A universal switching platform is configured to test a device under test, and includes a first power source, a first switch, a second switch and a second power source. The first switch, the second switch and the second power source are coupled in series between positive and negative terminals of the first power source. The common node of the first and second switches and the negative terminal of the first power source are configured to be respectively coupled to first and second terminals of the device under test. The universal switching platform provides a voltage and a current to test the device under test when the first and second switches are controlled to transition between conduction and non-conduction.

A power supply switch circuit includes a first transistor that switches supplying of a first power supply voltage to a power supply terminal of a power amplifier, a switch controller that controls the first transistor and to which a second power supply voltage is applied, and a voltage selector that selects a higher voltage among the first power supply voltage and the second power supply voltage. The selected higher voltage is applied to a body terminal of the first transistor or a gate terminal of the first transistor.

Passive Ethernet by-pass switches, methods of using the same, and systems including the passive Ethernet by-pass switches include a first connection configured to be coupled to a first Ethernet port, a second connection configured to be coupled to a second Ethernet port, and switching circuitry including at least one internal switch operable to allow network communication between the first connection, the second connection, and at least one Ethernet controller, the at least one internal switch including a depletion mode transistor operable to bridge the first connection to the second connection to establish communication between the first connection and the second connection.

An apparatus that includes an interposer, first power connectors that are disposed on a first surface and that receive respective power inputs from one or more power sources, second power connectors that are disposed on the second surface and that receive a respective third power connecter of an integrated circuit when the integrated circuit is mounted on the second surface of the interposer, a plurality of switches formed within the interposer, control circuitry formed within the interposer, and a sequencer circuit coupled to the control input of the control circuitry and that generates a different values for a control input signal that causes the control logic of the control circuitry to generate a corresponding set of switch signals, and the plurality of different values for the control input signal are generated according to a predefined sequence to provide power to the integrated circuit according to power up sequence.

An apparatus includes a first leg having a plurality of transistors connected in series between a first node and a second node. Each of the plurality of transistors includes a respective body diode. The apparatus further includes a second leg connected between the first node and the second node and in parallel to the series connection of the plurality of transistors of the first leg. The second leg includes a first transistor. The second leg has lower reverse recovery losses relative to the first leg.

A scan driver circuit for an active matrix array includes a plurality of stages and a plurality of decoders that are sequentially driven at different driving timings in a same stage based on a combination of the plural decoder signals or that are driven at the same timing in different stages where a last decoder of the plural decoders sequentially outputs a scan line signal according to a driving state of the plural decoders in each of plural stages, each of the plural decoders includes an input part, an output part and a reset part, and the input part includes a first decoding transistor, a fourth decoding transistor connected to a clock signal and second, third, fifth and sixth decoding transistors connected in series to each of the first decoding transistor and the fourth decoding transistor and connected to the plural decoder signals.

A power circuit is adapted for providing a programming voltage to an electronic fuse circuit, and includes a pass transistor of a P-type metal-oxide-semiconductor transistor, a buffer circuit, and a bulk voltage control circuit. The pass transistor includes a bulk electrode, a gate electrode, a first source/drain electrode receiving a system high voltage, and a second source/drain electrode connected to a bit line. The buffer circuit provides a control voltage to the gate electrode of the pass transistor. The pass transistor is turned on during a programming operation and turned off during a reading operation. The bulk voltage control circuit independently provides a bulk voltage to the bulk electrode. A last-stage buffer of the buffer circuit is also activated by the bulk voltage to control the pass transistor during the reading operation of the electronic fuse circuit. A method for providing power to an electronic fuse circuit is also provided.

A driving device includes a voltage regulator, a voltage generator, and a first NMOSFET. The voltage regulator is coupled between a first high-voltage terminal and the output terminal of the driving device. The voltage regulator receives the first high voltage of the first high-voltage terminal. The voltage regulator steps down the first high voltage to generate a supply voltage. The voltage generator is coupled to a second high-voltage terminal and the output terminal of the driving device. The voltage generator provides a reference voltage for the output terminal of the driving device. The reference voltage is substantially lower than the supply voltage. The first NMOSFET is coupled between the output terminal of the driving device and a low-voltage terminal.

Laser driver designs that aim to reduce or eliminate the problem of fault laser firing are disclosed. Various laser driver designs presented herein are based on providing a current dissipation path that is configured to start providing a resistance for dissipating at least a portion, but preferably substantially all, of the negative current from the laser diode. Dissipating at least a portion of the negative current may decrease the unintentional increase of the voltage at the input to the laser diode and, therefore, reduce the likelihood that fault laser firing will occur. A control logic may be used to control the timing of when the current dissipation path is activated (i.e., provides the resistance to dissipate the negative current from the laser diode) and when it is deactivated.

Embodiments provided herein generally include apparatus, e.g., plasma processing systems, and methods for the plasma processing of a substrate in a processing chamber. Some embodiments are directed to a waveform generator. The waveform generator generally includes a first voltage stage having: a first voltage source; a first switch; and a second switch, where a first terminal of the first voltage source is coupled to a first terminal of the first switch, and where a second terminal of the first voltage source is coupled to a first terminal of the second switch. The waveform generator also includes a current stage coupled to a common node between second terminals of the first switch and the second switch, the current stage having a current source and a third switch coupled to the current source.