An electronic device package includes a circuit layer, a first semiconductor die, a second semiconductor die, a plurality of first conductive structures and a second conductive structure. The first semiconductor die is disposed on the circuit layer. The second semiconductor die is disposed on the first semiconductor die, and has an active surface toward the circuit layer. The first conductive structures are disposed between a first region of the second semiconductor die and the first semiconductor die, and electrically connecting the first semiconductor die to the second semiconductor die. The second conductive structure is disposed between a second region of the second semiconductor die and the circuit layer, and electrically connecting the circuit layer to the second semiconductor die.

A method of bonding semiconductor devices utilizing self-alignment. A pair of device features metallic bumps that protrude through their respective dielectric layers, exposing the end surfaces of the bumps. Solder is applied to these exposed surfaces, and the devices are aligned so that the solder on the first device comes into contact with the solder on the second device. During reflow, surface tension forces of the molten solder self-aligns the devices. After reflow, exposed surfaces of the dielectric layers of the two devices are bonded together.