The embodiments herein describe technologies for back-gate biasing of clock trees using a reference generator. A circuit includes a set of clock buffers and a programmable voltage reference generator to apply a voltage to a back gate of a transistor of the set of clock buffers.

A semiconductor integrated circuit including a waveform shaping circuit is provided. The waveform shaping circuit receives a signal. The waveform shaping circuit operates with a first inductance value in a first period. During the first period, a rising edge or a falling edge of a waveform of the signal is enhanced. The waveform shaping circuit operates with a second inductance value in a second period. During the second period, the rising or falling edges of the waveform is not enhanced. The first inductance value is larger than the second inductance value.

A subsystem interface, a semiconductor device including the subsystem interface, and a communications method of the semiconductor device are provided, the subsystem interface comprising a transmitter including a first transmission port configured to transmit a first clock signal, a second transmission port configured to transmit a first data signal, a first reception port configured to receive a first flow control signal, and a third transmission port configured to transmit a first synchronization signal, a receiver including a second reception port configured to receive a second clock signal, a third reception port configured to receive a second data signal, a fourth transmission port configured to transmit a second flow control signal, a fourth reception port configured to receive a second synchronization signal, and a control module configured to control operations of the transmitter and the receiver, including performing a transmitter hand-shake by sending a request signal from the second transmission port and receiving an acknowledgement signal to the first reception port, or performing a receiver hand-shake by receiving the request signal to the third reception port and sending the acknowledgement signal from the fourth transmission port.

A signal transmission circuit is provided. A tri-state logic circuit includes an enabling terminal, an input terminal and an output terminal, and is conducted and unconducted when the enabling terminal is at a high and a low state respectively. A pull-up circuit pulls up a voltage level of the output terminal. A first and a second multiplexers respectively output an enabling signal and an output signal to the enabling terminal and the input terminal according to a first status of a selection signal and respectively output a high state signal according to a second status of the selection signal. A selection circuit generates the selection signal having the first status when the voltage level is not larger than a first threshold value, having the second status after the voltage level is larger than the first threshold value and having the first status afterwards.

An integrated circuit might comprise an input flip-flop block clocked by a first clock having a first clock period, an output of the input flip-flop block for outputting data clocked by the first clock, a first logic block implementing a desired logic function, an input of the first logic block, coupled to the input flip-flop block, an output flip-flop block clocked by a second clock having a period equal to the first clock period and derived from a common source as the first clock, and an input of the output flip-flop block, coupled to an output of the first logic block. A first logic block delay can be at least the first clock period plus a specified delay excess and the second clock can be delayed by at least the specified delay excess. The first logic block might be a portion of a CAM block and/or a TCAM block.

A detection circuit includes a tunable delay circuit that generates a delayed signal and that receives a supply voltage. The detection circuit includes a control circuit that adjusts a delay provided by the tunable delay circuit to the delayed signal. The detection circuit includes a time-to-digital converter circuit that converts the delay provided by the tunable delay circuit to the delayed signal to a digital code and adjusts the digital code based on changes in the supply voltage. The control circuit causes the tunable delay circuit to maintain the delay provided to the delayed signal constant in response to the digital code reaching an alignment value. The detection circuit may continuously monitor timing margin of a data signal relative to a clock signal and update the digital code in every clock cycle. The detection circuit may be a security sensor that detects changes in the supply voltage.

Various embodiments of the present technology may provide methods and apparatus for reordering signals that are generated by a sensor. The apparatus may receive the generated signals in the form of a plurality of X-bit input signals and generate a plurality of output signals according to an exemplary reordering scheme. The apparatus may perform the exemplary reordering scheme based on one or more states of a state machine.

A noise detection circuit includes a first transistor configured to receive a delayed version of a clock signal; a second transistor configured to receive a delayed version of a reference clock signal; and a latch circuit, coupled to the first transistor at a first node and coupled to the second transistor at a second node, and configured to latch logic states of voltage levels at the first and second nodes, respectively, based on whether a timing difference between transition edges of the clock signal and the reference clock signal exceeds a pre-defined timing offset threshold.

A integrated circuit includes a clock generator and a multiplexing latch circuit. The clock generator generates first and second latching clock signals in response to a select signal and a clock signal having a clock signal waveform, each of the first latching clock signal and the second latching clock signal having the clock signal waveform. The multiplexing latch circuit selects either first data on a first data line or second data on a second data line based on the first latching clock signal and the second latching clock signal, and stores and outputs the selected data.

The disclosure relates to a latch including a first inverter with a first pair of field effect transistors (FETs) configured with a first channel width to length ratio (W/L), and a second inverter with a second pair of FETs configured with a second W/L different than the first W/L. Another latch includes first and second inverters; a first negative feedback circuit including first and second FETs coupled between first and second voltage rails, the input of the first inverter coupled between the first and second FETs, and the first and second FETs including gates coupled to an output of the first inverter; and a second negative feedback circuit including third and fourth FETs coupled between the first and second voltage rails, the input of the second inverter coupled between the third and fourth FETs, and the third and fourth FETs including gates coupled to an output of the second inverter.