temperature coefficient is selected based on the first and second mass shift per volt perturbations and the first temperature coefficient such that a first mass shift associated with the first electrode is compensated by a second mass shift associated with the second electrode.