A multiplexing latch circuit includes first, second, and third tristate inverters and an inverter. The first tristate inverter includes an output terminal and an input terminal coupled to a first data line, the second tristate inverter includes an output terminal and an input terminal coupled to a second data line, and the third tristate inverter includes an input terminal and an output terminal. The first inverter includes an input terminal coupled to the output terminals of each of the first, second, and third tristate inverters, an output terminal coupled to the input terminal of the third tristate inverter, and is configured to generate an output signal based on data received on one of the first data line or the second data line.

Integrated circuit devices are provided. The devices may include a substrate including a first region, a second region and a boundary region between the first and second regions. The first and second regions may be spaced apart from each other in a first horizontal direction. The devices may also include a first latch on the first region, a second latch on the second region, and a conductive layer extending in the first horizontal direction and crossing over the boundary region. The first latch may include a first vertical field effect transistor (VFET), a second VFET, a third VFET, and a fourth VFET. The second latch may include a fifth VFET, a sixth VFET, a seventh VFET, and an eighth VFET. The first and seventh VFETs may be arranged along the first horizontal direction. Portions of the conductive layer may include gate electrodes of the first and seventh VFETs, respectively.

An apparatus for generating a substantially constant DC reference voltage. The apparatus includes a reference voltage generator configured to generate a substantially constant direct current (DC) reference voltage based on a voltage on a data signal transmission line, wherein the voltage is based on a bandgap reference voltage. In one implementation, the data signal transmission line is a differential signal transmission line and the voltage is a common mode voltage. In another implementation, the data signal transmission line is an I-data signal transmission line and a Q-data signal transmission line, and the voltage is an average or weighted-average of the common mode voltages of the I- and Q-differential signals. In another implementation, the reference voltage is based on a single-ended (e.g., positive- and/or negative)-component or vice-versa of I- and Q-data signals, respectively.

The present disclosure relates to a circuit for level shifting of a data voltage from a transmitter. The circuit comprises an inverter logic. The inverter logic comprises a first transistor and a second transistor. The first transistor is connected to a source voltage and the second transistor is connected to ground. A capacitor is connected to an input of the first transistor and configured to drive the first transistor. The capacitor is configured to charge to a charged voltage equivalent to a difference between the source voltage and the data voltage. The second transistor is configured to be driven by the data voltage, thereby level shifting a level of the data voltage to a level of the source voltage.

A circuit includes three PMOS transistors (PMOS) and three NMOS transistors (NMOS). The first PMOS has a source receiving a supply voltage and a gate receiving a first signal. The second PMOS has a source coupled to a drain of the first PMOS, a gate receiving a clock signal, and a drain generating a second signal. The third PMOS has a source receiving the supply voltage, and a drain coupled to the drain of the second PMOS. The first NMOS has a drain coupled to the drain of the second PMOS, and a gate coupled to a gate of the third PMOS. The second NMOS has a gate receiving the first signal, and a drain coupled to a source of the first NMOS. The third NMOS has a gate coupled to the gate of the third PMOS transistor, and a drain coupled to the drain of the third PMOS.

A clock gating cell (CGC) is provided. The clock gating cell includes two latches that can be configured as a flip-flop to use positive/negative edges of a first clock signal to store a value of an input terminal, and the clock gating cell also includes a selector used for the flip-flop to select from values of different input terminals for storing. In addition, in a non-scan testing mode, the clock gating cell can forcefully close an unused latch through an independent signal, and in a scan shift duration and a scan capture duration of a scan testing mode, the clock gating cell can further forcefully output the first clock signal as the gating clock signal according to two independent signals.

A noise detection circuit includes a first transistor configured to receive a delayed version of a clock signal; a second transistor configured to receive a delayed version of a reference clock signal; and a latch circuit, coupled to the first transistor at a first node and coupled to the second transistor at a second node, and configured to latch logic states of voltage levels at the first and second nodes, respectively, based on whether a timing difference between transition edges of the clock signal and the reference clock signal exceeds a pre-defined timing offset threshold.

An example boosted switch driver circuit includes two branches. The first branch includes a first transistor. The second branch includes a second transistor and a level shifter circuit. One of the transistors is an N-type transistor and the other one is a P-type transistor. The circuit is configured to split an input clock signal between the first branch and the second branch, so that a portion of the input clock signal split to the first branch is provided to the first transistor, and a portion of the input clock signal split to the second branch is level-shifted by the level shifter circuit to generate a level-shifted input clock signal and the level-shifted input clock signal is provided to the second transistor. The circuit is further configured to combine an output of the first transistor and an output of the second transistor to generate an output clock signal.

In some examples, a level shifter circuit comprises: a first transistor pair cascoded at a first input node; a second transistor pair cascoded at a second input node, wherein the first and transistor pairs couple at a first node, a second node, a third node, and a fourth node; a third transistor pair coupled to the first transistor pair at the first and the third nodes, wherein the third transistor pair is configured to generate a first bipolar clock signal; a fourth transistor pair coupled to the second transistor pair at the second and the fourth nodes, wherein the fourth transistor pair is configured to generate a second bipolar clock signal; and a clock generation circuit coupled to the first node, the second node, the third node, and the fourth node.

An example apparatus includes a line driver and an interface circuit. The line driver has a plurality of source-series terminated (SST) driver segments including switching circuitry to selectively switch among at least three voltage-reference levels to drive an output node, common to each of the SST driver segments, in response to received digital signals by switching at a rate that is faster than a baud rate characterizing the received digital signals. The interface circuit drives a transmission link, in response to a drive signal at the output node, with an analog signal representing an oversampling of the received digital signals.