H01L2924/1531

Semiconductor Package Using A Coreless Signal Distribution Structure
20240186292 · 2024-06-06 ·

A semiconductor package using a coreless signal distribution structure (CSDS) is disclosed and may include a CSDS comprising at least one dielectric layer, at least one conductive layer, a first surface, and a second surface opposite to the first surface. The semiconductor package may also include a first semiconductor die having a first bond pad on a first die surface, where the first semiconductor die is bonded to the first surface of the CSDS via the first bond pad, and a second semiconductor die having a second bond pad on a second die surface, where the second semiconductor die is bonded to the second surface of the CSDS via the second bond pad. The semiconductor package may further include a metal post electrically coupled to the first surface of the CSDS, and a first encapsulant material encapsulating side surfaces and a surface opposite the first die surface of the first semiconductor die, the metal post, and a portion of the first surface of the CSDS.

Fan-out semiconductor package

A fan-out semiconductor package includes a wiring portion, semiconductor chips, a dummy chip, and an encapsulant. The wiring portion includes an insulating layer, conductive patterns formed on the insulating layer, and conductive vias penetrating through the insulating layer and connected to the conductive patterns. The semiconductor chips are disposed on one region of the wiring portion, and the dummy chip is disposed on another region thereof and has a thickness smaller than those of the semiconductor chips. The encapsulant encapsulates at least portions of the semiconductor chips and the dummy chip. An upper surface of the wiring portion is disposed below a center line of the fan-out semiconductor package, and the thickness t of the dummy chip is such that T/2t3T/2 in which T is a distance from the upper surface of the wiring portion to the center line of the fan-out semiconductor package.

Protrusion Bump Pads for Bond-on-Trace Processing
20190122976 · 2019-04-25 ·

A die and a substrate are provided. The die comprises at least one integrated circuit chip, and the substrate comprises first and second subsets of conductive pillars extending at least partially therethrough. Each of the first subset of conductive pillars comprises a protrusion bump pad protruding from a surface of the substrate, and the second subset of conductive pillars each partially form a trace recessed within the surface of the substrate. The die is coupled to the substrate via a plurality of conductive bumps each extending between one of the protrusion bump pads and the die.

Package structure and methods of forming same

A semiconductor device includes a first die having a first active surface and a first backside surface opposite the first active surface, a second die having a second active surface and a second backside surface opposite the second active surface, and an interposer, the first active surface of the first die being electrically coupled to a first side of the interposer, the second active surface of the second die being electrically coupled to a second side of the interposer. The semiconductor device also includes a first connector over the interposer, a first encapsulating material surrounding the second die, the first encapsulating material having a first surface over the interposer, and a via electrically coupling the first connector and the interposer. A first end of the via is substantially coplanar with the first surface of the first encapsulating material.

FAN-OUT SEMICONDUCTOR PACKAGE
20190096825 · 2019-03-28 ·

A fan-out semiconductor package includes a wiring portion, semiconductor chips, a dummy chip, and an encapsulant. The wiring portion includes an insulating layer, conductive patterns formed on the insulating layer, and conductive vias penetrating through the insulating layer and connected to the conductive patterns. The semiconductor chips are disposed on one region of the wiring portion, and the dummy chip is disposed on another region thereof and has a thickness smaller than those of the semiconductor chips. The encapsulant encapsulates at least portions of the semiconductor chips and the dummy chip. An upper surface of the wiring portion is disposed below a center line of the fan-out semiconductor package, and the thickness t of the dummy chip is such that T/2t3T/2 in which T is a distance from the upper surface of the wiring portion to the center line of the fan-out semiconductor package.

Dense Redistribution Layers in Semiconductor Packages and Methods of Forming the Same
20190096790 · 2019-03-28 ·

A method embodiment includes forming a patterned first photo resist over a seed layer. A first opening in the patterned first photo resist exposes the seed layer. The method further includes plating a first conductive material in the first opening on the seed layer, removing the patterned first photo resist, and after removing the patterned first photo resist, forming a patterned second photo resist over the first conductive material. A second opening in the patterned second photo resist exposes a portion of the first conductive material. The method further includes plating a second conductive material in the second opening on the first conductive material, removing the patterned second photo resist, and after removing the patterned second photo resist, depositing a dielectric layer around the first conductive material and the second conductive material.

Radio frequency isolation structure with racetrack

Aspects of the present disclosure relate to a racetrack that forms part of an RF isolation structure of a packaged module and wireless devices that include such a packaged module. The racetrack can be disposed in a substrate and around an RF component that is on the substrate. The racetrack can include at least one break and/or at least one narrowed section without significantly degrading the EMI performance of the RF isolation structure.

MICRO-TRANSFER PRINTABLE ELECTRONIC COMPONENT

A micro-transfer printable electronic component includes one or more electronic components, such as integrated circuits or LEDs. Each electronic component has device electrical contacts for providing electrical power to the electronic component and a post side. A plurality of electrical conductors includes at least one electrical conductor electrically connected to each of the device electrical contacts. One or more electrically conductive connection posts protrude beyond the post side. Each connection post is electrically connected to at least one of the electrical conductors. Additional connection posts can form electrical jumpers that electrically connect electrical conductors on a destination substrate to which the printable electronic component is micro-transfer printed. The printable electronic component can be a full-color pixel in a display.

WIRELESS IC DEVICE
20190074869 · 2019-03-07 ·

A wireless IC device includes a resin member including first and second surfaces, a substrate including first and second principal surfaces, a coil antenna provided in the resin member, and an RFIC element mounted on the substrate and connected to the coil antenna. The substrate is embedded in the resin member so that the second principal surface is at a second surface side. The coil antenna is defined by first linear conductor patterns on the second surface, first metal posts extending between the first and second surfaces, second metal posts extending between the first and second surfaces, and second linear conductor patterns on the first surface. The RFIC element is disposed in the coil antenna.

INTEGRATED FAN-OUT PACKAGE AND METHOD FOR FABRICATING THE SAME

An integrated fan-out package includes an integrated circuit, a plurality of semiconductor devices, a first redistribution circuit structure, and an insulating encapsulation. The integrated circuit has an active surface and a rear surface opposite to the active surface. The semiconductor devices are electrically connected the integrated circuit. The first redistribution circuit structure is disposed between the integrated circuit and the semiconductor devices. The first redistribution circuit structure is electrically connected to the integrated circuit and the semiconductor devices respectively. The first redistribution circuit structure has a first surface, a second surface opposite to the first surface, and lateral sides between the first surface and the second surface. The insulating encapsulation encapsulates the integrated circuit and the semiconductor devices and covers the first surface and the second surface of the first redistribution circuit structure. Furthermore, methods for fabricating the integrated fan-out package are also provided.