A mass analyser for use in a mass spectrometer, the mass analyser having: a set of sector electrodes spatially arranged to provide an electrostatic field in a 2D reference plane suitable for guiding ions along an orbit in the 2D reference plane, wherein the set of sector electrodes extend along a drift path that is locally orthogonal to the reference plane so that, in use, the set of sector electrodes provide a 3D electrostatic field region; and an injection interface configured to inject ions into the mass analyser via an injection opening such that the ions injected into the mass analyser are guided by the 3D electrostatic field region along a 3D reference trajectory according to which ions perform multiple turns within the mass analyser whilst drifting along the drift path, wherein each turn corresponds to a completed orbit in the 2D reference plane. The injection interface includes at least one injection deflector located within the mass analyser, the at least one injection deflector being configured to deflect ions injected into the mass analyser in the direction of the drift path, wherein the injection interface is preferably configured so that ions guided along the 3D reference trajectory are, after injection into the mass analyser, kept adequately distant from the injection opening such that they are substantially unaffected by electric field distortions around the injection opening.

Provided is a mass spectrometer which repeats the operation of capturing ions originating from a sample component into an ion trap (22), ejecting the ions from the ion trap, and analyzing the ions with a TOF mass analyzer (23). A capturing voltage generator (51) applies an ion-capturing radio-frequency voltage to the ion trap. An ejecting voltage generator (52) applies an ion-ejecting voltage whose phase is synchronized with the radio-frequency voltage. A controller (4) controls those devices to introduce next ions to be analyzed into the ion trap while performing a mass spectrometric analysis in the TOF mass analyzer. A blank signal acquirer (4, 32) acquires a blank signal within a measurement period or measurement window while the ion trap is being operated. A noise remover (33) subtracts blank-signal data from signal intensity data acquired by a sample measurement. A spectrum creator (34) creates a mass spectrum based on noise-removed data.

For a sample containing a target component, a product-ion scan measurement in which the m/z value of a known ion originating from the compound is designated as a precursor ion is performed in a measurement unit (1) to acquire profile spectrum data. A peak detector (22) in a data processing unit (2A) detects peaks on the profile spectrum. For each detected peak, a product-ion m/z-value acquirer (23) acquires an m/z value corresponding to the maximum intensity as the m/z value of a product ion. A pseudo MRM measurement data extractor (24) adopts the m/z value of the precursor ion and that of the product ion as an MRM transition, extracts the maximum intensity of the peak originating from the product ion as the signal intensity value on that MRM transition, and stores these data as pseudo MRM measurement data in a memory section (25). Thus, quantitative information which reflects the concentration of the target compound can be obtained by a simple product-ion scan measurement without performing an MRM measurement.

Elongation of orthogonal accelerators is assisted by ion spatial transverse confinement within novel confinement means, formed by spatial alternation of electrostatic quadrupolar field (22). Contrary to prior art RF confinement means, the static means provide mass independent confinement and may be readily switched. Spatial confinement defines ion beam (29) position, prevents surfaces charging, assists forming wedge and bend fields, and allows axial fields in the region of pulsed ion extraction, this way improving the ion beam admission at higher energies and the spatial focusing of ion packets in multi- reflecting, multi-turn and singly reflecting TOF MS or electrostatic traps.

A Time of Flight mass analyser is disclosed comprising: at least one ion mirror ((34) for reflecting ions; an ion detector (36) arranged for detecting the reflected ions; a first pulsed ion accelerator (30) for accelerating an ion packet in a first dimension (Y-dimension) towards the ion detector (36) so that the ion packet spatially converges in the first dimension as it travels to the detector (36); and a pulsed orthogonal accelerator (32) for orthogonally accelerating the ion packet in a second, orthogonal dimension (X-dimension) into one of said at least one ion mirrors (34).

A multi-reflecting time of flight mass analyser is disclosed in which the ion flight path is maintained relatively small and the duty cycle is made relatively high. Spatial focussing of the ions in the dimension (z-dimension) in which the mirrors (36) are elongated can be eliminated whilst maintaining a reasonably high sensitivity and resolution.

A method of introducing and ejecting ions from an ion entry/exit device (4) is disclosed. The ion entry/exit device (4) has at least two arrays of electrodes (20,22). The device is operated in a first mode wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays ((20,22) in a first direction such that a potential barrier moves along the at least one array in the first direction and drives ions into and/or out of the device in the first direction. The device is also operated in a second mode, wherein DC potentials are successively applied to successive electrodes of at least one of the electrode arrays (20,22) in a second, different direction such that a potential barrier moves along the array in the second direction and drives ions into and/or out of the device in the second direction. The device provides a single, relatively simple device for manipulating ions in multiple directions. For example, the device may be used to load ions into or eject ions from an ion mobility separator in a first direction, and may then be used to cause ions to move through the ion mobility separator in the second direction so as to cause the ions to separate.

A microchannel plate (MCP) 41 in an ion detection section 4 multiplies electrons. An anode 42 detects those electrons and produces a current signal. An amplifier 44 converts this signal into a voltage signal. A low-pass filter 5A acting as a smoothing section 5 is located at the output end of the amplifier 44. A waveform-shaping time adjuster 6 adjusts the time constant of the low-pass filter 5A beforehand according to the response time of the MCP 41, mass-to-charge ratio of an ion species to be subjected to the measurement, and duration of the spread of the ion species which depends on device-specific parameters. A plurality of peaks which sequentially appear in the detection signal corresponding to one ion species are thereby smoothed into a single broad peak. Thus, the distinguishability between signal waves and noise components is improved.

For a sample containing a target component, a product-ion scan measurement in which the m/z value of a known ion originating from the compound is designated as a precursor ion is performed in a measurement unit (1) to acquire profile spectrum data. A peak detector (22) in a data processing unit (2A) detects peaks on the profile spectrum. For each detected peak, a product-ion m/z-value acquirer (23) acquires an m/z value corresponding to the maximum intensity as the m/z value of a product ion. A pseudo MRM measurement data extractor (24) adopts the m/z value of the precursor ion and that of the product ion as an MRM transition, extracts the maximum intensity of the peak originating from the product ion as the signal intensity value on that MRM transition, and stores these data as pseudo MRM measurement data in a memory section (25). Thus, quantitative information which reflects the concentration of the target compound can be obtained by a simple product-ion scan measurement without performing an MRM measurement.

A mass analyser for use in a mass spectrometer, the mass analyser having: a set of sector electrodes spatially arranged to provide an electrostatic field in a 2D reference plane suitable for guiding ions along an orbit in the 2D reference plane, wherein the set of sector electrodes extend along a drift path that is locally orthogonal to the reference plane so that, in use, the set of sector electrodes provide a 3D electrostatic field region; and an injection interface configured to inject ions into the mass analyser via an injection opening such that the ions injected into the mass analyser are guided by the 3D electrostatic field region along a 3D reference trajectory according to which ions perform multiple turns within the mass analyser whilst drifting along the drift path, wherein each turn corresponds to a completed orbit in the 2D reference plane. The injection interface includes at least one injection deflector located within the mass analyser, the at least one injection deflector being configured to deflect ions injected into the mass analyser in the direction of the drift path, wherein the injection interface is preferably configured so that ions guided along the 3D reference trajectory are, after injection into the mass analyser, kept adequately distant from the injection opening such that they are substantially unaffected by electric field distortions around the injection opening.