According to one embodiment, an electronic circuit is described comprising an output circuit configured to output data elements, an input circuit configured to receive the data elements from the output circuit wherein the input circuit is clocked by a clock signal and receives the data elements in accordance with its clocking, a signaling circuit configured to, when the output circuit switches from the output of one data element to the output of a following data element, signal to interrupt the clocking of the input circuit and a controller configured to interrupt the clocking of the input circuit in response to the signaling.

An embodiment of a circuit includes a data latch and a plurality of cascaded latches, wherein a first of the plurality of cascaded latches is configured to receive a first signal from the data latch and each subsequent cascaded latch is configured to receive a data output signal of a preceding cascaded latch, and an error-detection circuit configured to receive the respective data output signals and detect error in operation of the cascaded latches based thereon.

Various implementations described herein are related to a device having level shifter circuitry configured to receive isolation control signals in a first voltage domain and provide an output signal in a second voltage domain that is different than the first voltage domain. The device may include isolation logic circuitry configured to receive a data input signal in the first voltage domain and then provide the isolation control signals to the level shifter circuitry in the first voltage domain based on the data input signal. The isolation logic circuitry may include control passgates that enable the data input signal to propagate to the level shifter circuitry via the isolation control signals.

A latch-based power-on checker (POC) circuit for mitigating potential problems arising from an improper power-up sequence between different power domains (e.g., core and input/output (I/O)) on a system-on-chip (SoC) integrated circuit (IC). In one example, the core power domain having a first voltage (CX) should power up before the I/O power domain having a second voltage (PX), where PX>CX. If PX ramps up before CX, the POC circuit produces a signal indicating an improper power-up sequence, which causes the I/O pads to be placed in a known state. After CX subsequently ramps up, the POC circuit returns to a passive (LOW) state. If CX should subsequently collapse while PX is still up, the POC circuit remains LOW until PX also collapses.

A 3D structure, the structure including: a first stratum overlaid by a second stratum, the second stratum is less than two microns thick, where the first stratum includes an array of memory cells including at least four rows of memory cells, each of the rows is controlled by a bit-line, where the array of memory cells includes a plurality of columns of memory cells, each of the columns is controlled by a word-line, and where the second stratum includes memory control circuits directly connected to the bit-lines and the word-lines.

The method for automated manufacturing of an electronic circuit tolerant to faults by temporal redundancy of maximum order N, comprising a step implemented by computer, according to which every memory cell of the circuit is replaced by a memory block (40) comprising a chain of memory cells in series, and a selection block which, in a temporal redundancy mode of order n1, n1∈[1,N], selects as output data of the memory block the majority content of n1 cells of the block, and can furthermore deliver a fault signal if the contents of the n1 cells differ. Said method is characterized in that the inserted memory blocks allow a dynamic switching from a temporal redundancy mode of order n1 to any other mode of order n2. Said method for N=2, in association with a mechanism for recording with roll-back, allows an error with only a double redundancy instead of a triple redundancy.

An integrated circuit (IC) includes a level shifter coupled to receive a first supply voltage and a second supply voltage and configured to generate a first output signal and a second output signal in response to an input command signal and an edge detector configured to detect an edge on the second supply voltage and to sink a current from the level shifter in response to detection of the edge in order to prevent a change in logic state of the first output signal or the second output signal. The edge detector can include a positive edge detector configured to generate a positive edge signal in response to detection of a positive going edge of greater than a first predetermined slew rate and a negative edge detector configured to generate a negative edge signal in response to detection of a negative going edge of greater than a second predetermined slew rate.

A device for detecting and correcting timing error and a method for designing typical-case timing using the same is disclosed. The device includes two datapath units connected with first and second multiplexers and two transition detectors. Each datapath unit receives and calculates an input signal to generate a speculation value and a correct value. Then, the speculation value and the correct value are transmitted to the first and second multiplexers and the transition detectors determine whether transition of the outputted speculation value is unstable. If yes, the datapath unit outputting the speculation value is stalled for a period of time for correction, whereby the second multiplexer outputs the correct value. If no, the datapath unit outputs the speculation value, then the present invention uses the undertaken timing as a setting specification to complete a circuit design. The present invention can improve system efficiency and power of the whole circuit.

A method for detecting and correcting an error in a circuit is provided. The circuit is configured to receive an input signal and clock the input signal with a rising and falling timing signal. The method includes detecting late arrival signal transition of the input signal, at an intermediate point of a path, the path being one through which the input signal transits. The method further includes predicting an error in the input signal in response to detecting the late arrival signal transition at the intermediate point of the path. In addition, the method includes correcting the error in the input signal by manipulating the timing signal and/or a supply voltage.

A state-retaining logic cell may include a plurality of inverters, an output node non-volatile (NVM) storage cell, and an input node NVM storage cell. The plurality of inverters may include a feed-forward inverter and a feed-back inverter disposed in a back-to-back arrangement. The output node NVM storage cell may include first and second terminals, where the first terminal is connected adjacent an output node of the feed-forward and the feed-back inverters, and the second terminal is connected to a programming rail. The input node NVM storage cell may include first and second terminals, where the first terminal is connected adjacent an input node of the feed-forward and the feed-back inverters, and the second terminal is connected to the programming rail.