A memory device as provided may apply a pulse amplitude modulation method to data (DQ) signal transmission/reception and may scale a DQ signal according to an operating frequency condition, so as to improve data transmission performance and effectively improve power consumption. The memory device includes a memory cell array, and a data input/output circuit configured to scale a DQ signal that includes data read from the memory cell array and output the scaled DQ signal. The data input/output circuit is configured to scale the DQ signal based on an n-level pulse amplitude modulation (PAMn) (where n is 4 or a greater integer) with a DQ parameter that corresponds an operating frequency condition and output the DQ signal. Other aspects include memory controllers that communicate with the memory devices, and memory systems that include the memory devices and memory controllers.

A non-volatile memory device, including a non-volatile memory cell array, a sense amplifier, a random access memory (RAM), and a buffer circuit, is provided. The sense amplifier is configured to generate readout data. The RAM is configured to store write-in data. The buffer circuit generates a detection result according to target data and the readout data, and writes the detection result to the RAM.

A bit line sense amplifier includes: a first inverter having an input terminal connected to a first sensing node and an output terminal connected to a second inner bit line; a second inverter having an input terminal connected to a second sensing node and an output terminal connected to a first inner bit line; a first capacitor connected between the first sensing node and the first inner bit line; a second capacitor connected between the second sensing node and the second inner bit line; an isolation unit configured to cut off a connection between the first inner bit line and a second bit line; and an offset cancellation unit configured to connect the first sensing node to the second inner bit line, the first inner bit line to the first bit line, the second sensing node to the first inner bit line, and the second inner bit line to the second bit line.

Aspects of the invention include a first pull-down device and a second pull-down device, wherein a first drain terminal is connected to a second source terminal, and wherein a first gate terminal is connected to a true read local bitline, wherein a second drain terminal is connected to a compliment read local bit line, and wherein a second gate terminal is connected to a true write global bitline, a third pull-down device and a fourth pull-down device, wherein a third source terminal is connected to the voltage supply, wherein a third drain terminal is connected to a fourth source terminal, and wherein a third gate terminal is connected to the compliment read local bitline, and wherein a fourth drain terminal is connected to the true read local bitline, and wherein a fourth gate terminal is connected to a compliment write global bit line.

A system includes a control unit configured to be electrically connected to an input of a memory via a communication interface. The control unit includes a first power supply sector configured to be powered when the control unit is in an operating mode and a second power supply sector configured to be powered when the control unit is in the operating mode and in a low consumption mode. In the first power supply sector, the control unit includes a first configuration circuit operating to configure a polarization value of the input of the memory via the communication interface for the operating mode. In the second power supply sector, the control unit includes a second configuration circuit operating to configure a polarization value of the input of the memory via the communication interface for the low consumption mode.

A method, system, and related component for detecting properness of a PG pin power-on timing sequence are provided. The method comprises: obtaining a pull-up level of a PG pin of a VR chip (S101); determining a value of a pull-up resistor of the PG pin, as a first resistance, when a current injected into the VR chip by using the pull-up level is equal to a maximum withstand current of the VR chip (S102); obtaining an equivalent resistance to ground when the PG pin is at a low level, and calculating, based on the equivalent resistance to ground, a value of the pull-up resistor of the PG pin, as a second resistance, when an output voltage of the PG pin is equal to a preset interference voltage limit value (S103); and outputting first prompt information when it is determined that an actual resistance of the pull-up resistor is lower than the first resistance or the second resistance (S104). The foregoing solution is applied, to determine whether a power-on timing sequence of PG pins in a VR chip is proper, thereby avoiding an incorrect action of a subsequent circuit.

A power chip with a switching converter, having: a power pin configured to receive an input voltage, an indicating signal generating circuit configured to generate an indicating signal; a communicating circuit configured to receive/transmit communication data; and a multi-function pin configured to receive/transmit communication data and/or to provide the indicating signal under certain conditions.

A memory system includes memory chips connected to each other. Each of the memory chips includes a memory array, a read/write data strobe pin, a look-up table storage device, a chip number identification circuit, and a control logic circuit. The memory array stores data. The read/write data strobe pin is connected to read/write data strobe pins of other memory chips. The look-up table storage device stores a plurality of trimming shift values related to a number of chip connections in advance. The chip number identification circuit identifies a current number of chip connections according to a state information, and finds a selected trimming shift value from the look-up table storage device. The control logic circuit transmits a data signal in response to a clock signal, and adjusts a setup hold time between the clock signal and the data signal according to the selected trimming shift value.

A memory device is provided. The memory device includes a bit cell having a first invertor connected between a first node and a second node and a second invertor connected between the first node and the second node. The first invertor and the second invertor are cross coupled at a first data node and a second data node. The memory device further includes a pull down circuit connected to the second node. The pull down circuit is operative to pull down a voltage of the second node below a ground voltage in response to an enable signal.

A memory device is disclosed. The memory device includes word lines, a tracking bit line and a word line driver. The word lines are configured to transmit word line signals to memory cells. The tracking bit line is coupled to a first plurality of tracking cells that are arranged in rows. The word line driver is coupled to the word lines and a control circuit that is coupled through the tracking bit line to the word lines. The word line driver is configured to control a falling edge of each of the word line signals, by receiving each corresponding tracking bit line signal of tracking bit line signals transmitted from the tracking bit line, based on a resistance of a length of the tracking bit line. The length is substantially distanced from each corresponding row of the rows to the control circuit. A method is also disclosed herein.