An integrated circuit includes at least one differential pair of transistors, a bias current generator that is configured to generate a bias current on a bias node that is coupled to a source terminal of each transistor of said differential pair by a respective resistive element. A compensation current generator is configured to generate a compensation current in one of the two resistive elements so as to compensate for a difference between actual values of the threshold voltages of the transistors of said differential pair.

An integrated circuit includes at least one differential pair of transistors, a bias current generator that is configured to generate a bias current on a bias node that is coupled to a source terminal of each transistor of said differential pair by a respective resistive element. A compensation current generator is configured to generate a compensation current in one of the two resistive elements so as to compensate for a difference between actual values of the threshold voltages of the transistors of said differential pair.

Comparison circuit and delay cancellation method are provided. The circuit includes a control circuit, capacitors and a transconductance amplifier circuit, wherein the control unit is configured to receive an input signal and control the comparison circuit to be in different working stages; the capacitors are configured to store a DC offset voltage signal at an automatic zero calibration stage; store the input signal when the output signal is inverted at a measurement stage; and store an equivalent delay voltage signal at a delay sampling stage; the transconductance amplifier circuit is configured to store the DC offset voltage signal to the capacitors at the automatic zero calibration stage; compare voltage signals on positive and negative input terminals and generate an output signal at the measurement stage; and store the equivalent delay voltage signal to the capacitors at the delay sampling stage. An inherent delay of the comparison circuit may be cancelled.